Device and process for continuously cleaning surface of molybdenum wire at high temperature
    1.
    发明授权
    Device and process for continuously cleaning surface of molybdenum wire at high temperature 有权
    在高温下连续清洗钼丝表面的装置和工艺

    公开(公告)号:US09328425B2

    公开(公告)日:2016-05-03

    申请号:US13521347

    申请日:2011-08-10

    IPC分类号: C23G5/00 C22F1/18 C22C27/04

    CPC分类号: C23G5/00 C22C27/04 C22F1/18

    摘要: A device for cleaning the surface of a molybdenum wire at high temperature, comprises a wire pay-off mechanism, a first wire guiding wheel, a cleaning mechanism, a second wire guiding wheel, and a wire take-up mechanism; wherein the two ends of a furnace body of the cleaning mechanism are provided with an inlet hole and an outlet hole for the molybdenum wire. Electrodes connected to a power supply are provided at the inlet hole and in a central part inside the furnace body. An upper part of the furnace body is provided with a gas outlet and a lower part thereof is provided with a wet hydrogen inlet; a heating section is formed between the electrode located at the inlet hole and the electrode located in the central part, and a cooling section is formed between the electrode located in the central part and the outlet hole.

    摘要翻译: 一种用于在高温下清洁钼丝表面的装置,包括线放线机构,第一线引导轮,清洁机构,第二线引导轮和引线机构; 其中清洁机构的炉体的两端设有用于钼丝的入口孔和出口孔。 连接到电源的电极设置在炉体的入口孔和中心部分。 炉体的上部设有气体出口,其下部设有湿氢入口; 在位于入口孔的电极和位于中心部分的电极之间形成加热部分,并且在位于中心部分的电极和出口孔之间形成冷却部分。

    Device and Process for Continuously Cleaning Surface of Molybdenum Wire at High Temperature
    2.
    发明申请
    Device and Process for Continuously Cleaning Surface of Molybdenum Wire at High Temperature 有权
    在高温下连续清洗钼丝表面的装置和工艺

    公开(公告)号:US20120291807A1

    公开(公告)日:2012-11-22

    申请号:US13521347

    申请日:2011-08-10

    IPC分类号: B08B7/04 B08B5/00

    CPC分类号: C23G5/00 C22C27/04 C22F1/18

    摘要: A device for cleaning the surface of a molybdenum wire at high temperature, comprises a wire pay-off mechanism, a first wire guiding wheel, a cleaning mechanism, a second wire guiding wheel, and a wire take-up mechanism; wherein the two ends of a furnace body of the cleaning mechanism are provided with an inlet hole and an outlet hole for the molybdenum wire. Electrodes connected to a power supply are provided at the inlet hole and in a central part inside the furnace body. An upper part of the furnace body is provided with a gas outlet and a lower part thereof is provided with a wet hydrogen inlet; a heating section is formed between the electrode located at the inlet hole and the electrode located in the central part, and a cooling section is formed between the electrode located in the central part and the outlet hole.

    摘要翻译: 一种用于在高温下清洁钼丝表面的装置,包括线放线机构,第一线引导轮,清洁机构,第二线引导轮和引线机构; 其中清洁机构的炉体的两端设有用于钼丝的入口孔和出口孔。 连接到电源的电极设置在炉体的入口孔和中心部分。 炉体的上部设有气体出口,其下部设有湿氢入口; 在位于入口孔的电极和位于中心部分的电极之间形成加热部分,并且在位于中心部分的电极和出口孔之间形成冷却部分。

    Semiconductor package and lead frame therefor
    7.
    发明授权
    Semiconductor package and lead frame therefor 有权
    半导体封装和引线框架

    公开(公告)号:US08643158B2

    公开(公告)日:2014-02-04

    申请号:US13413652

    申请日:2012-03-07

    IPC分类号: H01L23/495 H01L21/56

    摘要: A semiconductor package is assembled using first and second lead frames. The first lead frame includes a die flag and the second lead frame includes lead fingers. When the first and second lead frames are mated, the lead fingers surround the die flag. Side surfaces of the die flag are partially etched to form an extended die attach surface on the die flag, and portions of the top surface of each of the lead fingers also are partially etched to form lead finger surfaces that are complementary with the etched side surfaces of the die flag. A semiconductor die is attached to the extended die attach surface and bond pads of the semiconductor die are electrically connected to the lead fingers. An encapsulating material covers the die, electrical connections, and top surfaces of the die flag and lead fingers.

    摘要翻译: 使用第一和第二引线框组装半导体封装。 第一引线框架包括管芯标记,并且第二引线框架包括引线指。 当第一和第二引线框架配合时,引线指环围绕管芯标记。 模具标记的侧表面被部分蚀刻以在模具标记上形成延伸的芯片附接表面,并且每个引线指的顶表面的部分也被部分地蚀刻以形成与蚀刻的侧表面互补的引线指表面 的旗帜。 半导体管芯附着到延伸管芯附接表面,并且半导体管芯的接合焊盘电连接到引线指。 封装材料覆盖管芯标记和引线指的管芯,电连接和顶表面。

    Semiconductor device with nested rows of contacts
    8.
    发明授权
    Semiconductor device with nested rows of contacts 有权
    具有嵌套行触点的半导体器件

    公开(公告)号:US08080448B1

    公开(公告)日:2011-12-20

    申请号:US13092170

    申请日:2011-04-22

    IPC分类号: H01L21/00

    摘要: A method of making semiconductor devices includes producing an array of first lead frames having rows of first electrical contact elements on respective sides. Sub-assemblies are produced by applying a first molding compound peripherally to provide support between the first electrical contact elements of each of the first lead frames, and singulating the sub-assemblies. An array of assemblies is produced, each of which includes a second lead frame having rows of second electrical contact elements on respective sides, a respective one of the sub-assemblies disposed in the second lead frame with the rows of first electrical contact elements nested adjacent to and inside the rows of second electrical contact elements, and a semiconductor die mounted on the sub-assembly. The assemblies are encapsulated using a second molding compound with the rows of first and second electrical contact elements exposed on adjacent sides of an active face of the respective assembly.

    摘要翻译: 一种制造半导体器件的方法包括制造具有在相应侧面上具有第一电接触元件行的第一引线框阵列。 子组件通过在周边施加第一模塑料以在第一引线框架中的每一个的第一电接触元件之间提供支撑并且分割子组件来制造。 产生一组组件,每个组件包括在相应侧面上具有一列第二电接触元件的第二引线框架,设置在第二引线框架中的相应的一个子组件,第一电接触元件列嵌套在相邻 第二电接触元件的行内和内部,以及安装在子组件上的半导体管芯。 使用第二模制化合物封装组件,其中第一和第二电接触元件排暴露在相应组件的有效面的相邻侧上。