METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION

    公开(公告)号:US20220084896A1

    公开(公告)日:2022-03-17

    申请号:US17534973

    申请日:2021-11-24

    Abstract: A microelectronic chip device includes a semiconductor substrate and multiple on-chip strain sensors (OCSSs) constructed on the substrate at various locations of the substrate. The OCSSs may each include multiple piezoresistive devices configured to sense a strain at a location of the various locations and produce a strain signal representing the strain at that location. A strain measurement circuit may also be constructed on the semiconductor substrate and configured to measure strain parameters from the strain signals produced by the OCSSs. The strain parameters represent the strains at the various location. Values of the strain parameters can be used for analysis of mechanical stress on the chip device.

    Methods of operating voltage generation circuits

    公开(公告)号:US10573353B2

    公开(公告)日:2020-02-25

    申请号:US16118691

    申请日:2018-08-31

    Abstract: Methods of operating a voltage generation circuit include applying a clock signal to an input of a voltage driver of a stage of the voltage generation circuit, connecting the output of the voltage driver to a first voltage node configured to receive a first voltage when the clock signal has a particular logic level and a voltage level of an output of the voltage driver is less than a threshold, connecting the output of the voltage driver to a second voltage node configured to receive a second voltage, greater than the first voltage, when the clock signal has the particular logic level and the voltage level of the output of the voltage driver is greater than the threshold, and connecting the output of the voltage driver to a third voltage node configured to receive a third voltage, less than the first voltage, when the clock signal has a different logic level.

    METHODS OF OPERATING VOLTAGE GENERATION CIRCUITS

    公开(公告)号:US20190051333A1

    公开(公告)日:2019-02-14

    申请号:US16118691

    申请日:2018-08-31

    Abstract: Methods of operating a voltage generation circuit include applying a clock signal to an input of a voltage driver of a stage of the voltage generation circuit, connecting the output of the voltage driver to a first voltage node configured to receive a first voltage when the clock signal has a particular logic level and a voltage level of an output of the voltage driver is less than a threshold, connecting the output of the voltage driver to a second voltage node configured to receive a second voltage, greater than the first voltage, when the clock signal has the particular logic level and the voltage level of the output of the voltage driver is greater than the threshold, and connecting the output of the voltage driver to a third voltage node configured to receive a third voltage, less than the first voltage, when the clock signal has a different logic level.

    Voltage generation circuits
    7.
    发明授权

    公开(公告)号:US11715502B2

    公开(公告)日:2023-08-01

    申请号:US16774182

    申请日:2020-01-28

    Abstract: Charge pumps of integrated circuit devices might include an input configured to receive an internally-generated first voltage level, an output, and a plurality of stages between its input and output. A particular stage might include a voltage isolation device, a voltage driver, and a capacitance having a first electrode connected to an output of the voltage driver and a second electrode connected to the voltage isolation device. The voltage driver might be responsive to a clock signal and to a voltage level of the output of the voltage driver to selectively connect the output of the voltage driver to either a first voltage node configured to receive the first voltage level, a second voltage node configured to receive a second voltage level lower than the first voltage level, or a third voltage node configured to receive a third voltage level lower than the second voltage level.

    APPARATUS AND METHODS FOR DETERMINING READ VOLTAGES FOR A READ OPERATION

    公开(公告)号:US20200152278A1

    公开(公告)日:2020-05-14

    申请号:US16745514

    申请日:2020-01-17

    Abstract: Methods of operating a memory, as well as memory configured to perform such method, include applying an intermediate read voltage to a selected access line for a read operation, adding noise to a sensing operation while applying the intermediate read voltage, determining a value indicative of a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line, and determining a plurality of read voltages for the read operation in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line.

Patent Agency Ranking