公开(公告)号：US08013342B2

公开(公告)日：2011-09-06

申请号：US11939612

申请日：2007-11-14

申请人： Kerry Bernstein ,  Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Paul David Kartschoke ,  Stephen Ellinwood Luce ,  Anthony Kendall Stamper

发明人： Kerry Bernstein ,  Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Paul David Kartschoke ,  Stephen Ellinwood Luce ,  Anthony Kendall Stamper

IPC分类号： H01L29/04

CPC分类号： G06F17/5077 ,  H01L21/6835 ,  H01L21/76895 ,  H01L21/84 ,  H01L23/481 ,  H01L23/535 ,  H01L24/83 ,  H01L25/0657 ,  H01L25/50 ,  H01L27/0688 ,  H01L29/045 ,  H01L2221/6835 ,  H01L2221/68359 ,  H01L2221/68368 ,  H01L2224/83894 ,  H01L2224/9202 ,  H01L2225/06513 ,  H01L2924/01019 ,  H01L2924/01029 ,  H01L2924/0132 ,  H01L2924/1305 ,  H01L2924/14 ,  H01L2924/19041 ,  H01L2924/01007 ,  H01L2924/01022 ,  H01L2924/00

摘要： A double-sided integrated circuit chips, methods of fabricating the double-sided integrated circuit chips and design structures for double-sided integrated circuit chips. The method includes removing the backside silicon from two silicon-on-insulator wafers having devices fabricated therein and bonding them back to back utilizing the buried oxide layers. Contacts are then formed in the upper wafer to devices in the lower wafer and wiring levels are formed on the upper wafer. The lower wafer may include wiring levels. The lower wafer may include landing pads for the contacts. Contacts to the silicon layer of the lower wafer may be silicided.

摘要翻译： 双面集成电路芯片，制造双面集成电路芯片的方法和双面集成电路芯片的设计结构。 该方法包括从具有在其中制造的器件的两个绝缘体上硅晶片上去除背面硅，并利用掩埋氧化物层将它们背对背地接合。 然后在上晶片中形成与下晶片中的器件接触，并在上晶片上形成布线层。 下晶片可以包括布线​​水平。 下部晶片可以包括用于触点的着陆焊盘。 与下晶片的硅层的接触可以被硅化。

公开(公告)号：US07960245B2

公开(公告)日：2011-06-14

申请号：US12029575

申请日：2008-02-12

申请人： Kerry Bernstein ,  Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Paul David Kartschoke ,  Anthony Kendall Stamper

发明人： Kerry Bernstein ,  Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Paul David Kartschoke ,  Anthony Kendall Stamper

IPC分类号： H01L21/30

CPC分类号： H01L21/76898 ,  H01L21/84 ,  H01L23/481 ,  H01L23/522 ,  H01L27/1203 ,  H01L2924/0002 ,  H01L2924/00

摘要： A semiconductor device having wiring levels on opposite sides and a method of fabricating a semiconductor structure having contacts to devices and wiring levels on opposite sides. The method including fabricating a device on a silicon-on-insulator substrate with first contacts to the devices and wiring levels on a first side to the first contacts, removing a lower silicon layer to expose the buried oxide layer, forming second contacts to the devices through the buried oxide layer and forming wiring levels over the buried oxide layer to the second contacts.

公开(公告)号：US07906428B2

公开(公告)日：2011-03-15

申请号：US12121216

申请日：2008-05-15

申请人： Lawrence A. Clevenger ,  Timothy Joseph Dalton ,  Louis C. Hsu ,  Conal Eugene Murray ,  Carl Radens ,  Kwong-Hon Wong ,  Chih-Chao Yang

发明人： Lawrence A. Clevenger ,  Timothy Joseph Dalton ,  Louis C. Hsu ,  Conal Eugene Murray ,  Carl Radens ,  Kwong-Hon Wong ,  Chih-Chao Yang

IPC分类号： H01L21/4763

CPC分类号： H01L21/76802 ,  H01L21/76805 ,  H01L21/76843 ,  H01L21/76844 ,  H01L21/76847 ,  H01L21/76865 ,  H01L23/5226 ,  H01L23/53238 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/3011 ,  H01L2924/00

摘要： The present invention provides an interconnect structure that can be made in the BEOL which exhibits good mechanical contact during normal chip operations and does not fail during various reliability tests as compared with the conventional interconnect structures described above. The inventive interconnect structure has a kinked interface at the bottom of a via that is located within an interlayer dielectric layer. Specifically, the inventive interconnect structure includes a first dielectric layer having at least one metallic interconnect embedded within a surface thereof; a second dielectric layer located atop the first dielectric layer, wherein said second dielectric layer has at least one aperture having an upper line region and a lower via region, wherein the lower via region includes a kinked interface; at least one pair of liners located on at least vertical walls of the at least one aperture; and a conductive material filling the at least one aperture.

