TRANSPARENT CONDUCTIVE NANO-COMPOSITES
    53.
    发明申请
    TRANSPARENT CONDUCTIVE NANO-COMPOSITES 有权
    透明导电纳米复合材料

    公开(公告)号:US20080191606A1

    公开(公告)日:2008-08-14

    申请号:US11965651

    申请日:2007-12-27

    Abstract: The present invention, in one embodiment, provides a method of forming an organic electric device that includes providing a plurality of carbon nanostructures; and dispersing the plurality of carbon nanostructures in a polymeric matrix to provide a polymeric composite, wherein when the plurality of carbon nanostructures are present at a first concentration an interface of the plurality of carbon nanostructures and the polymeric matrix is characterized by charge transport when an external energy is applied, and when the plurality of carbon nanostructures are present at a second concentration the interface of the plurality of carbon nanostructures and the polymeric matrix are characterized by exciton dissociation when an external energy is applied, wherein the first concentration is less than the second concentration.

    Abstract translation: 本发明在一个实施方案中提供了一种形成有机电子器件的方法,该方法包括提供多个碳纳米结构; 以及将所述多个碳纳米结构分散在聚合物基质中以提供聚合物复合物,其中当所述多个碳纳米结构以第一浓度存在时,所述多个碳纳米结构和所述聚合物基体的界面的特征在于当外部 施加能量,并且当多个碳纳米结构以第二浓度存在时,当施加外部能量时,多个碳纳米结构和聚合物基体的界面的特征在于激子解离,其中第一浓度小于第二浓度 浓度。

    Mobile Cantilever Door-type Container Inspection System
    54.
    发明申请
    Mobile Cantilever Door-type Container Inspection System 有权
    移动式悬臂门式集装箱检测系统

    公开(公告)号:US20080156992A1

    公开(公告)日:2008-07-03

    申请号:US11955711

    申请日:2008-03-12

    CPC classification number: G01V5/0008 G01V5/0016

    Abstract: The present invention discloses a mobile cantilever door-type container inspection system, in the art of radiation scanning imaging inspection technology. The system according to the present invention comprises a moveable scanning apparatus formed by a scanning frame and a remote control device, wherein the scanning frame comprises a radiation source and some detectors, wherein the radiation source or an apparatus cabin wherein the radiation source is disposed is connected with an L-shaped cantilever structure to form a door-type scanning frame, wherein beneath the radiation source or the apparatus cabin wherein the radiation source is disposed are provided with rollers that can reciprocatingly move on rails and are controlled by drive means. The detectors are disposed in a cross beam and a vertical beam of the cantilever structure of the door-type scanning frame. Rays of the radiation source are right in alignment with rows of detectors in the cantilever structure. The container truck to be inspected can pass through the door-like frame formed by the door-type scanning frame. Due to the cantilever structure, the inspection system is advantageous in stable operation, good-quality images, and high reliability.

    Abstract translation: 本发明公开了一种在辐射扫描成像检测技术领域的移动式悬臂门式容器检查系统。 根据本发明的系统包括由扫描框架和遥控装置形成的可移动扫描装置,其中扫描框架包括辐射源和一些检测器,其中辐射源或其中设置辐射源的装置舱是 与L形悬臂结构连接以形成门型扫描框架,其中设置放射源的辐射源或设备舱下方设置有能够在轨道上往复运动并由驱动装置控制的辊。 检测器设置在门型扫描框架的悬臂结构的横梁和垂直梁中。 辐射源的光线与悬臂结构中的检测器行对齐。 要检查的集装箱车可以通过由门型扫描架形成的门状框架。 由于悬臂结构,检测系统运行平稳,图像质量好,可靠性高。

    Modification of pixelated photolithography masks based on electric fields
    55.
    发明申请
    Modification of pixelated photolithography masks based on electric fields 有权
    基于电场的像素化光刻掩模的修改

    公开(公告)号:US20060225024A1

    公开(公告)日:2006-10-05

    申请号:US11096613

    申请日:2005-03-31

    CPC classification number: G03F1/36

    Abstract: Faster synthesis of photolithography mask modifications is described. In one embodiment, the invention includes synthesizing a first binary photolithography mask, developing perturbations to an estimated electric field generated by the first mask in use, and synthesizing a second binary photolithography mask by applying the perturbations to the first mask.

