Radiation-emitting semiconductor element and method for producing the same
    2.
    发明申请
    Radiation-emitting semiconductor element and method for producing the same 审中-公开
    辐射发射半导体元件及其制造方法

    公开(公告)号:US20060011925A1

    公开(公告)日:2006-01-19

    申请号:US11065769

    申请日:2005-02-25

    IPC分类号: H01L29/22

    摘要: This invention describes a radiation-emitting semiconductor component based on GaN, whose semiconductor body is made up of a stack of different GaN semiconductor layers (1). The semiconductor body has a first principal surface (3) and a second principal surface (4), with the radiation produced being emitted through the first principal surface (3) and with a reflector (6) being produced on the second principal surface (4). The invention also describes a production method for a semiconductor component pursuant to the invention. An interlayer (9) is first applied to a substrate (8), and a plurality of GaN layers (1) that constitute the semiconductor body of the component are then applied to this. The substrate (8) and the interlayer (9) are then detached and a reflector (6) is produced on a principal surface of the semiconductor body.

    摘要翻译: 本发明描述了一种基于GaN的辐射发射半导体元件,其半导体主体由不同GaN半导体层(1)的堆叠构成。 半导体本体具有第一主表面(3)和第二主表面(4),所产生的辐射通过第一主表面(3)发射,反射器(6)在第二主表面(4)上产生 )。 本发明还描述了根据本发明的半导体部件的制造方法。 首先将中间层(9)施加到基板(8),然后施加构成部件的半导体主体的多个GaN层(1)。 然后分离基板(8)和中间层(9),并且在半导体本体的主表面上产生反射器(6)。

    GaN-based light emitting-diode chip and a method for producing same
    4.
    发明申请
    GaN-based light emitting-diode chip and a method for producing same 审中-公开
    GaN基发光二极管芯片及其制造方法

    公开(公告)号:US20070012944A1

    公开(公告)日:2007-01-18

    申请号:US11508504

    申请日:2006-08-23

    IPC分类号: H01L33/00

    摘要: An LED chip comprising an electrically conductive and radioparent substrate, in which the epitaxial layer sequence is provided on substantially the full area of its p-side with a reflective, bondable p-contact layer. The substrate is provided on its main surface facing away from the epitaxial layer sequence with a contact metallization that covers only a portion of said main surface, and the decoupling of light from the chip takes place via a bare region of the main surface of the substrate and via the chip sides. A further LED chip has epitaxial layers only. The p-type epitaxial layer is provided on substantially the full area of the main surface facing away from the n-conductive epitaxial layer with a reflective, bondable p-contact layer, and the n-conductive epitaxial layer is provided on its main surface facing away from the p-conductive epitaxial layer with an n-contact layer that covers only a portion of said main surface. The decoupling of light from the chip takes place via the bare region of the main surface of the n-conductive epitaxial layer and via the chip sides.

    摘要翻译: 一种LED芯片,包括导电和无辐射基板,其中外延层序列在其p侧的基本上整个区域上设置有反射的,可粘合的p接触层。 衬底在其主表面上设置为背离外延层序列,接触金属化仅覆盖所述主表面的一部分,并且来自芯片的光的解耦通过衬底的主表面的裸露区域进行 并通过芯片侧面。 另外的LED芯片仅具有外延层。 p型外延层在主表面的大致整个区域上设置有背向n导电外延层的反射式可结合p接触层,并且n导电外延层设置在其主表面上 远离p导电外延层,其中n接触层仅覆盖所述主表面的一部分。 来自芯片的光的解耦通过n导电外延层的主表面的裸露区域和芯片侧进行。

    Method for depositing a material on a substrate wafer
    10.
    发明授权
    Method for depositing a material on a substrate wafer 有权
    在衬底晶片上沉积材料的方法

    公开(公告)号:US07425237B2

    公开(公告)日:2008-09-16

    申请号:US10696882

    申请日:2003-10-30

    IPC分类号: C30B23/00

    摘要: The deposition of material (3) on a growth area (4) may be highly temperature-sensitive. In order to reduce temperature inhomogeneities on the growth area (4) of a substrate wafer (1), a thermal radiation absorption layer (2) is applied on a rear side (5) of the substrate wafer (1) lying opposite to the growth area (4). The thermal radiation absorption layer (2) exhibits good radiation absorption in the spectral range of a heating source. Since the deposition of semiconductor materials, in particular AllnGaN, may lead to (depending on the deposition temperature) different emission wavelengths of the deposited material, the use of a thermal radiation absorption layer (2) may produce a narrower emission wavelength distribution of the deposited material (3).

    摘要翻译: 材料(3)在生长区域(4)上的沉积可能是高度温度敏感的。 为了降低衬底晶片(1)的生长区域(4)上的温度不均匀性,将热辐射吸收层(2)施加在与生长相对的衬底晶片(1)的后侧(5)上 区域(4)。 热辐射吸收层(2)在加热源的光谱范围内表现出良好的辐射吸收。 由于半导体材料(特别是AllnGaN)的沉积可能导致(取决于沉积温度)沉积材料的不同发射波长,所以使用热辐射吸收层(2)可以产生较小的沉积的发射波长分布 材料(3)。