摘要翻译： 本发明提供一种可以在BEOL中制造的互连结构，其在正常的芯片操作期间表现出良好的机械接触，并且在与上述的常规互连结构相比在各种可靠性测试期间不会失败。 本发明的互连结构在通孔的底部具有位于层间介质层内的扭结界面。 具体地，本发明的互连结构包括：第一介电层，其具有嵌入在其表面内的至少一个金属互连; 位于所述第一介电层顶部的第二电介质层，其中所述第二电介质层具有至少一个具有上线区域和下通孔区域的孔，其中所述下通孔区域包括扭结界面; 位于所述至少一个孔的至少垂直壁上的至少一对衬垫; 以及填充所述至少一个孔的导电材料。

公开(公告)号：US20090111235A1

公开(公告)日：2009-04-30

申请号：US12348707

申请日：2009-01-05

申请人： Lawrence Clevenger ,  Timothy Joseph Dalton ,  Louis Hsu ,  Carl Radens ,  Vidhya Ramachandran ,  Keith Kwong Hon Wong ,  Chih-Chao Yang

发明人： Lawrence Clevenger ,  Timothy Joseph Dalton ,  Louis Hsu ,  Carl Radens ,  Vidhya Ramachandran ,  Keith Kwong Hon Wong ,  Chih-Chao Yang

IPC分类号： H01L21/02

CPC分类号： H01L21/84 ,  H01L21/76898 ,  H01L23/481 ,  H01L23/5223 ,  H01L27/1203 ,  H01L2924/0002 ,  Y10S438/957 ,  H01L2924/00

摘要： Methods are provided for fabricating semiconductor IC (integrated circuit) chips having high-Q on-chip capacitors formed on the chip back-side and connected to integrated circuits on the chip front-side using through-wafer interconnects. In one aspect, a semiconductor device includes a semiconductor substrate having a front side, a back side, and a buried insulating layer interposed between the front and back sides of the substrate. An integrated circuit is formed on the front side of the semiconductor substrate, an integrated capacitor is formed on the back side of the semiconductor substrate, and an interconnection structure is formed through the buried insulating layer to connect the integrated capacitor to the integrated circuit.

摘要翻译： 提供了用于制造半导体IC（集成电路）芯片的半导体IC（集成电路）芯片，其具有形成在芯片背面的高Q片上电容器，并使用晶片间互连连接到芯片正面的集成电路。 在一个方面，半导体器件包括一个半导体衬底，该半导体衬底具有介于衬底的正面和背面之间的正面，背面和掩埋绝缘层。 在半导体基板的正面形成有集成电路，在半导体基板的背面形成有集成电容器，通过埋入绝缘层形成互连结构，将集成电容器与集成电路连接起来。

公开(公告)号：US20090108381A1

公开(公告)日：2009-04-30

申请号：US10316254

申请日：2002-12-10

申请人： Leena Paivikki Buchwalter ,  Kevin Kok Chan ,  Timothy Joseph Dalton ,  Christopher Vincent Jahnes ,  Jennifer Louise Lund ,  Kevin Shawn Petrarca ,  James Louis Speidell ,  James Francis Ziegler

发明人： Leena Paivikki Buchwalter ,  Kevin Kok Chan ,  Timothy Joseph Dalton ,  Christopher Vincent Jahnes ,  Jennifer Louise Lund ,  Kevin Shawn Petrarca ,  James Louis Speidell ,  James Francis Ziegler

IPC分类号： H03H9/24 ,  H01L23/28 ,  H01L21/56

CPC分类号： B81C1/00246 ,  B81B2201/0271 ,  B81C1/0023 ,  B81C2203/0735 ,  H03H3/0072 ,  H03H9/2405

摘要： A method of formation of a microelectromechanical system (MEMS) resonator or filter which is compatible with integration with any analog, digital, or mixed-signal integrated circuit (IC) process, after or concurrently with the formation of the metal interconnect layers in those processes, by virtue of its materials of composition, processing steps, and temperature of fabrication is presented. The MEMS resonator or filter incorporates a lower metal level, which forms the electrodes of the MEMS resonator or filter, that may be shared with any or none of the existing metal interconnect levels on the IC. It further incorporates a resonating member that is comprised of at least one metal layer for electrical connection and electrostatic actuation, and at least one dielectric layer for structural purposes. The gap between the electrodes and the resonating member is created by the deposition and subsequent removal of a sacrificial layer comprised of a carbon-based material. The method of removal of the sacrificial material is by an oxygen plasma or an anneal in an oxygen containing ambient. A method of vacuum encapsulation of the MEMS resonator or filter is provided through means of a cavity containing the MEMS device, filled with additional sacrificial material, and sealed. Access vias are created through the membrane sealing the cavity; the sacrificial material is removed as stated previously, and the vias are re-sealed in a vacuum coating process.

