Apparatus for inserting coils into stator core slots
    1.
    发明授权
    Apparatus for inserting coils into stator core slots 失效
    用于将线圈插入定子芯槽的装置

    公开(公告)号:US4571822A

    公开(公告)日:1986-02-25

    申请号:US557005

    申请日:1983-12-01

    IPC分类号: H02K15/06

    摘要: A method of and apparatus for inserting coils into slots formed in the stator core of a dynamoelectric machine such as an electric motor, with the stator core having open type slots each of which cooperates with blades of the apparatus for guiding the coil and a stripper for forcing the coil out of the blades. A closed space has a volume sufficient to avoid any disorder of coil wire layers when the coil is received by the closed space. After placing the coils in the closed spaces, the coils are pushed into the respective slots and, as desired, the coils are further compressed until the coil wires assume a non-circular cross-section. By so doing, it is possible to remarkably increase the space factor of each slot.

    摘要翻译: 一种用于将线圈插入形成在诸如电动机的电动机的定子芯中的槽中的方法和装置,其中定子芯具有开口型槽,每个定子芯与用于引导线圈的装置的叶片配合,以及用于 迫使线圈从叶片中推出。 闭合空间具有足够的体积,以避免当线圈被封闭空间接收时线圈线层的任何紊乱。 在将线圈放置在封闭空间中之后,线圈被推入相应的槽中,并且根据需要,线圈被进一步压缩,直到线圈线呈非圆形横截面。 通过这样做,可以显着增加每个槽的空间因子。

    Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates
    3.
    发明授权
    Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates 失效
    用于产生具有多个基板的半导体IC测试器的地平面的方法和装置

    公开(公告)号:US06642734B1

    公开(公告)日:2003-11-04

    申请号:US09707020

    申请日:2000-11-06

    IPC分类号: G01R3128

    CPC分类号: G01R31/31924 G01R31/31917

    摘要: When performing supply and measurement of various signals on n=8 semiconductor IC devices under test DUT1-DUT8 using m=3 substrates 10-30, reference voltages of the devices under test DUT1-DUT3 are input to the substrate 10, reference voltages of the devices under test DUT4-DUT6 are input to the substrate 20, and reference voltages of the devices under test DUT7 and 8 are input to the substrate 30. The reference voltages input to each substrate 10-30 are averaged. The mean voltages made in each substrate are further connected to each other, and a reference voltage is made using three substrates 10-30. The reference voltage is used as a reference voltage for voltage generating circuits 11-31. The reference voltage having no variation among each substrate is set even if the number of semiconductor IC devices under test is increased and the whole equipment becomes large.

    摘要翻译: 在使用m = 3衬底10-30的n = 8个被测试DUT1-DUT8的半导体IC器件上进行各种信号的供给和测量时,被测器件DUT1-DUT3的参考电压被输入到衬底10,参考电压 被测器件DUT4-DUT6被输入到衬底20,并且被测器件DUT7和8的参考电压被输入到衬底30.输入到每个衬底10-30的参考电压被平均。 在每个衬底中制造的平均电压进一步彼此连接,并且使用三个衬底10-30制成参考电压。 参考电压用作电压产生电路11-31的参考电压。 即使被测半导体IC器件的数量增加,整个设备变大,也设定各基板之间没有变化的基准电压。