Abstract:
A reduced-area interconnect allows client to client communication using an XBAR architecture. An XBAR compiler generates chip designs with XBAR data paths structured to reduce area and energy consumption. Tri-state buffers inserted into XBAR data paths are configured to direct data between clients and sources on a number of data paths corresponding to the lesser of the number of clients and the number of sources. Interface area and power consumption is reduced by eliminating paths that are not always being used.
Abstract:
A data latch includes a first stage configured to receive an input in a first voltage domain, and a second stage. The second stage includes a level shifter configured to shift the input from the first voltage domain to a second voltage domain, and an output circuit having a pull down circuit and pull up circuit arranged to generate an output in the second voltage domain, wherein the pull down circuit is responsive to the input in the first voltage domain and the pull up circuit is responsive to the input in the second voltage domain.
Abstract:
Disclosed are various apparatuses and methods for a memory with a multiple word line design. A memory timing circuit may include a dummy word line including a first portion and a second portion and further including capacitative loading that is lumped in the second portion of the dummy word line, a first transistor connected to the first portion of the dummy word line and configured to charge the dummy word line, and a second transistor connected to the second portion of the dummy word line and configured to discharge the dummy word line. A method may include charging a dummy word line using a first transistor, and discharging the dummy word line using a second transistor, wherein the dummy word line includes a first portion and a second portion and further includes capacitative loading that is lumped in the second portion of the dummy word line.
Abstract:
A memory is disclosed. The memory includes a memory array having a plurality of memory cells. The memory also includes an address decoder configured to assert a wordline to enable the memory cells. Additionally, the memory includes a tracking circuit configured to vary a duration of asserting the wordline as a function of which one of the memory cells is accessed. A method is also disclosed. The method includes asserting a wordline to enable the memory cells and varying a duration of asserting the wordline as a function of which one of a plurality of memory cells is accessed.
Abstract:
An integrated circuit includes one or more bit cells, a word line coupled to the one or more bit cells, and a dummy word line arranged with the word line to have a capacitance therebetween. The capacitance provides a voltage boost or reduction of the word line to assist read and write operations.
Abstract:
Disclosed are various apparatuses and methods for memory access time tracking in dual-rail systems. An apparatus may include a memory coupled to a first voltage rail and having a data output, a data circuit coupled to a second voltage rail and configured to receive the data output from the memory, and a timing circuit configured to adjust an access time of the memory based on a second voltage rail level. A method may include determining a voltage rail level of a data circuit, adjusting the access time of the memory based on the voltage rail level of the data circuit, outputting data from the memory, and receiving the output data by the data circuit.
Abstract:
In an example, a method of memory repair may include receiving, by a memory repair unit, a plurality of memory identifiers. The method may include determining, by the memory repair unit, that a first memory identifier of the plurality of memory identifiers corresponds to a first memory of a plurality of memories. The method may include determining, by the memory repair unit, that a second memory identifier corresponds to a second memory of the plurality of memories. The method may include outputting, by the memory repair unit, in parallel: a first value to a repair enable input of the first memory, and a second value to a repair enable input of the second memory.
Abstract:
A memory includes a memory cell, one bitline coupled to the memory cell, a sense amplifier coupled to the one bitline, a timing circuit configured to enable the sense amplifier during a read operation, a control circuit configured to enable the sense amplifier independent of the timing circuit, and a pull-up circuit configured to pull up the one bitline while the sense amplifier is enabled by the control circuit. The method includes enabling a sense amplifier in a read operation by a timing circuit. The sense amplifier is coupled to at least one bitline, and the at least one bitline is coupled to a memory cell. The method further includes enabling the sense amplifier independent of the timing circuit in a second operation and pulling up the at least one bitline by a pull-up circuit while the sense amplifier is enabled in the second operation.
Abstract:
A memory and a method for operating the memory provided. In one aspect, the memory may be a PDP memory. The memory includes a control circuit configured to generate a first clock and a second clock in response an edge of a clock for an access cycle. A first input circuit is configured to receive an input for a first memory access based on the first clock. The first input circuit includes a latch. The second input circuit configured to receive an input for a second memory access based on the second clock. The second input circuit includes a flip-flop.
Abstract:
A memory and a method for operating the memory having a precharge circuit with inputs of multiple voltage domains are provided. In one aspect, a memory includes a bitline and one or more storage elements coupled to the bitline. The one or more storage elements are configured to operate in a first voltage domain using a first supply voltage. A pull-up circuit is configured to pull up the bitline to a second supply voltage in a second voltage domain. The pull-up circuit is responsive to a first control signal in the first voltage domain and a second control signal in the second voltage domain. The first supply voltage is different than the second supply voltage.