摘要翻译： 一种形成微机电系统（MEMS）谐振器或滤波器的方法，其与在任何模拟，数字或混合信号集成电路（IC）工艺中的集成兼容，或者与这些工艺中的金属互连层的形成同时 ，由于其组成材料，加工步骤和制造温度。 MEMS谐振器或滤波器包含形成MEMS谐振器或滤波器的电极的较低金属电平，其可与IC上的现有金属互连电平中的任何一个或任何一个共享。 它还包括谐振元件，该谐振元件由用于电连接和静电驱动的至少一个金属层和至少一个用于结构目的的电介质层组成。 通过沉积并随后去除由碳基材料构成的牺牲层来产生电极和谐振构件之间的间隙。 去除牺牲材料的方法是通过氧等离子体或在含氧环境中的退火。 MEMS谐振器或滤波器的真空封装方法是通过一个包含MEMS器件的空腔的装置提供的，其中填充有额外的牺牲材料并被密封。 通过隔膜密封腔形成通孔; 如先前所述去除牺牲材料，并且在真空涂覆工艺中重新密封通孔。

公开(公告)号：US07365001B2

公开(公告)日：2008-04-29

申请号：US10735845

申请日：2003-12-16

申请人： Chih-Chao Yang ,  Louis L. Hsu ,  Keith Kwong Hon Wong ,  Timothy Joseph Dalton ,  Carl Radens ,  Larry Clevenger

发明人： Chih-Chao Yang ,  Louis L. Hsu ,  Keith Kwong Hon Wong ,  Timothy Joseph Dalton ,  Carl Radens ,  Larry Clevenger

IPC分类号： H01L21/4763

CPC分类号： H01L21/76844 ,  H01L21/76802 ,  H01L21/76805 ,  H01L21/76807 ,  H01L21/76834 ,  H01L21/76849 ,  H01L21/76862 ,  H01L23/5226 ,  H01L23/53238 ,  H01L2924/0002 ,  H01L2924/00

摘要： A method of making a diffusion barrier for a interconnect structure. The method comprises: providing a conductive line in a bottom dielectric trench; depositing a sacrificial liner on the cap layer; depositing an interlayer dielectric; forming a trench and a via in the top interlayer dielectric; and removing a portion of the cap layer and the sacrificial layer proximate to the bottom surface of the via. The removed portions of the cap layer and sacrificial layer deposit predominantly along the lower sidewalls of the via. The conductive line is in contact with a cap layer, and the sacrificial layer is in contact with the cap layer. The invention is also directed to the interconnect structures resulting from the inventive process.

摘要翻译： 制造互连结构的扩散阻挡层的方法。 该方法包括：在底部电介质沟槽中提供导线; 在所述盖层上沉积牺牲衬垫; 沉积层间电介质; 在顶层间电介质中形成沟槽和通孔; 以及去除靠近通孔底表面的覆盖层和牺牲层的一部分。 盖层和牺牲层的去除部分主要沿着通孔的下侧壁沉积。 导线与盖层接触，牺牲层与盖层接触。 本发明还涉及由本发明方法产生的互连结构。

公开(公告)号：US07193423B1

公开(公告)日：2007-03-20

申请号：US11275112

申请日：2005-12-12

申请人： Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Stephen Ellinwood Luce ,  Edmund Juris Sprogis

发明人： Timothy Joseph Dalton ,  Jeffrey Peter Gambino ,  Mark David Jaffe ,  Stephen Ellinwood Luce ,  Edmund Juris Sprogis

IPC分类号： G01R27/26 ,  G01R31/02

CPC分类号： H01L23/544 ,  H01L25/0657 ,  H01L25/50 ,  H01L2223/54453 ,  H01L2225/06513 ,  H01L2225/06531 ,  H01L2225/06593 ,  H01L2924/0002 ,  H01L2924/00

摘要： Structures for aligning wafers and methods for operating the same. The structure includes (a) a first semiconductor wafer including a first capacitive coupling structure, and (b) a second semiconductor wafer including a second capacitive coupling structure. The first and second semiconductor wafers are in direct physical contact with each other via a common surface. If the first and second semiconductor wafers are moved with respect to each other by a first displacement distance of 1 nm in a first direction while the first and second semiconductor wafers are in direct physical contact with each other via the common surface, then a change of at least 10−18 F in capacitance of a first capacitor comprising the first and second capacitive coupling structures results. The first direction is essentially parallel to the common surface.

