Dual die semiconductor package
    6.
    发明授权
    Dual die semiconductor package 有权
    双模半导体封装

    公开(公告)号:US08288847B2

    公开(公告)日:2012-10-16

    申请号:US12830446

    申请日:2010-07-06

    IPC分类号: H01L23/02

    摘要: A dual die semiconductor package has a grid array of electrical contacts on a bottom surface of a substrate. There is a first semiconductor die with a base surface mounted to an upper surface of the substrate and the first semiconductor die has first die upper surface external electrical connection pads on an upper surface that are electrically connected to respective electrical contacts of the grid array. There is also a second semiconductor die with a base surface mounted to an upper surface of a lead frame flag. There are second die upper surface external electrical connection pads on an upper surface of the second semiconductor die. The dual die semiconductor package includes leads and at least some of the leads are electrically connected to respective pads that provide the second die upper surface external electrical connection pads. A package body at encloses the first semiconductor die and the second semiconductor die. The electrical contacts of the grid array and part of each of the leads protrude from the package body to form external package electrical connections. Also, at least part of a base surface of the lead frame flag directly under the second semiconductor die is left exposed by the package body and provides a heat sink.

    摘要翻译: 双模半导体封装在基板的底表面上具有电触点的格栅阵列。 存在第一半导体管芯,其具有安装到基板的上表面的基面,并且第一半导体管芯具有电连接到栅格阵列的相应电触点的上表面上的第一管芯上表面外部电连接焊盘。 还有第二半导体管芯,其基面安装在引线框标志的上表面。 在第二半导体管芯的上表面上具有第二管芯上表面外部电连接焊盘。 双模半导体封装包括引线,并且至少一些引线电连接到提供第二管芯上表面外部电连接焊盘的相应焊盘。 封装体包围第一半导体管芯和第二半导体管芯。 栅格阵列的电触点和每个引线的一部分从封装主体突出以形成外部封装电连接。 此外,直接位于第二半导体管芯下方的引线框标志的基面的至少一部分被封装体暴露并提供散热器。