摘要:
A semiconductor device includes a plurality of high-voltage insulated-gate field-effect transistors arranged in a matrix form on the main surface of a semiconductor substrate and each having a gate electrode, a gate electrode contact formed on the gate electrode, and a wiring layer which is formed on the gate electrode contacts adjacent in a gate-width direction to electrically connect the gate electrodes arranged in the gate-width direction. And the device includes shielding gates provided on portions of an element isolation region which lie between the transistors adjacent in the gate-width direction and gate-length direction and used to apply reference potential or potential of a polarity different from that of potential applied to the gate of the transistor to turn on the current path of the transistor to the element isolation region.
摘要:
A semiconductor memory device according to an embodiment comprises: a plurality of memory cells; a word line; a plurality of first bit lines and a plurality of second bit lines; and a control circuit. The control circuit is capable of executing: a determining operation that determines whether the memory cell which is to be a write-target includes an erase-target cell whose threshold voltage is to be the erase state, or not; and an inverting operation that inverts selection or unselection of the bit line connected to one of the two memory cells adjacent to the erase-target cell, in the first write operation and the second write operation.
摘要:
A semiconductor device including semiconductor substrate having an active region and an element isolation region, the active region isolated by the element isolation region, the element isolation region provided with an element isolation trench; a memory-cell transistor formed above the semiconductor substrate and having a gate electrode formed above the active region via a first insulating film, the gate electrode formed of a stack including a floating gate electrode, a first interelectrode insulating film, and a control gate electrode; an element isolation insulating film filled in the element isolation trench; and a second interelectrode insulating film disposed above the element isolation insulating film so as to form a stack of the second interelectrode insulating film and the control electrode above the element isolation insulating and a dielectric constant of the second interelectrode insulating film being higher than a dielectric constant of the first interelectrode insulating film.
摘要:
Disclosure is semiconductor device of a selective gate region, comprising a semiconductor layer, a first insulating film formed on the semiconductor layer, a first electrode layer formed on the first insulating layer, an element isolating region comprising an element isolating insulating film formed to extend through the first electrode layer and the first insulating film to reach an inner region of the semiconductor layer, the element isolating region isolating a element region and being self-aligned with the first electrode layer, a second insulating film formed on the first electrode layer and the element isolating region, an open portion exposing a surface of the first electrode layer being formed in the second insulating film, and a second electrode layer formed on the second insulating film and the exposed surface of the first electrode layer, the second electrode layer being electronically connected to the first electrode layer via the open portion.
摘要:
A semiconductor device includes a plurality of high-voltage insulated-gate field-effect transistors arranged in a matrix form on the main surface of a semiconductor substrate and each having a gate electrode, a gate electrode contact formed on the gate electrode, and a wiring layer which is formed on the gate electrode contacts adjacent in a gate-width direction to electrically connect the gate electrodes arranged in the gate-width direction. And the device includes shielding gates provided on portions of an element isolation region which lie between the transistors adjacent in the gate-width direction and gate-length direction and used to apply reference potential or potential of a polarity different from that of potential applied to the gate of the transistor to turn on the current path of the transistor to the element isolation region.
摘要:
A nonvolatile semiconductor memory includes a cell unit having a select gate transistor and a memory cell connected in series, a select gate line connected to the select gate transistor, and a word line connected to the memory cell. One end of the word line is bent to the select gate line side, and a fringe is connected between a bent point and a distal end of the word line.
摘要:
One embodiment includes a plurality of memory cells and a plurality of conducting layers. The memory cells are three-dimensionally disposed on a semiconductor substrate. The conducting layers are disposed in a laminating direction. Each of the plurality of the conducting layers is connected to each of the plurality of the memory cells. Each conducting layer has a structure where a first conductive film and a second conductive film are laminated in the laminating direction. The conducting layers adjacent to one another in the laminating direction have a laminating order of the first conductive film and the second conductive film different from one another.
摘要:
A nonvolatile semiconductor memory includes a cell unit having a select gate transistor and a memory cell connected in series, a select gate line connected to the select gate transistor, and a word line connected to the memory cell. One end of the word line is bent to the select gate line side, and a fringe is connected between a bent point and a distal end of the word line.
摘要:
A nonvolatile semiconductor memory includes a cell unit having a select gate transistor and a memory cell connected in series, a select gate line connected to the select gate transistor, and a word line connected to the memory cell. One end of the word line is bent to the select gate line side, and a fringe is connected between a bent point and a distal end of the word line.
摘要:
According to one embodiment, the semiconductor body of the first portion includes a first semiconductor part and a second semiconductor part. The first semiconductor part extends in the stacking direction. The second semiconductor part is provided between the first semiconductor part and the first electrode layer, and has an end located closer to the first electrode layer side than the first semiconductor part. The first insulating film of the second portion includes a first insulating part and a second insulating part. The first insulating part extends in the stacking direction. The second insulating part is provided between the first insulating part and the second electrode layer, and has an end located closer to the second electrode layer side than the first insulating part.