Low coherence grazing incidence interferometry for profiling and tilt sensing
    2.
    发明授权
    Low coherence grazing incidence interferometry for profiling and tilt sensing 有权
    低相干掠入射干涉测量用于剖面和倾斜感测

    公开(公告)号:US07289224B2

    公开(公告)日:2007-10-30

    申请号:US10941631

    申请日:2004-09-15

    IPC分类号: G01B9/02

    摘要: An optical system includes a photolithography system, a low coherence interferometer, and a detector. The photolithography system is configured to illuminate a portion of an object with a light pattern and has a reference surface. The low coherence interferometer has a reference optical path and a measurement optical path. Light that passes along the reference optical path reflects at least once from the reference surface and light that passes along the measurement optical path reflects at least once from the object. The detector is configured to detect a low coherence interference signal including light that has passed along the reference optical path and light that has passed along the measurement optical path. The low coherence interference signal is indicative of a spatial relationship between the reference surface and the object.

    摘要翻译: 光学系统包括光刻系统,低相干干涉仪和检测器。 光刻系统被配置为用光图案照射物体的一部分并具有参考表面。 低相干干涉仪具有参考光路和测量光路。 沿着基准光路通过的光至少从参考面反射一次,并且沿测量光路通过的光从物体反射至少一次。 检测器被配置为检测包括沿着参考光路已经通过的光和沿着测量光路已经通过的光的低相干干涉信号。 低相干干涉信号指示参考表面和对象之间的空间关系。

    Scanning interferometry
    5.
    发明授权
    Scanning interferometry 有权
    扫描干涉测量

    公开(公告)号:US07102761B2

    公开(公告)日:2006-09-05

    申请号:US10855788

    申请日:2004-05-27

    IPC分类号: G01B9/02

    摘要: An interferometry method includes: imaging test light reflected from at least a first portion of a test surface to interfere with reference light on a camera and form an interference pattern, wherein the imaging defines a depth of focus for the light reflected from the test surface, and wherein the test light and reference light are derived from a common source; varying an optical path length difference between the test light and reference light over a range larger than the depth of focus, wherein the optical path length difference corresponds to a difference between a first optical path between the common source and the camera for the test light and a second optical path between the common source and the camera for the reference light; and maintaining the first portion of the test surface within the depth of focus as the optical path length difference is varied.

    摘要翻译: 干涉测量方法包括:对从测试表面的至少第一部分反射的测试光进行成像,以干涉照相机上的参考光并形成干涉图案,其中所述成像为从所述测试表面反射的光定义焦深, 并且其中所述测试光和参考光源自公共源; 在大于焦深的范围内改变测试光和参考光之间的光程长度差,其中光程长度差对应于测试光的公共源和照相机之间的第一光路之间的差,以及 用于参考光的公共源和照相机之间的第二光路; 以及当所述光路长度差被改变时,将所述测试表面的所述第一部分保持在所述焦深内。

    Triangulation methods and systems for profiling surfaces through a thin film coating
    7.
    发明授权
    Triangulation methods and systems for profiling surfaces through a thin film coating 有权
    用于通过薄膜涂层对表面进行成形的三角测量方法和系统

    公开(公告)号:US07292346B2

    公开(公告)日:2007-11-06

    申请号:US10941622

    申请日:2004-09-15

    IPC分类号: G01B9/02

    摘要: An optical system includes a photolithography system, a low coherence interferometer, and a detector. The photolithography system is configured to illuminate a portion of an object with a light pattern and has a reference surface. The low coherence interferometer has a reference optical path and a measurement optical path. Light that passes along the reference optical path reflects at least once from the reference surface and light that passes along the measurement optical path reflects at least once from the object. The detector is configured to detect a low coherence interference signal including light that has passed along the reference optical path and light that has passed along the measurement optical path. The low coherence interference signal is indicative of a spatial relationship between the reference surface and the object.

    摘要翻译: 光学系统包括光刻系统,低相干干涉仪和检测器。 光刻系统被配置为用光图案照射物体的一部分并具有参考表面。 低相干干涉仪具有参考光路和测量光路。 沿着基准光路通过的光至少从参考面反射一次,并且沿测量光路通过的光至少反射一次。 检测器被配置为检测包括沿着参考光路已经通过的光和沿着测量光路已经通过的光的低相干干涉信号。 低相干干涉信号指示参考表面和对象之间的空间关系。

    Interferometer having a coupled cavity geometry for use with an extended source
    10.
    发明授权
    Interferometer having a coupled cavity geometry for use with an extended source 有权
    干涉仪具有与扩展源一起使用的耦合空腔几何形状

    公开(公告)号:US07046371B2

    公开(公告)日:2006-05-16

    申请号:US10464163

    申请日:2003-06-17

    IPC分类号: G01B9/02

    摘要: In certain aspects, the invention features an interferometry system that utilizes coupled cavities (e.g., at least one remote cavity and a main cavity) and an extended light source. The remote cavity and the main cavity can have similar optical properties (e.g., similar numerical apertures (NA's)), allowing them to introduce offsetting, and therefore compensating, non-zero optical path differences (OPD's) between the measurement and reference beams without degrading interference fringe contrast due to source spatial coherence. In other words, for each non-zero OPD in the main cavity there exists a configuration of the remote cavity such that the total OPD between test and reference chief rays, and between test and reference marginal rays is substantially zero.

    摘要翻译: 在某些方面,本发明的特征在于使用耦合空腔(例如,至少一个远程腔和主腔)和扩展光源的干涉测量系统。 远程腔体和主腔体可以具有相似的光学特性(例如,类似的数值孔径(NA)),允许它们在测量和参考光束之间引入补偿,从而补偿非零光程差(OPD)而不降解 干涉条纹对比由于源空间相干性。 换句话说,对于主腔中的每个非零OPD,存在远程腔的配置,使得测试和参考主射线之间以及测试和参考边缘射线之间的总OPD基本为零。