摘要:
An inductor device and method of forming the inductor device are provided. In some embodiments the inductor device includes a post passivation interconnect (PPI) layer disposed and an under bump metallization (UBM) layer, each disposed over a substrate. The PPI layer forms a coil and dummy pads. The dummy pads are disposed around a substantial portion of the coil to shield the coil from electromagnetic interference. A first portion of the UBM layer is electrically coupled to the coil and configured to interface with an electrical coupling member.
摘要:
An inductor device and method of forming the inductor device are provided. In some embodiments the inductor device includes a post passivation interconnect (PPI) layer disposed and an under bump metallization (UBM) layer, each disposed over a substrate. The PPI layer forms a coil and dummy pads. The dummy pads are disposed around a substantial portion of the coil to shield the coil from electromagnetic interference. A first portion of the UBM layer is electrically coupled to the coil and configured to interface with an electrical coupling member.
摘要:
A method includes measuring a first calibration kit in a wafer to obtain a first performance data. The wafer includes a substrate, and a plurality of dielectric layers over the substrate. The first calibration kit includes a first passive device over the plurality of dielectric layers, wherein substantially no metal feature is disposed in the plurality of dielectric layers and overlapped by the first passive device. The method further includes measuring a second calibration kit in the wafer to obtain a second performance data. The second calibration kit includes a second passive device identical to the first device and over the plurality of dielectric layers, and dummy patterns in the plurality of dielectric layers and overlapped by the second passive device. The first performance data and the second performance data are de-embedded to determine an effect of metal patterns in the plurality of dielectric layers to overlying passive devices.
摘要:
A method includes measuring a first calibration kit in a wafer to obtain a first performance data. The wafer includes a substrate, and a plurality of dielectric layers over the substrate. The first calibration kit includes a first passive device over the plurality of dielectric layers, wherein substantially no metal feature is disposed in the plurality of dielectric layers and overlapped by the first passive device. The method further includes measuring a second calibration kit in the wafer to obtain a second performance data. The second calibration kit includes a second passive device identical to the first device and over the plurality of dielectric layers, and dummy patterns in the plurality of dielectric layers and overlapped by the second passive device. The first performance data and the second performance data are de-embedded to determine an effect of metal patterns in the plurality of dielectric layers to overlying passive devices.
摘要:
A method of light-emitting diode (LED) packaging includes coupling a number of LED dies to corresponding bonding pads on a sub-mount. A mold apparatus having concave recesses housing LED dies is placed over the sub-mount. The sub-mount, the LED dies, and the mold apparatus are heated in a thermal reflow process to bond the LED dies to the bonding pads. Each recess substantially restricts shifting of the LED die with respect to the bonding pad during the heating.
摘要:
Provided is a method of fabricating a light-emitting diode (LED) device. The method includes providing a wafer. The wafer has light-emitting diode (LED) devices formed thereon. The method includes immersing the wafer into a polymer solution that has a surface tension lower than that of acetic acid. The polymer solution contains a liquid polymer and phosphor particles. The method includes lifting the wafer out of the polymer solution at a substantially constant speed. The method includes drying the wafer. The above processes form a conformal coating layer at least partially around the LED devices. The coating layer includes the phosphor particles. The coating layer also has a substantially uniform thickness.
摘要:
An apparatus includes a wafer with a number of openings therein. For each opening, an LED device is coupled to a conductive carrier and the wafer in a manner so that each of the coupled LED device and a portion of the conductive carrier at least partially fill the opening. A method of fabricating an LED device includes forming a number of openings in a wafer. The method also includes coupling light-emitting diode (LED) devices to conductive carriers. The LED devices with conductive carriers at least partially fill each of the openings.
摘要:
Chipsets capable of preventing malfunction caused by feedback clock distortion are provided, in which a phase frequency detector generates a control voltage according to a first reference clock and a first feedback clock, a voltage-controlled oscillator generates an output clock according to the control voltage, a frequency divider performs a frequency-division on a second feedback clock to obtain the first feedback clock, and a frequency filter estimates swings and frequency of a third feedback clock from an external unit and selectively outputs one of the third feedback clock or the output clock to serve as the second clock.
摘要:
A calibrating method for adjusting related parameters when a first chip and a second chip switch signals is disclosed. The calibrating method includes: utilizing the first chip to output a test signal through using a first driving force in order to represent a test value; utilizing the second chip to receive the test signal and utilizing the second chip to read the test signal to determine a value; and performing a comparison step for comparing the value with the test value to detect whether said value complies with the test value.
摘要:
A timing adjustment circuit and method thereof are disclosed. The timing adjustment circuit at least consists of a second timing adjustment unit, a multistage sample circuit, and a decision circuit for adjusting received timing of an output signal transmitted by a first chip and received by a second chip. The method takes advantage of the multistage sample circuit to receive a clock signal of receiving end so as to generate a plurality of sample clock signal. Later, according to the sample clock signals, sample output signals to generate a plurality of sampled signal. At last, make comparison of the sampled signals by the decision circuit in accordance with the output signals to generate a second adjustment signal being transmitted to the second timing adjustment unit for adjusting phase of a base clock to generate an adjusted receiving-end clock signal. Thus the receiving timing of the second chip to receive the output signal is adjusted. Moreover, the decision circuit sends a first adjustment signal to a first timing adjustment unit of the timing adjustment circuit for generating an adjusted output-end clock signal. Thus the output timing that the first chip transmits the output signal to the second chip is adjusted.