Method and structure for dynamic sampling method in on-line process monitoring
    82.
    发明授权
    Method and structure for dynamic sampling method in on-line process monitoring 失效
    在线过程监控中动态抽样方法和结构

    公开(公告)号:US06999895B2

    公开(公告)日:2006-02-14

    申请号:US10392984

    申请日:2003-03-21

    申请人: Xin Guo Bonnie K. Ray

    发明人: Xin Guo Bonnie K. Ray

    IPC分类号: G06F17/18

    CPC分类号: G05B21/02 G06F17/18

    摘要: A method (and structure) of optimizing a sampling period for a system having at least one measurable system parameter z, includes calculating a probability distribution function f(Tz,x). The time Tz,x is a first time that the measurable system parameter z will reach a predetermined system threshold x, given level z.

    摘要翻译: 优化具有至少一个可测量系统参数z的系统的采样周期的方法(和结构)包括计算概率分布函数f(T z,x N)。 时间T z,x z是第一次可测量的系统参数z将达到给定等级z的预定系统阈值x。

    Method for producing a low defect homogeneous oxynitride
    83.
    发明授权
    Method for producing a low defect homogeneous oxynitride 有权
    低缺陷均匀氮氧化物的制造方法

    公开(公告)号:US06991987B1

    公开(公告)日:2006-01-31

    申请号:US10306382

    申请日:2002-11-27

    IPC分类号: H01L21/8247

    摘要: A process technology effectuates production of low defect homogeneous oxynitride, which can be applied in tunneling dielectrics with high dielectric constants and low barrier heights for flash memory devices, and as gate oxide for ultra-thin logic devices. The process technology involves varying the oxygen content in a the homogeneous oxynitride film comprising a part of the flash memory device, which effectively increases the dielectric constant of the oxynitride film and lowers its barrier height. In one such process, a controlled co-flow of N2O is introduced into a CVD deposition process. This process effectuates production of a oxynitride film with uniform distributions of nitrogen and oxygen throughout.

    摘要翻译: 一种工艺技术可以实现低缺陷均匀氮氧化物的生产,其可以应用于具有高介电常数的隧道电介质和用于闪存器件的低屏障高度,以及用作超薄逻辑器件的栅极氧化物。 该工艺技术涉及改变包括闪存器件的一部分的均匀氮氧化物膜中的氧含量,其有效地增加氧氮化物膜的介电常数并降低其势垒高度。 在一种这样的方法中,将N 2 O 2的受控共流引入到CVD沉积工艺中。 该方法实现了氮气和氧气的均匀分布的氮氧化物膜的生产。

    Compensated oscillator circuit for charge pumps
    84.
    发明授权
    Compensated oscillator circuit for charge pumps 有权
    电荷泵补偿振荡电路

    公开(公告)号:US06888763B1

    公开(公告)日:2005-05-03

    申请号:US10358498

    申请日:2003-02-04

    申请人: Xin Guo

    发明人: Xin Guo

    IPC分类号: G11C5/14 G11C7/00

    CPC分类号: G11C5/145

    摘要: A charge pump oscillator circuit with compensation for variations in process and operating environment. The charge pump oscillator is designed with a rolloff characteristic that enables operation at both weak and strong process corners without excessive power consumption. Composite resistors in the oscillator circuit are composed of component resistors that are fabricated with different processes, e.g., implant and deposition. The resistance of the composite resistor is thus in order to provide compensation for variations in processing and operating environment. The composite resistor may be used as a feedback loop resistor, or may be used as a source degenerate resistor to control the supply current to the oscillator.

    摘要翻译: 电荷泵振荡器电路,具有对工艺和操作环境变化的补偿。 电荷泵振荡器设计具有滚降特性,可在弱过程角和强加工拐角处进行操作,而无需过多的功耗。 振荡器电路中的复合电阻器由通过不同工艺(例如,植入和沉积)制造的元件电阻组成。 因此,复合电阻器的电阻是为了对处理和操作环境的变化提供补偿。 复合电阻器可以用作反馈回路电阻器,或者可以用作源极简并电阻器来控制到振荡器的电源电流。

    Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices
    85.
    发明授权
    Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices 有权
    用于减少薄栅极氧化物上的浅沟槽隔离边缘薄化的方法,以提高高性能闪存器件的外围晶体管可靠性和性能

    公开(公告)号:US06825083B1

    公开(公告)日:2004-11-30

    申请号:US10126814

    申请日:2002-04-19

    IPC分类号: H01L21336

    摘要: A method of semiconductor integrated circuit fabrication. Specifically, one embodiment of the present invention discloses a method for reducing shallow trench isolation (STI) corner recess of silicon in order to reduce STI edge thinning for peripheral thin gate transistor devices 480 in an integrated circuit 400 comprising flash memory devices 380, and both thick 390 and thin 480 gate transistor devices. The method begins by forming a tunnel oxide layer 310 over a semiconductor substrate 430 for the formation of the flash memory devices 380 (step 220). A mask 350 is formed over the thin gate transistor devices 480 to inhibit formation of a thick gate oxide layer 360 for the formation of the thick gate transistor devices 390 (step 230). The mask 350 reduces shallow trench isolation (STI) recess by eliminating removal of the thick gate oxide layer 360 before forming a thin oxide layer 410 for the thin gate transistor devices 480.

