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公开(公告)号:US11814744B2
公开(公告)日:2023-11-14
申请号:US16370265
申请日:2019-03-29
Applicant: Applied Materials, Inc.
Inventor: Nolan Zimmerman , Gregory J. Wilson , Andrew Anten , Richard W. Plavidal , Eric J. Bergman , Tricia Youngbull , Timothy Gale Stolt , Sam Lee
CPC classification number: C25D21/08 , C25D5/48 , C25D7/12 , C25D17/001 , H01L21/02068 , H01L21/2885
Abstract: Systems for cleaning electroplating system components may include an electroplating apparatus including a plating bath vessel. The electroplating apparatus may include a rinsing frame extending above the plating bath vessel. The rinsing frame may include a rim extending circumferentially about an upper surface of the plating bath vessel and defining a rinsing channel between the rim and the upper surface of the plating bath vessel. The electroplating apparatus may also include a rinsing assembly including a splash guard that is translatable from a recessed first position to a second position extending at least partially across an access to the plating bath vessel. The rinsing assembly may also include a fluid nozzle extending from the rinsing frame.
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公开(公告)号:US11578422B2
公开(公告)日:2023-02-14
申请号:US17583004
申请日:2022-01-24
Applicant: APPLIED Materials, Inc.
Inventor: Paul R. McHugh , Gregory J. Wilson , Kyle M. Hanson , John L. Klocke , Paul Van Valkenburg , Eric J. Bergman , Adam Marc McClure , Deepak Saagar Kalaikadal , Nolan Layne Zimmerman , Michael Windham , Mikael R. Borjesson
Abstract: An electroplating system has a vessel assembly holding an electrolyte. A weir thief electrode assembly in the vessel assembly includes a plenum inside of a weir frame. The plenum divided into at least a first, a second and a third virtual thief electrode segment. A plurality of spaced apart openings through the weir frame lead out of the plenum. A weir ring is attached to the weir frame and guides flow of current during electroplating. The electroplating system provides process determined radial and circumferential current density control and does not require changing hardware components during set up.
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公开(公告)号:US20220145485A1
公开(公告)日:2022-05-12
申请号:US17582659
申请日:2022-01-24
Applicant: Applied Materials, Inc.
Inventor: Paul R. McHugh , Gregory J. Wilson
Abstract: Systems and methods for electroplating are described. The electroplating system may include a vessel configured to hold a first portion of a liquid electrolyte. The system may also include a substrate holder configured for holding a substrate in the vessel. The system may further include a first reservoir in fluid communication with the vessel. In addition, the system may include a second reservoir in fluid communication with the vessel. Furthermore, the system may include a first mechanism configured to expel a second portion of the liquid electrolyte from the first reservoir into the vessel. The system may also include a second mechanism configured to take in a third potion of the liquid electrolyte from the vessel into the second reservoir when the second portion of the liquid electrolyte is expelled from the first reservoir. Methods may include oscillating flow of the electrolyte within the vessel.
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公开(公告)号:US20220127747A1
公开(公告)日:2022-04-28
申请号:US17078413
申请日:2020-10-23
Applicant: Applied Materials, Inc.
Inventor: Nolan L. Zimmerman , Charles Sharbono , Gregory J. Wilson , Paul R. McHugh , Paul Van Valkenburg , Deepak Saagar Kalaikadal , Kyle M. Hanson
Abstract: Electroplating systems may include an electroplating chamber. The systems may also include a replenish assembly fluidly coupled with the electroplating chamber. The replenish assembly may include a first compartment housing anode material. The first compartment may include a first compartment section in which the anode material is housed and a second compartment section separated from the first compartment section by a divider. The replenish assembly may include a second compartment fluidly coupled with the electroplating chamber and electrically coupled with the first compartment. The replenish assembly may also include a third compartment electrically coupled with the second compartment, the third compartment including an inert cathode.
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公开(公告)号:US20200098628A1
公开(公告)日:2020-03-26
申请号:US16572920
申请日:2019-09-17
Applicant: Applied Materials, Inc.
Inventor: Paul McHugh , Kwan Wook Roh , Gregory J. Wilson
IPC: H01L21/768 , G06F17/50 , H01L21/288
Abstract: Exemplary methods of producing a semiconductor substrate may include characterizing a substrate pattern to identify a zonal distribution of a plurality of vias and a height and a radius of each via of the plurality of vias. The methods may include determining a fill rate for each via within the zonal distribution of the plurality of vias. The methods may include modifying a die pattern to adjust via fill rates between two zones of vias. The methods may also include producing a substrate according to the die pattern.
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公开(公告)号:US09765443B2
公开(公告)日:2017-09-19
申请号:US14843803
申请日:2015-09-02
Applicant: APPLIED Materials, Inc.
Inventor: Gregory J. Wilson , Paul R. McHugh
CPC classification number: C25D17/12 , C25D17/001 , C25D17/002 , C25D17/007
Abstract: An electroplating processor has a head including a wafer holder, with the head movable to position a wafer in the wafer holder into a vessel holding a first electrolyte and having one or more anodes. A thief electrode assembly may be positioned adjacent to a lower end of the vessel, or below the anode. A thief current channel extends from the thief electrode assembly to a virtual thief position adjacent to the wafer holder. A thief electrode in the thief electrode assembly is positioned within a second electrolyte which is separated from the first electrolyte by a membrane. Alternatively, two membranes may be used with an isolation solution between them. The processor avoids plating metal onto the thief electrode, even when processing redistribution layer and wafer level packaging wafers having high amp-minute electroplating characteristics.