摘要翻译： 用于对准晶片的结构及其操作方法。 该结构包括（a）包括第一电容耦合结构的第一半导体晶片和（b）包括第二电容耦合结构的第二半导体晶片。 第一和第二半导体晶片经由公共表面彼此直接物理接触。 如果第一和第二半导体晶片在第一方向上相对于彼此移动了1nm的第一位移距离，同时第一和第二半导体晶片经由公共表面彼此直接物理接触，则 包括第一电容耦合结构和第二电容耦合结构的第一电容器的电容中的至少10 -18 F。 第一个方向基本上平行于共同的表面。

公开(公告)号：US06724069B2

公开(公告)日：2004-04-20

申请号：US09827160

申请日：2001-04-05

申请人： Timothy Joseph Dalton ,  Stephen McConnell Gates ,  Jeffrey Curtis Hedrick ,  Satyanarayana V. Nitta ,  Sampath Purushothaman ,  Christy Sensenich Tyberg

发明人： Timothy Joseph Dalton ,  Stephen McConnell Gates ,  Jeffrey Curtis Hedrick ,  Satyanarayana V. Nitta ,  Sampath Purushothaman ,  Christy Sensenich Tyberg

IPC分类号： H01L2358

CPC分类号： H01L21/76835 ,  H01L21/76801 ,  H01L21/76811 ,  H01L21/76828 ,  H01L21/76829 ,  H01L21/76832 ,  H01L23/5329 ,  H01L2924/0002 ,  H01L2924/00

摘要： A spin-on cap useful as a post-CMP cap for Cu interconnect structures is provided. The inventive spin-on cap includes a low-k dielectric (on the order of 3.5 or less) and at least one additive. The at least one additive employed in the present invention is capable of binding Cu ions, and is soluble in the spun-on low-k dielectric. The spin-on cap of the present invention may further include a spun-on low-k (on the order of 3.5 or less) reactive-ion etch (RIE) stop layer. Spin-on caps containing a bilayer of low-dielectric plus at least additive and low-k RIE stop layer are preferred. It is noted that the inventive spin-on cap of the present invention does not significantly increase the effective dielectric constant of the interconnect structure and does not add additional cost to the fabrication of the interconnect structure since a single deposition tool, i.e., spin coating tool, is employed. Moreover, because of the presence of the additive in the spin-on cap, Cu migration is substantially minimized.

摘要翻译： 提供了一种用作Cu互连结构的CMP后盖的旋涂帽。 本发明的旋涂帽包括低k电介质（约3.5或更小）和至少一种添加剂。 本发明中使用的至少一种添加剂能够结合Cu离子，并且可溶于旋转的低k电介质。 本发明的旋涂帽还可以包括旋转低k（约3.5或更小）反应离子蚀刻（RIE）停止层。 包含低电介质加上至少添加和低k RIE停止层的双层的旋转盖是优选的。 注意，本发明的本发明的旋涂帽不会显着增加互连结构的有效介电常数，并且不会增加互连结构的制造的额外成本，因为单个沉积工具，即旋涂工具 ，被雇用。 此外，由于在旋涂帽中存在添加剂，所以Cu迁移基本上被最小化。

公开(公告)号：US06657305B1

公开(公告)日：2003-12-02

申请号：US09703734

申请日：2000-11-01

申请人： Stephen Alan Cohen ,  Timothy Joseph Dalton ,  John Anthony Fitzsimmons ,  Stephen McConnell Gates ,  Brian Wayne Herbst ,  Sampath Purushothaman ,  Stanley Joseph Whitehair

发明人： Stephen Alan Cohen ,  Timothy Joseph Dalton ,  John Anthony Fitzsimmons ,  Stephen McConnell Gates ,  Brian Wayne Herbst ,  Sampath Purushothaman ,  Stanley Joseph Whitehair

IPC分类号： H01L2348

CPC分类号： H01L21/76829 ,  H01L21/76804 ,  H01L21/76834 ,  H01L21/76885 ,  H01L23/5222 ,  H01L23/5283 ,  H01L2924/0002 ,  H01L2924/00

