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    Apparatus for measuring ash content of food stuff by ultraviolet radiation
    61.
    发明授权
    Apparatus for measuring ash content of food stuff by ultraviolet radiation 失效
    用于通过紫外线辐射测量食物的灰分含量的装置

    公开(公告)号：US5952234A

    公开(公告)日：1999-09-14

    申请号：US942300

    申请日：1997-10-01

    申请人： Satoru Satake ,  Takaharu Kameoka ,  Yukio Hosaka ,  Takeshi Imai ,  Shinji Saito

    发明人： Satoru Satake ,  Takaharu Kameoka ,  Yukio Hosaka ,  Takeshi Imai ,  Shinji Saito

    IPC分类号： G01N21/27 ,  G01N21/33 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/02

    CPC分类号： G01N21/33 ,  G01N21/274 ,  G01N21/3563 ,  G01N21/359 ,  G01N33/02 ,  Y10T436/10

    摘要： A method for measuring ash content of food stuff is carried out by 1) preparing, with respect to food stuff samples whose ash content values are known, a calibration curve by a non-linear analysis of absorbance values and the known ash content of each sample, the absorbance values being obtained by irradiating light having particular wavelengths containing at least an ultraviolet ray band wavelength, the particular wavelength being specific to organic ingredients well coupled to inorganic ingredients which result in the ash content, and 2) deriving, with respect to a sample whose ash content value is unknown, an ash content value of the sample from absorbance values obtained by irradiating, on the sample, light having the particular wavelengths containing at least the ultraviolet ray band wavelength and from the calibration curve prepared in advance by the non-linear analysis. An apparatus for carrying out the method includes a light source section, a photo detecting section, a storing section for storing the calibration curve, and a calculation section for calculating, with respect to a sample whose ash content value is unknown, the ash content value based on the absorbance values and the calibration curve stored in the storing section. It is possible to speed up the measuring operation and to improve the measuring precision.

    摘要翻译： 通过以下方式进行食品灰分含量测定的方法：1）对于灰分含量已知的食品样品，通过吸光度值的非线性分析和每个样品的已知灰分含量制备校准曲线 通过照射具有至少具有紫外线波长的特定波长的光获得的吸光度值，该特定波长特异于有机成分，其与无机成分良好耦合，导致灰分含量，以及2）相对于 灰分含量未知的样品，样品的灰分含量值，其通过在样品上照射具有至少包含紫外线波段波长的特定波长的光和由非预定制备的校准曲线获得的吸光度值， 线性分析。 用于执行该方法的装置包括光源部分，光检测部分，用于存储校准曲线的存储部分，以及计算部分，用于相对于灰分含量值未知的样本计算灰分含量值 基于存储部分中存储的吸光度值和校准曲线。 可以加快测量操作，提高测量精度。

    Magnetic recording medium
    66.
    发明授权
    Magnetic recording medium 失效
    磁记录介质

    公开(公告)号：US5057364A

    公开(公告)日：1991-10-15

    申请号：US549026

    申请日：1990-07-06

    申请人： Shinji Saito ,  Hiroshi Ogawa

    发明人： Shinji Saito ,  Hiroshi Ogawa

    IPC分类号： G11B5/71 ,  C09D5/23 ,  C09D127/04 ,  C09D127/06 ,  C09D175/00 ,  C09D175/04 ,  G11B5/708 ,  G11B5/73 ,  G11B5/78

    CPC分类号： G11B5/7085 ,  Y10S428/90 ,  Y10T428/25 ,  Y10T428/257

    摘要： A magnetic recording medium comprising a non-magnetic support having thereon at least one magnetic layer is disclosed, comprising a dispersion of ferromagnetic particles in a binder; said at least one magnetic layer comprising:(a) a surface comprising abrasive agents having a Mohs' hardness of 6 or more in an average amount of 0.3 to 1.4 particles/.mu.m.sup.2, and(b) a cutting cross section containing abrasive agents having a Mohs' hardness of 6 or more in an average amount of at least 0.1 particle/.mu.m.sup.2 greater than said average amount of abrasive agents contained on said surface.

    摘要翻译： 公开了一种包括其上具有至少一个磁性层的非磁性载体的磁记录介质，包括铁磁颗粒在粘合剂中的分散体; 所述至少一个磁性层包括：（a）包含平均0.3至1.4个/μm2的莫氏硬度为6或更大的磨料的表面，和（b）含有研磨剂的切割截面， 平均量为至少0.1个/μm2的莫氏硬度大于所述表面上所含的所述磨料平均量的6个或更多的莫氏硬度。

    Method for measuring thickness of magnetic recording medium
    67.
    发明授权
    Method for measuring thickness of magnetic recording medium 失效
    测量磁记录介质厚度的方法

    公开(公告)号：US4937093A

    公开(公告)日：1990-06-26

    申请号：US374021

    申请日：1989-06-30

    申请人： Naoyoshi Chino ,  Shinji Saito ,  Toshihiko Miura

    发明人： Naoyoshi Chino ,  Shinji Saito ,  Toshihiko Miura

    IPC分类号： G01B15/02 ,  G01N23/223 ,  G11B5/84

    CPC分类号： G11B5/84 ,  G01B15/02

    摘要： A method for measuring the thickness of a multi-layer magnetic recording medium which provides a high accuracy and which can be used for continuous on-line monitoring of product thickness. First, first and second magnetic layers are simultaneously coated onto a running nonmagnetic support to form the recording medium. The first and second magnetic layers are made of materials having different responses to fluorescent X-rays. Then, the thickness of at least one of said first and second layers is measured by exposing the recording medium to fluorescent X-rays.

