-
公开(公告)号:US20250013382A1
公开(公告)日:2025-01-09
申请号:US18895273
申请日:2024-09-24
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Dung V. Nguyen , Dave Scott Ebsen , Tomoharu Tanaka , James Fitzpatrick , Huai-Yuan Tseng , Akira Goda , Eric N. Lee
IPC: G06F3/06
Abstract: Exemplary methods, apparatuses, and systems include a quick charge loss (QCL) mitigation manager for controlling writing data bits to a memory device. The QCL mitigation manager receives a first set of data bits for programming to memory. The QCL mitigation manager writes a first subset of data bits of the first set of data bits to a first memory block of the memory during a first pass of programming. The QCL mitigation manager writes a second subset of data bits of the first set of data bits to the first memory block during a second pass of programming in response to determining that the threshold delay is satisfied.
-
公开(公告)号:US20240420766A1
公开(公告)日:2024-12-19
申请号:US18819528
申请日:2024-08-29
Applicant: Micron Technology, Inc.
Inventor: Jun Fujiki , Yoshiaki Fukuzumi , Akira Goda
Abstract: Some embodiments include apparatuses and methods of forming the apparatuses. One of the apparatuses includes tiers located one over another, each of the tiers including memory cells and a control gate for the memory cells, each of the tiers including first transistors connected in series between the control gate in a respective tier and a conductive line, and second transistors connected in series between the control gate in the respective tier and the conductive line, the second transistors connected in parallel with the first transistors between the control gate and the conductive line, conductive joints coupled to channel regions of the first and second transistors, and gates for the first transistors and second transistors, each of the gates shared by one of the first transistors and one of the second transistors.
-
公开(公告)号:US20240393980A1
公开(公告)日:2024-11-28
申请号:US18792881
申请日:2024-08-02
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Jiangli Zhu , Fangfang Zhu , Akira Goda , Lakshmi Kalpana Vakati , Vivek Shivhare , Dave Scott Ebsen , Sanjay Subbarao
IPC: G06F3/06
Abstract: Methods, systems, and apparatuses include receiving a write command including user data. The write command is directed to a portion of memory including a first block and a second block. A buffer is allocated for executing the write command to the first block. The buffer includes multiple buffer decks and the buffer holds the user data written to the first block. User data is programmed into the first block to a threshold percentage. The threshold percentage is less than one hundred percent of the first block. A buffer deck is invalidated in response to programming the first block to the threshold percentage. The buffer deck is reallocated to the second block for programming the user data into the second block. The buffer deck holds user data written to the second block.
-
公开(公告)号:US20240371452A1
公开(公告)日:2024-11-07
申请号:US18648110
申请日:2024-04-26
Applicant: Micron Technology, Inc.
Inventor: Pitamber Shukla, , Robert Winston Mason , Huai-Yuan Tseng , Akira Goda , Kishore Kumar Muchherla
Abstract: Methods, systems, and devices for techniques for managing a voltage recovery operation are described. In some cases, as part of performing a write command to store data to a set of memory cells, the memory system may store an indication of the initial time at which the write operation occurred, the temperature of the set of memory cells at the initial time, or both. The memory system may subsequently manage an accumulated value based on a duration from the initial time and the temperature of the set of memory cells during the duration. If the accumulated value exceeds an accumulation threshold, the memory system may identify an indication of degradation of the set of memory cells. If the indication exceeds a degradation threshold, the memory system may perform a voltage recovery operation to modify voltages of the set of memory cells.
-
公开(公告)号:US12131028B2
公开(公告)日:2024-10-29
申请号:US18121494
申请日:2023-03-14
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Jeffrey S. McNeil , Jonathan S. Parry , Ugo Russo , Akira Goda , Kishore Kumar Muchherla , Violante Moschiano , Niccolo' Righetti , Silvia Beltrami
CPC classification number: G06F3/0611 , G06F3/0659 , G06F3/0679
Abstract: Control logic in a memory device causes a first pulse to be applied to a plurality of word lines coupled to respective memory cells in a memory array during an erase operation. The control logic further causes a second pulse to be applied to a first set of word lines of the plurality of word lines to bias the first set of word lines to a first voltage. The control logic can cause a third pulse to be applied to a second set of word lines of the plurality of word lines to bias the second set of word lines to a second voltage and cause a fourth pulse to be applied to a source line of the memory array to erase the respective memory cells coupled to the first set of word lines and to program the respective memory cells coupled to the second set of word lines.
-
公开(公告)号:US20240339163A1
公开(公告)日:2024-10-10
申请号:US18604411
申请日:2024-03-13
Applicant: Micron Technology, Inc.
