MOVING INTERLEAVED SPUTTER CHAMBER SHIELDS
    8.
    发明申请
    MOVING INTERLEAVED SPUTTER CHAMBER SHIELDS 审中-公开
    移动交互式飞溅室

    公开(公告)号:US20080264340A1

    公开(公告)日:2008-10-30

    申请号:US12169238

    申请日:2008-07-08

    IPC分类号: C23C16/00

    摘要: A shielding system for a physical vapor deposition chamber having a sputter target above the pedestal. The shielding system comprises a pedestal shield attachable to the pedestal and movable therewith. The pedestal shield surrounds and extends outward from the pedestal toward the chamber side or lower walls. The system also comprises a sidewall shield adapted to extend substantially around and within the chamber sidewalls, and downward from an upper portion thereof. The sidewall shield has a lower end extending inward and disposed adjacent the pedestal shield upper portion when the pedestal is in the raised position. The pedestal shield and sidewall shield cooperate, when the pedestal is in the raised position, to prevent line-of-sight deposition transmission from the sputter target to the side and lower walls of the deposition chamber.

    摘要翻译: 一种用于物理气相沉积室的屏蔽系统,其具有在基座上方的溅射靶。 屏蔽系统包括可附接到基座并与其移动的基座屏蔽。 基座护罩围绕并从基座朝向室侧或下壁向外延伸。 该系统还包括侧壁屏蔽件,其适于在腔室侧壁内部和内部延伸,并且从其上部向下延伸。 侧壁屏蔽件具有向内延伸的下端,并且当基座处于升高位置时邻近基座屏蔽件上部设置。 当基座处于升高位置时,基座屏蔽和侧壁屏蔽配合以防止从溅射靶到沉积室的侧壁和下壁的视线沉积传输。

    Method for active wafer centering using a single sensor
    9.
    发明授权
    Method for active wafer centering using a single sensor 有权
    使用单个传感器的活动晶圆定心方法

    公开(公告)号:US06760976B1

    公开(公告)日:2004-07-13

    申请号:US10342550

    申请日:2003-01-15

    IPC分类号: G01D2100

    CPC分类号: H01L21/67265 Y10S414/136

    摘要: A method for a robotic semiconductor wafer processing system to correct for wafers that have become offset or off-center during wafer processing. This is accomplished by determining the amount of offset and re-centering the wafer during wafer transport to the next process station using a single station sensor to locate the wafer center point. Each single sensor located at each station activates when the wafer's edge traverses through the sensor's path. Directional coordinates for the measured designated points on the wafer's edge are calculated, and the intersection points of two circles, analytically derived from using the measured designated points as their centers, are determined. The intersection point closest to the true wafer center position represents the measured wafer's center point. This point is compared to the true wafer center position, and the wafer is then adjusted for this difference.

    摘要翻译: 一种用于在晶片处理期间校正已经变得偏移或偏心的晶片的机器人半导体晶片处理系统的方法。 这是通过使用单个站传感器来确定晶片传送到下一个处理站的晶片的偏移量并使其重新对中来实现的,以定位晶片中心点。 当晶片的边缘穿过传感器的路径时,位于每个站处的每个单个传感器激活。 计算晶圆边缘上测量的指定点的定向坐标,并且确定从使用测量的指定点作为其中心分析导出的两个圆的交点。 最接近真晶片中心位置的交点表示测得的晶片的中心点。 将该点与真实的晶片中心位置进行比较,然后调整晶片以实现该差异。

    Socket for land grid array package
    10.
    发明授权
    Socket for land grid array package 有权
    Socket for Land Grid阵列封装

    公开(公告)号:US07497696B2

    公开(公告)日:2009-03-03

    申请号:US11729581

    申请日:2007-03-29

    IPC分类号: H01R12/00

    摘要: A land grid array socket and a microelectronic assembly including the socket. The socket comprises: a housing; an array of through-contacts on the housing; a solder ball standoff element on a PCB side of the housing; and a seating plane standoff element on a package side of the housing, the seating plane standoff element being aligned with the solder ball standoff element to form a loading force support element therewith.

    摘要翻译: 一种地面栅格阵列插座和一个包括插座的微电子组件。 插座包括:壳体; 壳体上的一组通孔; 在壳体的PCB侧上的焊球支架元件; 以及在所述壳体的封装侧上的就座平面间隔元件,所述就座平面支座元件与所述焊球支座元件对齐以与其形成加载力支撑元件。