TCO materials for solar applications
    2.
    发明授权
    TCO materials for solar applications 失效
    TCO材料用于太阳能应用

    公开(公告)号:US08557615B2

    公开(公告)日:2013-10-15

    申请号:US13310724

    申请日:2011-12-03

    IPC分类号: H01L21/00

    摘要: A method for forming a transparent conductive oxide (TCO) film for use in a TFPV solar device comprises the formation of a tin oxide film doped with between about 5 volume % and about 40 volume % antimony (ATO). Advantageously, the Sb concentration generally ranges from about 15 volume % to about 20 volume % and more advantageously, the Sb concentration is about 19 volume %. The ATO films exhibited almost no change in transmission characteristics between about 300 nm and about 1100 nm or resistivity after either a 15 hour exposure to water or an anneal in air for 8 minutes at 650 C, which indicated the excellent durability. Control sample of Al doped zinc oxide (AZO) exhibited degradation of resistivity for both a 15 hour exposure to water and an anneal in air for 8 minutes at 650 C.

    摘要翻译: 用于形成用于TFPV太阳能装置的透明导电氧化物(TCO)膜的方法包括形成掺杂有约5体积%至约40体积%的锑(ATO)的氧化锡膜。 有利地,Sb浓度通常在约15体积%至约20体积%的范围内,更有利地,Sb浓度为约19体积%。 ATO膜在暴露于水中15小时或在空气中在650℃下退火8分钟后,在约300nm至约1100nm之间的透射特性几乎没有显示出变化或电阻率,这表明耐久性优异。 Al掺杂的氧化锌(AZO)的对照样品在暴露于水的15小时和在空气中在650℃下退火8分钟都表现出电阻率的降低。

    TCO MATERIALS FOR SOLAR APPLICATIONS
    3.
    发明申请
    TCO MATERIALS FOR SOLAR APPLICATIONS 失效
    TCO材料用于太阳能应用

    公开(公告)号:US20130143354A1

    公开(公告)日:2013-06-06

    申请号:US13310724

    申请日:2011-12-03

    IPC分类号: H01L31/18 H01B1/08

    摘要: A method for forming a transparent conductive oxide (TCO) film for use in a TFPV solar device comprises the formation of a tin oxide film doped with between about 5 volume % and about 40 volume % antimony (ATO). Advantageously, the Sb concentration generally ranges from about 15 volume % to about 20 volume % and more advantageously, the Sb concentration is about 19 volume %. The ATO films exhibited almost no change in transmission characteristics between about 300 nm and about 1100 nm or resistivity after either a 15 hour exposure to water or an anneal in air for 8 minutes at 650 C, which indicated the excellent duarability. Control sample of Al doped zinc oxide (AZO) exhibited degradation of resistivity for both a 15 hour exposure to water and an anneal in air for 8 minutes at 650 C.

    摘要翻译: 用于形成用于TFPV太阳能装置的透明导电氧化物(TCO)膜的方法包括形成掺杂有约5体积%至约40体积%的锑(ATO)的氧化锡膜。 有利地,Sb浓度通常在约15体积%至约20体积%的范围内,更有利地,Sb浓度为约19体积%。 ATO膜在暴露于水中15小时或在空气中在650℃退火8分钟后,在约300nm至约1100nm之间的透射特性或电阻率几乎没有显示出变化,这表明极好的二次性。 Al掺杂的氧化锌(AZO)的对照样品在暴露于水的15小时和在空气中在650℃下退火8分钟都表现出电阻率的降低。

    Method of direct plating of copper on a substrate structure
    9.
    发明申请
    Method of direct plating of copper on a substrate structure 审中-公开
    在基板结构上直接电镀铜的方法

    公开(公告)号:US20070125657A1

    公开(公告)日:2007-06-07

    申请号:US11255368

    申请日:2005-10-21

    IPC分类号: C25D5/34 C25D3/38

    摘要: The present invention teaches a method for depositing a copper seed layer onto a substrate surface, generally onto a barrier layer. The barrier layer may include a refractory metal and/or a group 8, 9 or 10 metal. The method includes cathodically pre-treating the substrate in an acid-containing solution. The substrate is then placed into a copper solution (pH≧7.0) that includes complexed copper ions and a current or bias is applied across the substrate surface. The complexed copper ions are reduced to deposit a copper seed layer onto the barrier layer. In one aspect, a complex alkaline bath is then used to electrochemically plate a gapfill layer on the substrate surface, followed by overfill in the same bath. In another aspect, an acidic bath ECP gapfill process and overfill process follow the alkaline seed layer process.

    摘要翻译: 本发明教导了一种将铜籽晶层沉积到基底表面上的方法,通常在阻挡层上。 阻挡层可以包括难熔金属和/或第8,9或10族金属。 该方法包括在含酸溶液中阴极预处理底物。 然后将衬底放入包括络合的铜离子的铜溶液(pH> = 7.0)中,并且在衬底表面上施加电流或偏压。 络合的铜离子被还原以将铜籽晶层沉积在阻挡层上。 在一个方面,然后使用复杂的碱性浴来电化学地在衬底表面上印刷间隙填充层,然后在相同的浴中过量填充。 另一方面,酸性浴ECP间隙填充过程和过度填充过程遵循碱性种子层过程。

    Grafted seed layer for electrochemical plating
    10.
    发明申请
    Grafted seed layer for electrochemical plating 有权
    用于电化学电镀的接枝种子层

    公开(公告)号:US20070052104A1

    公开(公告)日:2007-03-08

    申请号:US11404058

    申请日:2006-04-13

    IPC分类号: H01L23/48

    摘要: Generally, the process includes depositing a barrier layer and seed layer on a feature formed in a dielectric layer, performing a grafting process, initiating a copper layer and then filing the feature by use of a bulk copper fill process. Copper features formed according to aspects described herein have desirable adhesion properties to a barrier and seed layers formed on a semiconductor substrate and demonstrate enhanced electromigration and stress migration results in the fabricated devices formed on the substrate.

    摘要翻译: 通常,该方法包括在形成在电介质层中的特征上沉积阻挡层和种子层,执行接枝过程,引发铜层,然后通过使用大量铜填充工艺来填充该特征。 根据本文描述的方面形成的铜特征对于形成在半导体衬底上的阻挡层和种子层具有期望的粘合性能,并且证明增强的电迁移和应力迁移导致形成在衬底上的制造器件。