Diagnostic devices and methods
    55.
    发明授权

    公开(公告)号:US09778245B2

    公开(公告)日:2017-10-03

    申请号:US15425729

    申请日:2017-02-06

    Abstract: A diagnostic device is provided that comprises a light source for transmitting a light beam through a blood sample to a light detector, and a permanent magnet, wherein one of the permanent magnet and blood sample is automatically movable relative to the other between a “HIGH” magnetic state position and a “LOW” magnetic state position, such that a substantially high magnetic field is applied to the blood sample causing any hemozoin in the blood sample to tend toward perpendicular orientation to the substantially magnetic field and the suppression, or enhancement of light based on its polarization, and a zero-to-near-zero magnetic field is applied to the blood sample causing the randomization of any hemozoin in the blood sample and a baseline amount of light to pass through the blood sample in the “LOW” magnetic state position.

    METHODS AND APPARATUS FOR POLARIZED WAFER INSPECTION

    公开(公告)号:US20170276613A1

    公开(公告)日:2017-09-28

    申请号:US15468608

    申请日:2017-03-24

    Abstract: Disclosed are methods and apparatus for inspecting a semiconductor sample. This system comprises an illumination optics subsystem for generating and directing an incident beam towards a defect on a surface of a wafer. The illumination optics subsystem includes a light source for generating the incident beam and one or more polarization components for adjusting a ratio and/or a phase difference for the incident beam's electric field components. The system further includes a collection optics subsystem for collecting scattered light from the defect and/or surface in response to the incident beam, and the collection optics subsystem comprises an adjustable aperture at the pupil plane, followed by a rotatable waveplate for adjusting a phase difference of electric field components of the collected scattered light, followed by a rotatable analyzer. The system also includes a controller that is configured for (i) selecting a polarization of the incident beam, (ii) obtaining a defect scattering map, (iii) obtaining a surface scattering map, and (iv) determining a configuration of the one or more polarization components, aperture mask, and rotatable ¼ waveplate, and analyzer based on analysis of the defect and surface scattering map so as to maximize a defect signal to noise ratio,

    Parallel Optical Measurement System With Broadband Angle Selective Filters

    公开(公告)号:US20170176324A1

    公开(公告)日:2017-06-22

    申请号:US15129553

    申请日:2015-04-15

    Abstract: An optical computing device includes a light source that emits electromagnetic radiation into an optical train extending from the light source to a detector. A substance optically interacts with the electromagnetic radiation. A processor array is positioned in the optical train and includes a plurality of integrated computational element (ICE) cores that optically interact with the electromagnetic radiation, wherein the detector receives modified electromagnetic radiation generated through optical interaction of the electromagnetic radiation with the substance and the processor array. A weighting array is positioned in the optical train and includes a plurality of weighting devices that optically apply corresponding weighting factors to the modified electromagnetic radiation. A broadband angle selective filter (BASF) array is positioned in the optical train to selectively pass electromagnetic radiation at a predetermined angle of incidence. The detector generates an output signal indicative of a characteristic of the substance.

    Optical measuring system for measuring optical polarization properties of a sample

    公开(公告)号:US09683929B2

    公开(公告)日:2017-06-20

    申请号:US14668880

    申请日:2015-03-25

    Abstract: An optical measuring system measures polarization optical properties of a sample. The system includes (a) a light source that emits measuring light along an optical axis of an analysis beam path, (b) a polarization state generator, arranged downstream with respect to the light source in the analysis beam path which provides light with a defined polarization state, (c) a sample holder, arranged downstream with respect to the polarization state generator in the analysis beam path which accommodates the sample, (d) a polarization state analyzer, arranged downstream with respect to the sample holder in the analysis beam path which measures the polarization state of the measuring light after passing through the sample, and (e) a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached. Also described is a method for producing such an optical measuring system.

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