    摘要翻译: 一种半导体集成电路制造方法。 具体地,本发明的一个实施例公开了一种用于减少硅的浅沟槽隔离(STI)角凹槽的方法,以便在包括闪存器件380的集成电路400中减少外围薄栅晶体管器件480的STI边缘变薄,以及两者 厚390和薄型480栅极晶体管器件。 该方法开始于在半导体衬底430上形成隧道氧化物层310以形成闪存器件380(步骤220)。 掩模350形成在薄栅极晶体管器件480上,以阻止形成厚栅极氧化物层360以形成厚栅极晶体管器件390(步骤230)。 掩模350通过在形成用于薄栅极晶体管器件480的薄氧化物层410之前消除厚栅极氧化层360的去除来减少浅沟槽隔离(STI)凹陷。

    Memory circuit for providing word line redundancy in a memory sector
    86.
    发明授权
    Memory circuit for providing word line redundancy in a memory sector 有权
    用于在存储器扇区中提供字线冗余的存储器电路

    公开(公告)号:US06778437B1

    公开(公告)日:2004-08-17

    申请号:US10635974

    申请日:2003-08-07

    IPC分类号: G11C1604

    摘要: According to one embodiment, the memory circuit comprises a memory sector having a plurality of memory cells. Each of the plurality of memory cells has a gate connected to a corresponding word line, where each corresponding word line is further connected to an output of a corresponding decoding circuit. Each corresponding decoding circuit receives a corresponding vertical word line signal, a corresponding global word line signal, and a corresponding sector supply voltage. The corresponding sector supply voltage is capable of supplying an erase voltage, such as −9 V for a negative gate erase memory device, for example. With this arrangement, the corresponding decoding circuit is capable of selectively excluding the corresponding word line from receiving the erase voltage during the erase operation.

    摘要翻译: 根据一个实施例,存储器电路包括具有多个存储单元的存储器扇区。 多个存储单元中的每一个具有连接到相应字线的栅极,其中每个对应的字线进一步连接到对应的解码电路的输出。 每个对应的解码电路接收对应的垂直字线信号,对应的全局字线信号和对应的扇区电源电压。 例如,相应的扇区电源电压能够提供擦除电压,例如用于负栅极擦除存储器件的-9V。 利用这种布置,相应的解码电路能够在擦除操作期间选择性地排除相应的字线接收擦除电压。

    Method and system for wireless data transmission, client and server controllers

    公开(公告)号:US09667752B2

    公开(公告)日:2017-05-30

    申请号:US14131841

    申请日:2012-07-03

    申请人: Xin Guo

    发明人: Xin Guo

    IPC分类号: H04L29/06 H04W76/02

    摘要: A method for wireless data transmission, a transmission system, client controllers, and server controllers are described. The method for wireless data transmission includes: establishing management connection, the server controller establishes task management connection among the client controllers respectively; task arrangement, the server controller arranges the wireless data transmission task among the client equipment based on the information of client equipment, which is acquired from the task management connection, each client equipment is coupled with corresponding client controller; task executing, based on the arranged information of wireless data transmission task; establishing data transmission connection among the client controllers; and executing the wireless data transmission task through the data transmission connection. By using the server controllers, the wireless data transmission among client equipment can be accomplished conveniently, without an operating interface.

    Erase management in memory systems
    90.
    发明授权
    Erase management in memory systems 有权
    擦除内存系统中的管理

    公开(公告)号:US09483397B2

    公开(公告)日:2016-11-01

    申请号:US13943762

    申请日:2013-07-16

    IPC分类号: G06F12/02

    摘要: Computer processor hardware receives notification that data stored in a region of storage cells in a non-volatile memory system stores invalid data. In response to the notification, the computer processor hardware marks the region as storing invalid data. The computer processor hardware controls the magnitude of erase dwell time (i.e., the amount of time that one or more cells are set to an erased state) associated with overwriting of the invalid data in the storage cells with replacement data. For example, to re-program respective storage cells, the data manager must erase the storage cells and then program the storage cells with replacement data. The data management logic can control the erase dwell time to be less than a threshold time value to enhance a life of the non-volatile memory system.

    摘要翻译: 计算机处理器硬件接收存储在非易失性存储器系统中的存储单元区域中的数据存储无效数据的通知。 响应于该通知,计算机处理器硬件将该区域标记为存储无效数据。 计算机处理器硬件控制与用替换数据重写存储单元中的无效数据相关联的擦除驻留时间的大小(即,一个或多个单元被设置为擦除状态的时间量)。 例如,为了重新编程各个存储单元,数据管理器必须擦除存储单元,然后用替换数据对存储单元进行编程。 数据管理逻辑可以将擦除停留时间控制为小于阈值时间值以增强非易失性存储器系统的寿命。