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公开(公告)号:US09758897B2
公开(公告)日:2017-09-12
申请号:US14606775
申请日:2015-01-27
Applicant: APPLIED Materials, Inc.
Inventor: Gregory J. Wilson , Paul R. McHugh
CPC classification number: C25D17/005 , C25D7/12 , C25D17/001 , C25D17/004 , C25D17/007 , C25D21/12
Abstract: An electro-processing apparatus has a contact ring including a seal which is able to compensate for electric field distortions created by a notch (or other irregularity) on the wafer or work piece. The shape of the contact ring at the notch is changed, to reduce current crowding at the notch. The change in shape changes the resistance of the current path between a thief electrode and the wafer edge to increase thief electrode current drawn from the region of the notch. As a result, the wafer is plated with a film having more uniform thickness.
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公开(公告)号:US20170022624A1
公开(公告)日:2017-01-26
申请号:US14806255
申请日:2015-07-22
Applicant: APPLIED Materials, Inc.
Inventor: Gregory J. Wilson , Paul R. McHugh
CPC classification number: C25D17/001 , C25D5/08 , C25D21/10
Abstract: Electroplating apparatus agitates electrolyte to provide high velocity fluid flows at the surface of a wafer. The apparatus includes a paddle which provides uniform high mass transfer over the entire wafer, even with a relatively large gap between the paddle and the wafer. Consequently, the processor may have an electric field shield positioned between the paddle and the wafer for effective shielding at the edges of the wafer. The influence of the paddle on the electric field across the wafer is reduced as the paddle is spaced relatively farther from the wafer.
Abstract translation: 电镀装置搅拌电解质以在晶片的表面提供高速流体流。 该设备包括桨叶,其甚至在桨叶和晶片之间具有相对较大的间隙,在整个晶片上提供均匀的高质量传递。 因此,处理器可以具有位于叶片和晶片之间的电场屏蔽,用于在晶片的边缘处有效屏蔽。 当桨叶离晶片相对较远时,桨叶对晶片上的电场的影响减小。
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公开(公告)号:US20160305038A1
公开(公告)日:2016-10-20
申请号:US14686537
申请日:2015-04-14
Applicant: APPLIED Materials, Inc.
Inventor: Paul R. McHugh , Gregory J. Wilson
IPC: C25D17/00
CPC classification number: C25D17/001 , C25D7/123 , C25D17/005 , C25D17/008
Abstract: An electroplating apparatus has a vessel for holding electrolyte. A head has a rotor including a contact ring for holding a wafer having a notch. The contact ring includes a perimeter voltage ring having perimeter contact fingers for contacting the wafer around the perimeter of the wafer, except at the notch. The contact ring also has a notch contact segment having one or more notch contact fingers for contacting the wafer at the notch. The perimeter voltage ring is insulated from the notch contact segment. A negative voltage source is connected to the perimeter voltage ring, and a positive voltage source connected to the notch contact segment. The positive voltage applied at the notch reduces the current crowding effect at the notch. The wafer is plated with a film having more uniform thickness.
Abstract translation: 电镀装置具有容纳电解液的容器。 头部具有包括用于保持具有凹口的晶片的接触环的转子。 接触环包括具有周边接触指状物的周边电压环,除了在凹口之外,接触圆周围晶片的周边接触晶片。 接触环还具有切口接触段,该切口接触段具有用于在切口处接触晶片的一个或多个切口接触指。 周边电压环与凹口接触段绝缘。 负电压源连接到周边电压环,正电压源连接到切口触点段。 在凹口处施加的正电压降低了凹口处的电流拥挤效应。 晶圆上镀上厚度更均匀的薄膜。
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公开(公告)号:US20130299354A1
公开(公告)日:2013-11-14
申请号:US13943684
申请日:2013-07-16
Applicant: APPLIED Materials, Inc.
Inventor: Gregory J. Wilson , Paul R. McHugh
IPC: H01L21/02
CPC classification number: H01L21/02002 , C25D5/028 , C25D5/08 , C25D7/123 , C25D17/002 , C25D17/005 , C25D17/007 , C25D17/02
Abstract: An electrochemical processor may include a head having a rotor configured to hold a workpiece, with the head moveable to position the rotor in a vessel. Inner and outer anodes are in inner and outer anolyte chambers within the vessel. An upper cup in the vessel, has a curved upper surface and inner and outer catholyte chambers. A current thief is located adjacent to the curved upper surface. Annular slots in the curved upper curved surface connect into passageways, such as tubes, leading into the outer catholyte chamber. Membranes may separate the inner and outer anolyte chambers from the inner and outer catholyte chambers, respectively.
Abstract translation: 电化学处理器可以包括具有被配置为保持工件的转子的头部,头部可移动以将转子定位在容器中。 内阳极和外阳极在容器内部和外部阳极电解液室中。 容器中的上杯具有弯曲的上表面和内部和外部阴极电解液室。 目前的小偷位于弯曲的上表面附近。 弯曲的上曲面中的环形槽连接到通道,例如管,通向外阴极室。 膜可以分别将内部和外部阳极电解液室与内部和外部阴极电解液室分开。
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