Inventor: Leo Raimondo , Violante Moschiano , Shyam Sunder Raghunathan , Akira Goda
CPC classification number: G11C16/3427 , G11C16/0483 , G11C16/10
Abstract: Control logic in a memory device initiates a program operation on a memory array comprising a top deck and bottom deck. During a seeding phase of the program operation, the control logic causes a first positive voltage to be applied to a first plurality of wordlines of the memory array, wherein the first plurality of wordlines is associated with memory cells in the bottom deck of the memory array that are in a programmed state, and causes a ground voltage to be applied to a second plurality of wordlines of the memory array, wherein the second plurality of wordlines is associated with memory cells in the top deck of the memory array. At an end of the seeding phase of the program operation, the control logic electrically separates the top deck from the bottom deck and causes a program voltage to be applied to a selected wordline of the memory array during an inhibit phase of the program operation, wherein the selected wordline is associated with respective memory cells in the top deck of the memory array.
-
67.
公开(公告)号:US12068272B2
公开(公告)日:2024-08-20
申请号:US18059165
申请日:2022-11-28
Applicant: Micron Technology, Inc.
Inventor: Akira Goda , Kunal R. Parekh , Aaron S. Yip
CPC classification number: H01L24/20 , H01L24/03 , H01L24/05 , H01L24/19 , H01L25/18 , H10B41/10 , H10B41/27 , H10B41/40 , H10B43/10 , H10B43/27 , H10B43/40 , H01L2924/1431 , H01L2924/1438
Abstract: A microelectronic device comprises a first die and a second die attached to the first die. The first die comprises a memory array region comprising a stack structure comprising vertically alternating conductive structures and insulative structures, vertically extending strings of memory cells within the stack structure, and first bond pad structures vertically neighboring the vertically extending strings of memory cells. The second die comprises a control logic region comprising control logic devices configured to effectuate at least a portion of control operations for the vertically extending string of memory cells, second bond pad structures in electrical communication with the first bond pad structures, and signal routing structures located at an interface between the first die and the second die. Related microelectronic devices, electronic systems, and methods are also described.
-
公开(公告)号:US20240185926A1
公开(公告)日:2024-06-06
申请号:US18517903
申请日:2023-11-22
Applicant: Micron Technology, Inc.
Inventor: Huai-Yuan Tseng , Kishore Kumar Mucherla , William Charles Filipiak , Eric N. Lee , Andrew Bicksler , Ugo Russo , Niccolo' Righetti , Christian Caillat , Akira Goda , Ting Luo , Antonino Pollio
CPC classification number: G11C16/102 , G11C16/16 , G11C16/3404
Abstract: A variety of applications can include one or more memory devices having user data preloaded for the application prior to reflowing the memory devices on the system platform of the application. A touch-up data refresh method can be implemented to gain read window budget and to improve retention slope to protect the preload content to tolerate reflow to the system platform. Techniques for data preload can include programming preload data into targeted blocks until the targeted blocks are programmed with the preload data and re-programming the preload data over the programmed preload data in the targeted blocks in a same set of memory cells, without an erase between programming and re-programming the preload data. Variations of such techniques can be used to prepare a memory device with preload data followed by performing a reflow of the memory device to a structure for an application to which the memory device is implemented.
-
公开(公告)号:US12001721B2
公开(公告)日:2024-06-04
申请号:US17882355
申请日:2022-08-05
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Lakshmi Kalpana Vakati , Dave Scott Ebsen , Peter Feeley , Sanjay Subbarao , Vivek Shivhare , Jiangli Zhu , Fangfang Zhu , Akira Goda
IPC: G06F3/06
CPC classification number: G06F3/0659 , G06F3/0619 , G06F3/064 , G06F3/0656 , G06F3/0683
Abstract: Methods, systems, and apparatuses include receiving a write command including user data. The write command is directed to a portion of memory including a first and second block and a first and second user data portion are directed to the first and second block. Temporary parity data is generated using the first and second user data portions. The temporary parity data and the first and second user data portions are stored in a buffer. Portions of the first and second block are programmed with two programming passes. The first and second user data portions in the buffer are invalidated in response to a completion of the second programming pass of the portions of the first and second blocks. The temporary parity data is maintained in the buffer until a second programming pass of the first and second block.
-
70.
公开(公告)号:US20240161838A1
公开(公告)日:2024-05-16
申请号:US18505855
申请日:2023-11-09
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Nicola Ciocchini , Animesh Roy Chowdhury , Kishore Kumar Muchherla , Akira Goda , Jung Sheng Hoei , Niccolo’ Righetti , Jonathan S. Parry , Ugo Russo
CPC classification number: G11C16/3431 , G11C7/04 , G11C16/32
Abstract: A system may include a memory device comprising a plurality of memory blocks, and a processing device to, responsive to receiving a request to read a memory block from the memory device, determine a time difference between a current time and a timestamp associated with the memory block, determine whether the time difference satisfies a first threshold increment criterion, responsive to determining that the time difference satisfies the first threshold increment criterion, increment a read counter associated with the memory block by a first increment value associated with the first threshold increment criterion, determine that the read counter associated with the memory block satisfies a threshold scan criterion, and responsive to determining that the read counter satisfies the threshold scan criterion, perform a media scan with respect to the memory block.
-
-
-
-
-
-
-
-
-