    Abstract translation: 描述了更快的光刻掩模修改的合成。 在一个实施例中,本发明包括合成第一二进制光刻掩模,对使用中由第一掩模产生的估计电场产生扰动,以及通过将扰动应用于第一掩模来合成第二二进制光刻掩模。

    Scanning arm and train inspection system by imaging through radiation having the scanning arm

    公开(公告)号:US20060203962A1

    公开(公告)日:2006-09-14

    申请号:US11285974

    申请日:2005-11-23

    CPC classification number: G01V5/0016 G01N23/04

    Abstract: The present invention discloses a scanning arm and a train inspection system by imaging through radiation having the scanning arm. The train inspection system by imaging through radiation comprises a scanning arm, a detector bracket with detector arrays mounted thereon, a radiation source, a calibration device, a front collimator and a rear collimator. The scanning arm includes a rigid middle inclining section; an upper horizontal section and a lower horizontal section which are located at upper and lower ends of the rigid middle inclining section respectively and supported on a construction base; and vibration damping elements arranged between the upper horizontal section and the construction base, and between the lower horizontal section and the construction base. The detector bracket is fixedly connected with said upper horizontal section. The radiation source is suspended from the lower horizontal section by a supporting abutment. The calibration device is fixed on the horizontal ground and faces x-ray emitted from the radiation source. The front collimator is suspended from the middle inclining section, and the calibration device is located between the front collimator and the radiation source. The rear collimator is suspended from the middle inclining section, and the front collimator is located between the calibration device and the rear collimator. The sector-shaped x-ray emitted from the radiation source penetrate through the calibration device, the front collimator, the rear collimator and the train to be inspected sequentially so as to be received by the detector array provided on the detector bracket. Compared with the prior arts, the train inspection system by imaging through radiation of the present invention is advantageous in reasonable designing, good adaptation, reliable construction, stable imaging and reduced occupied area. Accordingly, the train inspection system by imaging through radiation of the present invention is advantageously applicable to inspection of trains for the customs.

    Quick mask design
    57.
    发明申请
    Quick mask design 失效
    快速面膜设计

    公开(公告)号:US20050244728A1

    公开(公告)日:2005-11-03

    申请号:US11174336

    申请日:2005-06-29

    CPC classification number: G06F17/5081 G03F1/36 G06F2217/12 Y02P90/265

    Abstract: Systems, techniques, and approaches to quickly generate mask patterns, synthesize near-fields, and design masks. In one aspect, a mask may be designed by modeling the transmitted field using a library of corrections and a fast field model.

    Abstract translation: 快速生成掩模图案,合成近场和设计蒙版的系统,技术和方法。 在一个方面,可以通过使用校正库和快速场模型对所发送的场进行建模来设计掩模。

    Chemical-mechanical planarization composition having PVNO and associated method for use
    58.
    发明申请
    Chemical-mechanical planarization composition having PVNO and associated method for use 审中-公开
    具有PVNO的化学机械平面化组合物及其相关使用方法

    公开(公告)号:US20050215183A1

    公开(公告)日:2005-09-29

    申请号:US11101815

    申请日:2005-04-08

    CPC classification number: H01L21/3212 C09G1/02 C09K3/1463

    Abstract: A composition and associated method for chemical mechanical planarization (or other polishing) are described. The composition contains an abrasive, a dielectric protector comprising a polyvinylpyridine-N-oxide polymer, an oxiding agent, and water. The composition affords minimization of local erosion effects and possesses high selectivities for metal and barrier material removal in relation to dielectric layer materials in metal CMP. The composition is particularly useful in conjunction with the associated method for metal CMP applications (e.g., step 1 copper CMP processes and step 2 copper CMP processes).

    Abstract translation: 描述了用于化学机械平面化(或其它抛光)的组合物和相关方法。 组合物含有研磨剂,包含聚乙烯基吡啶-N-氧化物聚合物,氧化剂和水的介电保护剂。 该组合物使局部侵蚀效应最小化,并且具有与金属CMP中介电层材料相关的金属和阻挡材料去除的高选择性。 该组合物特别适用于金属CMP应用的相关方法(例如,步骤1铜CMP工艺和步骤2铜CMP工艺)。

Patent Agency Ranking