MICROELECTRONIC IMAGERS AND METHODS FOR MANUFACTURING SUCH MICROELECTRONIC IMAGERS
    1.
    发明申请
    MICROELECTRONIC IMAGERS AND METHODS FOR MANUFACTURING SUCH MICROELECTRONIC IMAGERS 有权
    微电子图像和制造这种微电子图像的方法

    公开(公告)号:US20090014822A1

    公开(公告)日:2009-01-15

    申请号:US11849062

    申请日:2007-08-31

    Abstract: Microelectronic imagers and methods of manufacturing such microelectronic imagers are disclosed. In one embodiment, a method for manufacturing a microelectronic imager can include irradiating selected portions of an imager housing unit. The housing unit includes a body having lead-in surfaces and a support surface that define a recess sized to receive a microelectronic die. The method also includes depositing a conductive material onto the irradiated portions of the housing unit and forming electrically conductive traces. The method further includes coupling a plurality of terminals at a front side of a microelectronic die to corresponding electrically conductive traces in the recess in a flip-chip configuration. The microelectronic die includes an image sensor aligned with at least a portion of an optical element carried by the housing unit and at least partially aligned with the recess. The method can then include depositing an encapsulant into the recess and over at least a portion of the microelectronic die.

    Abstract translation: 公开了微电子成像器和制造这种微电子成像器的方法。 在一个实施例中,用于制造微电子成像器的方法可以包括照射成像器壳体单元的选定部分。 壳体单元包括具有引入表面的本体和限定凹部的支撑表面,所述凹部的尺寸适于容纳微电子管芯。 该方法还包括将导电材料沉积到壳体单元的照射部分上并形成导电迹线。 该方法还包括将微电子管芯的前侧上的多个端子以倒装芯片配置耦合到凹槽中的对应导电迹线。 微电子管芯包括与由壳体单元承载并至少部分地与凹部对准的光学元件的至少一部分对准的图像传感器。 该方法然后可以包括将密封剂沉积到凹部中并在微电子管芯的至少一部分上方。

    WAFER LEVEL PACKAGING
    6.
    发明申请
    WAFER LEVEL PACKAGING 有权
    水平包装

    公开(公告)号:US20110018143A1

    公开(公告)日:2011-01-27

    申请号:US12898896

    申请日:2010-10-06

    Abstract: Through vias in a substrate are formed by creating a trench in a top side of the substrate and at least one trench in the back side of the substrate. The sum of the depths of the trenches at least equals the height of the substrate. The trenches cross at intersections, which accordingly form the through vias from the top side to the back side. The through vias are filled with a conductor to form contacts on both sides and the edge of the substrate. Contacts on the backside are formed at each of the trench. The through vias from the edge contacts. Traces connect bond pads to the conductor in the through via. Some traces are parallel to the back side traces. Some traces are skew to the back side traces. The substrate is diced to form individual die.

    Abstract translation: 通过在衬底的顶侧中形成沟槽和在衬底的后侧中的至少一个沟槽来形成衬底中的通孔。 沟槽的深度之和至少等于基板的高度。 沟槽在交叉路口处交叉,这相应地形成从顶侧到后侧的通孔。 通孔填充有导体,以在基板的两侧和边缘上形成接触。 在每个沟槽上形成背面的触点。 通孔从边缘接触。 跟踪将连接焊盘连接到通孔中的导体。 一些痕迹平行于背面痕迹。 一些痕迹偏向背面痕迹。 将基底切成单个模具。

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