Lithographic apparatus and device manufacturing method
    78.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US08730485B2

    公开(公告)日:2014-05-20

    申请号:US12948533

    申请日:2010-11-17

    CPC分类号: G03F7/70775 G01D5/38

    摘要: A position measurements system to measure a position of a movable object with respect to another object includes two or more one dimensional (1D) encoder heads mounted on one of the movable object and the other object and each capable of emitting a measurement beam along a measurement direction, one or more reference targets mounted on the other of the movable object and the other object, each reference target including a planar surface with a grid or grating to cooperate with the two or more one dimensional (1D) encoder heads, and a processor to calculate a position of the object on the basis of outputs of the two or more 1D encoder heads, wherein the measurement direction of each of the two or more 1D encoder heads is non-perpendicular to the planar surface of the respective reference target.

    摘要翻译: 用于测量可移动物体相对于另一物体的位置的位置测量系统包括安装在可移动物体和另一物体之一上的两个或更多个一维(1D)编码器头,并且每个能够沿测量发射测量光束 方向,安装在可移动物体和另一物体另一个上的一个或多个参考目标,每个参考目标包括具有格栅或光栅的平面,以与两个或更多个一维(1D)编码器头配合,以及处理器 基于两个或更多个1D编码器头的输出来计算物体的位置,其中两个或更多个1D编码器头中的每一个的测量方向与相应参考目标的平面不垂直。