    摘要翻译： 一种用于测量多层磁记录介质的厚度的方法，其提供高精度并可用于产品厚度的连续在线监测。 首先，将第一和第二磁性层同时涂覆在运行的非磁性载体上以形成记录介质。 第一和第二磁性层由对荧光X射线具有不同响应的材料制成。 然后，通过将记录介质暴露于荧光X射线来测量所述第一层和第二层中的至少一层的厚度。

    Method for manufacturing magnetic recording medium
    69.
    发明授权
    Method for manufacturing magnetic recording medium 失效
    磁记录介质的制造方法

    公开(公告)号：US4911951A

    公开(公告)日：1990-03-27

    申请号：US250586

    申请日：1988-09-29

    申请人： Hiroshi Ogawa ,  Shinji Saito ,  Makoto Yoshimura ,  Shinichi Funabashi

    发明人： Hiroshi Ogawa ,  Shinji Saito ,  Makoto Yoshimura ,  Shinichi Funabashi

    IPC分类号： G11B5/716 ,  G11B5/842

    CPC分类号： G11B5/716 ,  G11B5/842 ,  Y10S428/90

    摘要： A method for manufacturing a magnetic recording medium comprising the steps of: (1) providing a lower layer comprising a ferromagnetic powder dispersed in a binder on a non-magnetic support and (2) providing an upper layer comprising a ferromagnetic powder dispersed in a binder on the lower layer, wherein a solvent used in a magnetic coating composition for the lower layer contains at least 30 wt % of an organic solvent having an evaporation rate index of less than 50; a solvent used in a magnetic coating composition for the upper layer contains from 0 to 40 wt % of an organic solvent having an evaporation rate index of less than 50; the content of an organic solvent having an evaporation rate index of less than 50 in the coating composition for the upper layer is smaller than that in the coating composition for the lower layer; the magnetic coating composition for the upper layer is coated while the lower layer is not dried; and when the lower and upper layers are dried until the total solvent content of the lower and upper layers is in the range of from 0.05 to 3 wt %, a calendering treatment is carried out.

    摘要翻译： 一种制造磁记录介质的方法，包括以下步骤：（1）提供包含在非磁性载体上分散在粘合剂中的铁磁粉末的下层，和（2）提供包含分散在粘合剂中的铁磁性粉末的上层 在下层中，其中用于下层的磁性涂料组合物中使用的溶剂含有至少30重量％的蒸发速率指数小于50的有机溶剂; 用于上层磁性涂料组合物中的溶剂含有0至40重量％的蒸发速率指数小于50的有机溶剂; 在上层用涂料组合物中，蒸发率指数小于50的有机溶剂的含量小于下层用涂料组合物的含量; 涂布上层的磁性涂料组合物，同时不干燥下层; 并且当下层和上层被干燥直到下层和上层的总溶剂含量在0.05至3重量％的范围内时，进行压延处理。

    Semiconductor integrated circuit with reduced power consumption
    70.
    发明授权
    Semiconductor integrated circuit with reduced power consumption 失效
    半导体集成电路降低功耗

    公开(公告)号：US4897560A

    公开(公告)日：1990-01-30

    申请号：US190745

    申请日：1988-05-05

    申请人： Shinji Saito ,  Kazuyuki Nonaka ,  Hideji Sumi ,  Takehiro Akiyama

    发明人： Shinji Saito ,  Kazuyuki Nonaka ,  Hideji Sumi ,  Takehiro Akiyama

    IPC分类号： H03L7/18 ,  H03J5/02 ,  H03K3/2885 ,  H03K17/00 ,  H03K17/60 ,  H03K19/00 ,  H03K19/086

    CPC分类号： H03J5/0272 ,  H03K17/603 ,  H03K3/2885 ,  H03K2217/0036

    摘要： A semiconductor integrated circuit includes a logic circuit which has first and second transistors constituting an emitter coupled transistor pair and a third transistor which is used as a constant current source, a bias circuit which includes a fourth transistor having an emitter from which a first predetermined voltage is supplied to a base of the third transistor and an impedance having one end coupled to a first power source and another end coupled to a base of the fourth transistor to supply a second predetermined voltage thereto, and a clamping circuit. The clamping circuit is OFF and does not perform a clamping operation with respect to the base of the fourth transistor when the entire semiconductor integrated circuit needs to operate. When the entire semiconductor integrated circuit does not need to operate, the clamping circuit is ON to clamp the base potential of the fourth transistor so as to reduce the power consumption of the semiconductor integrate circuit.