摘要： A metal plus low dielectric constant (low-k) interconnect structure is provided for a semiconductor device wherein adjacent regions in a surface separated by a dielectric have dimensions in width and spacing in the sub 250 nanometer range, and in which reduced lateral leakage current between adjacent metal lines, and a lower effective dielectric constant than a conventional structure, is achieved by the positioning of a differentiating or mask member that is applied for the protection of the dielectric in subsequent processing operations, at a position about 2-5 nanometers below a, to be planarized, surface where there will be a lower electric field. The invention is particularly useful in the damascene type device structure in the art wherein adjacent conductors extend from a substrate through an interlevel dielectric material, connections are made in a trench, a diffusion barrier liner is provided in the interlevel dielectric material and masking is employed to protect the dielectric material between conductors during processing operations.

摘要翻译： 为半导体器件提供金属加上低介电常数（低k）互连结构，其中由电介质隔开的表面中的相邻区域在亚250纳米范围内具有宽度和间距的尺寸，并且其中减小横向漏电流 相邻的金属线和比常规结构更低的有效介电常数是通过在后续处理操作中在约2-5纳米以下的位置处定位用于保护电介质的微分或掩模构件来实现的 ，要平坦化，会有较低电场的表面。 本发明特别适用于本领域的镶嵌型器件结构，其中相邻导体从衬底延伸通过层间电介质材料，在沟槽中形成连接，在层间电介质材料中提供扩散阻挡衬垫，并且使用掩模 在处理操作期间保护导体之间的电介质材料。

公开(公告)号：US07943412B2

公开(公告)日：2011-05-17

申请号：US10316254

申请日：2002-12-10

申请人： Leena Paivikki Buchwalter ,  Kevin Kok Chan ,  Timothy Joseph Dalton ,  Christopher Vincent Jahnes ,  Jennifer Louise Lund ,  Kevin Shawn Petrarca ,  James Louis Speidell ,  James Francis Ziegler

发明人： Leena Paivikki Buchwalter ,  Kevin Kok Chan ,  Timothy Joseph Dalton ,  Christopher Vincent Jahnes ,  Jennifer Louise Lund ,  Kevin Shawn Petrarca ,  James Louis Speidell ,  James Francis Ziegler

IPC分类号： H01L21/00

CPC分类号： B81C1/00246 ,  B81B2201/0271 ,  B81C1/0023 ,  B81C2203/0735 ,  H03H3/0072 ,  H03H9/2405

摘要： A method of formation of a microelectromechanical system (MEMS) resonator or filter which is compatible with integration with any analog, digital, or mixed-signal integrated circuit (IC) process, after or concurrently with the formation of the metal interconnect layers in those processes, by virtue of its materials of composition, processing steps, and temperature of fabrication is presented. The MEMS resonator or filter incorporates a lower metal level, which forms the electrodes of the MEMS resonator or filter, that may be shared with any or none of the existing metal interconnect levels on the IC. It further incorporates a resonating member that is comprised of at least one metal layer for electrical connection and electrostatic actuation, and at least one dielectric layer for structural purposes. The gap between the electrodes and the resonating member is created by the deposition and subsequent removal of a sacrificial layer comprised of a carbon-based material. The method of removal of the sacrificial material is by an oxygen plasma or an anneal in an oxygen containing ambient. A method of vacuum encapsulation of the MEMS resonator or filter is provided through means of a cavity containing the MEMS device, filled with additional sacrificial material, and sealed. Access vias are created through the membrane sealing the cavity; the sacrificial material is removed as stated previously, and the vias are re-sealed in a vacuum coating process.

摘要翻译： 一种形成微机电系统（MEMS）谐振器或滤波器的方法，其与在任何模拟，数字或混合信号集成电路（IC）工艺中的集成兼容，或者与这些工艺中的金属互连层的形成同时 ，由于其组成材料，加工步骤和制造温度。 MEMS谐振器或滤波器包含形成MEMS谐振器或滤波器的电极的较低金属电平，其可与IC上的现有金属互连电平中的任何一个或任何一个共享。 它还包括谐振元件，该谐振元件由用于电连接和静电驱动的至少一个金属层和至少一个用于结构目的的电介质层组成。 通过沉积并随后去除由碳基材料构成的牺牲层来产生电极和谐振构件之间的间隙。 去除牺牲材料的方法是通过氧等离子体或在含氧环境中的退火。 MEMS谐振器或滤波器的真空封装方法是通过一个包含MEMS器件的空腔的装置提供的，其中填充有额外的牺牲材料并被密封。 通过隔膜密封腔形成通孔; 如先前所述去除牺牲材料，并且在真空涂覆工艺中重新密封通孔。