Abstract:
Large area, high current, lateral GaN power transistors are implemented using an on-chip interconnect topology wherein the transistor is arranged as an array of sections, each section comprising a set of transistor islands; gate and source buses that form each gate drive loop have substantially the same track widths; the source bus runs over or under the gate bus, and the tracks are inductively coupled to provide flux cancellation in the gate drive loop, thereby reducing parasitic inductances. The gate delay in each gate drive loop is reduced, minimizing the gate drive phase difference across the transistor. An overlying current redistribution layer preferably has a track width no greater than that of the underlying source and drain buses, for efficient coupling. This topology provides improved scalability, enabling fabrication of multi-section, large scale, high current lateral GaN transistors with reduced gate drive loop inductance, for improved operational stability.
Abstract:
An electronic switching system and device comprising driver circuits for power transistors are disclosed, with particular application for MOSFET driven, normally-on gallium nitride (GaN) power transistors. Preferably, a low power, high speed CMOS driver circuit with an integrated low voltage, lateral MOSFET driver is series coupled, in a hybrid cascode arrangement, to a high voltage GaN HEMT and provides for improved control of noise and voltage transients. Monitoring and control functions, including latching and clamping, are based on monitoring of Vcc conditions for shut-down and start-up conditioning to enable safer operation, particularly for high voltage and high current switching. Preferred embodiments also provide isolated, self-powered, high speed driver devices, with reduced input losses.
Abstract:
Power switching systems are disclosed comprising driver circuitry for enhancement-mode (E-Mode) GaN power transistors with low threshold voltage. Preferably, a GaN power switch (D3) comprises an E-Mode high electron mobility transistor (HEMT) with a monolithically integrated GaN driver. D3 is partitioned into sections. At least the pull-down and, optionally, the pull-up driver circuitry is similarly partitioned as a plurality of driver elements, each driving a respective section of D3. Each driver element is placed in proximity to a respective section of D3, reducing interconnect track length and loop inductance. In preferred embodiments, the layout of GaN transistor switch and the driver elements, dimensions and routing of the interconnect tracks are selected to further reduce loop inductance and optimize performance. Distributed driver circuitry integrated on-chip with one or more high power E-Mode GaN switches allows closer coupling of the driver circuitry and the GaN switches to reduce effects of parasitic inductances.
Abstract:
An integrated gate protection device P for a GaN power transistor D1 provides negative ESD spike protection. Protection device P comprises a smaller gate width wg enhancement mode GaN transistor Pm. The source of Pm is connected to its gate, the drain of Pm is connected to the gate input of D1, and the source of Pm is connected to the intrinsic source of D1. When the gate input voltage is taken negative below the threshold voltage for reverse conduction, Pm conducts and quenches negative voltage spikes. When device P comprises a plurality of GaN protection transistors P1 to Pn, connected in series, it turns on when the gate input voltage applied to the drain of P1 goes negative by more than the sum of the threshold voltages of P1 to Pn. The combined gate width of P1 to Pn is selected to limit the gate voltage excursion of D1.
Abstract:
Driver circuitry for switching systems comprising enhancement mode (E-Mode) GaN power transistors with low threshold voltage is disclosed. An E-Mode high electron mobility transistor (HEMT) D3 has a monolithically integrated GaN driver, comprising smaller E-Mode GaN HEMTs D1 and D2, and a discrete dual-voltage pre-driver. In operation, D1 provides the gate drive voltage to the gate of the GaN switch D3, and D2 clamps the gate of the GaN switch D3 to the source, via an internal source-sense connection closely coupling the source of D3 and the source of D2. An additional source-sense connection is provided for the pre-driver. Boosting the drive voltage to the gate of D1 produces firm and rapid pull-up of D1 and D3 for improved switching performance at higher switching speeds. High current handling components of the driver circuitry are integrated with the GaN switch and closely coupled to reduce inductance, while the discrete pre-driver can be thermally separated from the GaN chip.
Abstract:
A fault tolerant design for large area nitride semiconductor devices is provided, which facilitates testing and isolation of defective areas. A transistor comprises an array of a plurality of islands, each island comprising an active region, source and drain electrodes, and a gate electrode. Electrodes of each island are electrically isolated from electrodes of neighboring islands in at least one direction of the array. Source, drain and gate contact pads are provided to enable electrical testing of each island. After electrical testing of islands to identify defective islands, overlying electrical connections are formed to interconnect source electrodes in parallel, drain electrodes in parallel, and to interconnect gate electrodes to form a common gate electrode of large gate width Wg. Interconnections are provided selectively to good islands, while electrically isolating defective islands. This approach makes it economically feasible to fabricate large area GaN devices, including hybrid devices.
Abstract:
A power transistor circuit suppling an internal voltage to an internal voltage supply node. The power transistor circuit includes external terminals, to each of which signals and/or voltages are applied, for each of the input node, output node and control node of the power transistor. The power transistor circuit includes the power transistor, a current draw transistor, a first diode connected between an external control terminal and the internal voltage supply node, and a second diode connected between the current draw transistor output node and the internal voltage supply node. The power transistor circuit includes a charge pump that receives power from the internal voltage supply node and outputs a voltage to the control node of the current draw transistor. In operation, the internal voltage supply node receives power from the external control terminal via the first diode, or an external input terminal via the current draw transistor and the second diode.
Abstract:
An integrated circuit that is capable of bidirectional communication with an external host device via various communication protocols. In order to determine which communication protocols the incoming signal is using, the integrated circuit further includes an interface detector. When the interface detector determines that the incoming signal represents a portion of a transaction that uses a first communication protocol, the integrated circuit permits the first communication protocol engine to communicate in the transaction. Likewise, when the interface detector determines that the incoming signal represents a portion of a transaction that uses the second communication protocol, the integrated circuit permits the second communication protocol engine to communicate in the transaction. This allows the integrated circuit to detect the protocol regardless of whether one or two package terminals are used in the protocol.
Abstract:
A power stage assembly for improved thermal dissipation and EMC for top-cooled semiconductor power switching devices, e.g. high voltage, high current lateral GaN power transistors in embedded die packages. The power switching devices are mounted on a PCB substrate, with electrical connections between a bottom side of each device package and the PCB. Each device package has a thermal pad on the top-side. A heat-spreader is secured in thermal contact with the thermal pads of each device, and a heatsink is in thermal contact with the heat-spreader. The heat-spreader is a multilayer structure comprising: a thermally conductive metal substrate layer in contact with the heatsink; a conductive layer providing an EMC layer which is connected to power ground; a conductive layer defining large area thermal pads in thermal contact with thermal pads of each die; and dielectric material electrically isolating conductive layers of the heat-spreader.
Abstract:
High efficiency resonator coils for large gap resonant wireless power transfer (WPT), and a coil design methodology are disclosed. Resonator coils comprise a coil topology defined by coil parameters in which turn dimensions, such as trace widths and spacings of each turn, are configured to reduce or minimize a variance of the z component of magnetic field, over an area of a charging plane at a specified distance, or distance range, from the coil. A Tx resonator coil comprises a capacitor arrangement of tuning and network-matching capacitors for improved coil-to-coil efficiency and end-to-end WPT system performance, e.g. for applications such as through-wall WPT, in the range of tens of watts to at least hundreds of watts. Planar resonator coil topologies are compatible with fabrication using low cost PCB technology, e.g. with multi-layer metal, to reduce losses and improve thermal performance.