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104 条记录 (耗时 0.023 秒)

    SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
    87.
    发明申请
    SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION 有权

    公开(公告)号：US20230112447A1

    公开(公告)日：2023-04-13

    申请号：US17910752

    申请日：2021-03-09

    申请人： ASML Netherlands B.V.

    发明人： Weiming REN ,  Yongxin WANG

    IPC分类号： H01J37/244 ,  G01N23/2251 ,  G01N23/203 ,  G01N23/2206 ,  H01J37/10 ,  H01J37/147

    摘要： Systems and methods of observing a sample using an electron beam apparatus are disclosed. The electron beam apparatus comprises an electron source configured to generate a primary electron beam along a primary optical axis, and a first electron detector having a first detection layer substantially parallel to the primary optical axis and configured to detect a first portion of a plurality of signal electrons generated from a probe spot on a sample. The method may comprise generating a plurality of signal electrons and detecting the signal electrons using the first electron detector substantially parallel to the primary optical axis of the primary electron beam. A method of configuring an electrostatic element or a magnetic element to detect backscattered electrons may include disposing an electron detector on an inner surface of the electrostatic or magnetic element and depositing a conducting layer on the inner surface of the electron detector.

    System and method for calibrating a PET scanner
    88.
    发明授权
    System and method for calibrating a PET scanner 有权

    公开(公告)号：US11619755B2

    公开(公告)日：2023-04-04

    申请号：US16882556

    申请日：2020-05-25

    申请人： SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.

    发明人： Xinyu Lyu ,  Qixiang Zhang ,  Wenbing Song ,  Zijun Ji ,  Weiping Liu

    IPC分类号： G01T7/00 ,  G01T1/29 ,  G01N23/2206

    摘要： A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.

    Method of examining a sample using a charged particle microscope
    89.
    发明授权
    Method of examining a sample using a charged particle microscope 有权

    公开(公告)号：US11598733B2

    公开(公告)日：2023-03-07

    申请号：US16941253

    申请日：2020-07-28

    申请人： FEI Company

    发明人： Tomas Tûma ,  Jan Klusá{hacek over (c)}ek ,  Jiri Petrek

    IPC分类号： G01N23/22 ,  G01N23/2206 ,  G01N23/203 ,  G01N23/2252

    摘要： The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample; scanning said charged particle beam over said sample; and detecting, using a first detector, emissions of a first type from the sample in response to the beam scanned over the sample. Spectral information of detected emissions of the first type is used for assigning a plurality of mutually different phases to said sample. In a further step, a corresponding plurality of different color hues—with reference to an HSV color space—are associated to said plurality of mutually different phases. Using a second detector, emissions of a second type from the sample in response to the beam scanned over the sample are detected. Finally an image representation of said sample is provided.

    Systems, devices, and methods for x-ray fluorescence analysis of geological samples
    90.
    发明授权
    Systems, devices, and methods for x-ray fluorescence analysis of geological samples 有权

    公开(公告)号：US11592407B2

    公开(公告)日：2023-02-28

    申请号：US17056110

    申请日：2019-05-17

    申请人： Enersoft Inc.

    发明人： Yannai Z. R. Segal ,  Grant I. Sanden

    IPC分类号： G01N23/22 ,  G01N23/2204 ,  G01N23/223 ,  G01N33/24 ,  G01N23/2206 ,  G01N23/2208

    摘要： A geological analysis system, device, and method are provided. The geological analysis system includes sensors, including an X-ray fluorescence (XRF) unit, which detect properties of geological sample materials, a sample tray which holds the geological sample materials therein, and a processor. The XRF unit includes a body and a separable head unit and an output port configured to emit helium onto the geological sample materials within the sample tray. The sample tray includes chambers formed in an upper surface, ports, and passages, each providing communication between an interior of a chamber and an interior of a port. The ports are configured to be attachable to vials. The processor is configured to automatically position at least one of the sensors and the sample tray with respect to the other of the at least one of the sensors and the sample tray and to control the sensors.