Memory cell driver circuits
    6.
    发明授权
    Memory cell driver circuits 有权
    存储单元驱动电路

    公开(公告)号:US07236410B2

    公开(公告)日:2007-06-26

    申请号:US11169106

    申请日:2005-06-27

    IPC分类号: G11C7/00 G11C17/00 G11C5/06

    CPC分类号: G11C17/18

    摘要: A system includes a pull-up circuit to program a memory cell. The pull-up circuit may include a level shifter to receive a control signal, a supply voltage, and one or more of a plurality of rail voltages, each of the plurality of rail voltages substantially equal to a respective integer multiple of the supply voltage, and to generate a second control signal, and a cascode stage. The cascode stage may include a plurality of transistors, a gate voltage of each of the plurality of transistors to be controlled at least in part by a respective one of the second control signal, the supply voltage, and at least one of the plurality of rail voltages, and an output node to provide a cell programming signal.

    摘要翻译: 系统包括用于对存储器单元进行编程的上拉电路。 上拉电路可以包括电平移位器以接收控制信号,电源电压以及多个轨道电压中的一个或多个,多个轨道电压中的每一个基本上等于电源电压的相应整数倍, 并产生第二控制信号和共源共栅级。 共源共栅级可以包括多个晶体管,多个晶体管中的每一个的栅极电压至少部分地由第二控制信号,电源电压和多个轨道中的至少一个轨道 电压和输出节点以提供单元编程信号。

    Voltage dependent capacitor configuration for higher soft error rate tolerance
    10.
    发明授权
    Voltage dependent capacitor configuration for higher soft error rate tolerance 有权
    电压相关电容器配置,用于更高的软错误率容差

    公开(公告)号:US06552887B1

    公开(公告)日:2003-04-22

    申请号:US09608457

    申请日:2000-06-29

    IPC分类号: G11C1140

    摘要: A voltage dependent capacitor to provide soft error rate tolerance in an integrated circuit is disclosed. In one embodiment, a parallel n-p voltage dependent capacitor is used to protect a node from noise. In another embodiment, an nFET-in-nWell voltage dependent capacitor is used to provide a soft error rate tolerant capacitor with reduced area.

    摘要翻译: 公开了一种用于在集成电路中提供软错误率容限的电压相关电容器。 在一个实施例中,使用并联n-p电压依赖电容器来保护节点免受噪声。 在另一个实施例中,使用nFET-nWell电压相关电容器来提供具有减小的面积的软误差容限电容器。