Multi-wavelength semiconductor laser
    62.
    发明申请
    Multi-wavelength semiconductor laser 有权
    多波长半导体激光器

    公开(公告)号:US20070064752A1

    公开(公告)日:2007-03-22

    申请号:US11501064

    申请日:2006-08-09

    IPC分类号: H01S3/10

    摘要: Semiconductor lasers for respective wavelengths have window regions with different lengths so as to obtain optimum FFPs for emitted light of the respective wavelengths, and thus dependence on optical output can be equal between the wavelengths, facilitating the design of an optical system.

    摘要翻译: 用于各波长的半导体激光器具有不同长度的窗口区域,以获得用于各个波长的发射光的最佳FFP,因此对波长的依赖性可以相等于波长,从而有助于光学系统的设计。

    Semiconductor device and manufacturing method thereof
    63.
    发明授权
    Semiconductor device and manufacturing method thereof 有权
    半导体装置及其制造方法

    公开(公告)号:US07151015B2

    公开(公告)日:2006-12-19

    申请号:US09852672

    申请日:2001-05-11

    IPC分类号: H01L21/00 H01L21/84

    摘要: There has been a problem that the manufacturing process is complicated and the number of processes is increased when a TFT with an LDD structure or a TFT with a GOLD structure is formed. In a method of manufacturing a semiconductor device, after low concentration impurity regions (24, 25) are formed in a second doping process, a width of the low concentration impurity region which is overlapped with the third electrode (18c) and a width of the low concentration impurity region which is not overlapped with the third electrode can be freely controlled by a fourth etching process. Thus, in a region overlapped with the third electrode, a relaxation of electric field concentration is achieved and then a hot carrier injection can be prevented. And, in the region which is not overlapped with the third electrode, the off-current value can be suppressed.

    摘要翻译: 当形成具有LDD结构的TFT或具有GOLD结构的TFT时,存在制造过程复杂并且处理次数增加的问题。 在制造半导体器件的方法中,在第二掺杂工艺中形成低浓度杂质区(24,25)之后,与第三电极(18c)重叠的低浓度杂质区的宽度和 可以通过第四蚀刻工艺来自由地控制不与第三电极重叠的低浓度杂质区域。 因此,在与第三电极重叠的区域中,实现电场浓度的松弛,然后可以防止热载流子注入。 并且,在不与第三电极重叠的区域中,可以抑制截止电流值。

    Semiconductor film, semiconductor device and method for manufacturing same

    公开(公告)号:US20060148216A1

    公开(公告)日:2006-07-06

    申请号:US11295470

    申请日:2005-12-07

    IPC分类号: H01L21/20

    摘要: Concerning an art related to a manufacturing method for a semiconductor device having an integrated circuit using thin film transistors on a substrate, a problem is to provide a condition for forming an amorphous silicon film having distortion. In the deposition of an amorphous silicon film using a sputter method, a condition is provided with a frequency of 15 to 25 kHz and a deposition power of 0.5 to 3 kW. This can sufficiently contain Ar at 10×1020/cm3 or more in an amorphous silicon film, thus making possible to form an amorphous silicon film having distortion.