公开(公告)号：US09136260B2

公开(公告)日：2015-09-15

申请号：US14093853

申请日：2013-12-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jung-seok Ahn ,  Dong-hyeon Jang ,  Ho-geon Song ,  Sung-jun Im ,  Chang-seong Jeon ,  Teak-hoon Lee ,  Sang-sick Park

IPC: H01L25/00 ,  H01L23/48 ,  H01L21/56 ,  H01L23/00 ,  H01L25/065 ,  H01L21/768 ,  H01L21/683 ,  H01L25/18

CPC classification number: H01L25/50 ,  H01L21/561 ,  H01L21/6835 ,  H01L21/76898 ,  H01L23/3192 ,  H01L23/481 ,  H01L24/05 ,  H01L24/06 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/17 ,  H01L24/29 ,  H01L24/32 ,  H01L24/73 ,  H01L24/81 ,  H01L24/83 ,  H01L24/92 ,  H01L24/94 ,  H01L24/97 ,  H01L25/0657 ,  H01L25/18 ,  H01L2221/68327 ,  H01L2221/68381 ,  H01L2224/0346 ,  H01L2224/0401 ,  H01L2224/05008 ,  H01L2224/05009 ,  H01L2224/05568 ,  H01L2224/0557 ,  H01L2224/05572 ,  H01L2224/05624 ,  H01L2224/05647 ,  H01L2224/06181 ,  H01L2224/11009 ,  H01L2224/131 ,  H01L2224/13124 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/17181 ,  H01L2224/2929 ,  H01L2224/29387 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/81005 ,  H01L2224/83191 ,  H01L2224/83192 ,  H01L2224/83851 ,  H01L2224/92125 ,  H01L2224/92143 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06544 ,  H01L2225/06568 ,  H01L2924/00014 ,  H01L2924/01327 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/15311 ,  H01L2924/15787 ,  H01L2924/15788 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2224/81 ,  H01L2224/11 ,  H01L2224/03 ,  H01L2924/014 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/05552

Abstract: A method of manufacturing a chip-stacked semiconductor package, the method including preparing a base wafer including a plurality of first chips each having a through-silicon via (TSV); bonding the base wafer including the plurality of first chips to a supporting carrier; preparing a plurality of second chips; forming stacked chips by bonding the plurality of second chips to the plurality of first chips; sealing the stacked chips with a sealing portion; and separating the stacked chips from each other.

Abstract translation: 一种制造芯片堆叠的半导体封装的方法，所述方法包括制备包括多个第一芯片的基片，每个第一芯片均具有穿硅通孔（TSV）; 将包括多个第一芯片的基底晶片接合到支撑载体; 准备多个第二芯片; 通过将所述多个第二芯片接合到所述多个第一芯片来形成堆叠的芯片; 用密封部分密封堆叠的芯片; 并将堆叠的芯片彼此分离。

公开(公告)号：US08901727B2

公开(公告)日：2014-12-02

申请号：US13774209

申请日：2013-02-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Myun-sung Kang ,  Jung-min Ko ,  Sang-sick Park ,  Won-keun Kim ,  Ji-seok Hong

IPC: H01L25/10 ,  H01L23/28 ,  H01L23/498 ,  H01L25/065 ,  H01L23/00 ,  H01L21/56

CPC classification number: H01L23/28 ,  H01L21/486 ,  H01L21/563 ,  H01L23/147 ,  H01L23/49811 ,  H01L23/49827 ,  H01L24/97 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2224/03009 ,  H01L2224/0401 ,  H01L2224/0557 ,  H01L2224/06181 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/81005 ,  H01L2224/92125 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/06513 ,  H01L2225/06541 ,  H01L2225/06568 ,  H01L2225/06582 ,  H01L2225/1017 ,  H01L2225/1041 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/1461 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2224/11 ,  H01L2224/81 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/05552

Abstract: A semiconductor package comprises a first semiconductor chip, a second semiconductor chip on the first semiconductor chip, a third semiconductor chip on the second semiconductor chip and a fourth semiconductor chip on the third semiconductor chip. A first underfill layer is positioned between the second semiconductor chip and the first semiconductor chip; a second underfill layer is positioned between the third semiconductor chip and the second semiconductor chip, and a third underfill layer is positioned between the fourth semiconductor chip and the third semiconductor chip. In some embodiments, the second underfill layer comprises a material that is different than the first and third underfill layers.

Abstract translation: 半导体封装包括第一半导体芯片，第一半导体芯片上的第二半导体芯片，第二半导体芯片上的第三半导体芯片和第三半导体芯片上的第四半导体芯片。 第一底部填充层位于第二半导体芯片和第一半导体芯片之间; 第二底部填充层位于第三半导体芯片和第二半导体芯片之间，第三底层填充层位于第四半导体芯片和第三半导体芯片之间。 在一些实施例中，第二底部填充层包括不同于第一和第三底部填充层的材料。