LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
    1.
    发明申请
    LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD 有权
    LITHOGRAPHIC装置和装置制造方法

    公开(公告)号:US20100143832A1

    公开(公告)日:2010-06-10

    申请号:US12632160

    申请日:2009-12-07

    申请人: Martijn HOUBEN

    发明人: Martijn HOUBEN

    IPC分类号: G03F7/20 G03B27/52

    CPC分类号: G03F7/70341 G03F7/707

    摘要: In an immersion lithographic apparatus, bubble formation in immersion liquid is reduced or prevented by reducing a gap size or area on a substrate table. The gap size is reduced using an edge member which may be, for example, a ring known as a BES (Bubble Extraction System) ring. Information regarding the shape and/or cross-sectional dimension (e.g., diameter) of the substrate, or information regarding the size of the gap, is transmitted to a controller that controls the edge member in order for the edge member, for example, to be reduced to an appropriate size to reduce the gap as much as possible, desirably without compressing the edge of the substrate. Alternatively or additionally, the gap may be reduced by moving the substrate and/or edge member adjacent the edge of a surface of the substrate table.

    摘要翻译: 在浸没式光刻设备中,通过减小衬底台上的间隙尺寸或面积来降低或防止浸没液中的气泡形成。 使用可以是例如称为BES(气泡提取系统)环的环的边缘构件来减小间隙尺寸。 关于基板的形状和/或横截面尺寸(例如,直径)的信息或关于间隙的尺寸的信息被传送到控制边缘构件以便边缘构件的控制器,例如, 减小到适当的尺寸以尽可能地减小间隙,理想地不压缩基底的边缘。 或者或另外,可以通过移动邻近衬底台的表面的边缘的衬底和/或边缘构件来减小间隙。

    Calibration method and lithographic apparatus for calibrating an optimum take over height of a substrate
    9.
    发明授权
    Calibration method and lithographic apparatus for calibrating an optimum take over height of a substrate 有权
    校准方法和光刻设备,用于校准基板的最佳接管高度

    公开(公告)号:US08384882B2

    公开(公告)日:2013-02-26

    申请号:US12580066

    申请日:2009-10-15

    IPC分类号: G03B27/32 G03B27/58

    摘要: A calibration method for calibrating an optimum take over height of a substrate in a lithographic apparatus between a substrate table and an ejector element moveable to load and unload the substrate from the substrate table, the method including clamping the substrate on one of the substrate table and ejector element; moving the ejector element between an unloaded state wherein the substrate is supported by the substrate table and a loaded state wherein the substrate is at least partly supported by the ejector element; determining a reference height of the ejector element at the moment that the weight of the substrate is at least partly taken over between the substrate table and the ejector element; and determining the optimum take over height for the ejector element from the determined reference height.

    摘要翻译: 一种校准方法,用于校准光刻设备中的基板的最佳接管高度,该基板在基板台和顶板元件之间移动,可移动以从基板台装载和卸载基板,该方法包括将基板夹在基板台之一和 喷射元件 在所述衬底被所述衬底台支撑的卸载状态和所述衬底至少部分地被所述顶出器元件支撑的负载状态之间移动所述顶出器元件; 在衬底的重量至少部分地覆盖在衬底台和顶出器元件之间的时刻,确定顶出器元件的基准高度; 以及从所确定的参考高度确定所述喷射器元件的最佳接管高度。