公开(公告)号：US20060284083A1

公开(公告)日：2006-12-21

申请号：US10569373

申请日：2004-08-27

申请人： Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Yasushi Minomoto ,  Shigeru Miwa ,  Ken Murayama ,  Yukio Kenbou ,  Yuuichi Yuuichi ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto

发明人： Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Yasushi Minomoto ,  Shigeru Miwa ,  Ken Murayama ,  Yukio Kenbou ,  Yuuichi Yuuichi ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto

IPC分类号： G21K7/00

CPC分类号： G01Q10/06 ,  G01Q30/06 ,  Y10T29/49828

摘要： The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

摘要翻译： 扫描探针显微镜的探针头移动控制方法用于具有面向样品12的探针尖端20的悬臂21的扫描探针显微镜。 当探针尖端扫描样品的表面时，测量探针尖端和样品之间发生的原子力。 X，Y和Z精细运动机构23,29和30用于相对改变探针尖端和样品的位置。 通过简单的控制，可以在测量样品表面上具有不均匀形状的测量梯度的部分时，保持高测量精度并且能够使探针尖端在样品表面上进行扫描运动。

公开(公告)号：US07350404B2

公开(公告)日：2008-04-01

申请号：US10569373

申请日：2004-08-27

申请人： Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Yasushi Minomoto ,  Shigeru Miwa ,  Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto

发明人： Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Yasushi Minomoto ,  Shigeru Miwa ,  Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto

IPC分类号： G21K7/00 ,  G01B5/18

CPC分类号： G01Q10/06 ,  G01Q30/06 ,  Y10T29/49828

摘要： The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

摘要翻译： 扫描探针显微镜的探针头移动控制方法用于具有面向样品12的探针尖端20的悬臂21的扫描探针显微镜。 当探针尖端扫描样品的表面时，测量探针尖端和样品之间发生的原子力。 X，Y和Z精细运动机构23,29和30用于相对改变探针尖端和样品的位置。 通过简单的控制，可以在测量样品表面上具有不均匀形状的测量梯度的部分时，保持高测量精度并且能够使探针尖端在样品表面上进行扫描运动。

公开(公告)号：US20050012936A1

公开(公告)日：2005-01-20

申请号：US10893364

申请日：2004-07-19

申请人： Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa

发明人： Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa

IPC分类号： G01B21/30 ,  G01B11/24 ,  G01B11/30 ,  G01Q10/04 ,  G01Q20/02 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q30/20 ,  G01Q60/24 ,  H01L21/66

CPC分类号： G01Q20/02 ,  G01Q30/06 ,  G01Q70/04

摘要： A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

摘要翻译： 扫描探针显微镜具有悬臂，探针面向样品和测量部分，用于测量探头和样品之间发生的物理量，当探针扫描样品的表面时，保持物理量常数以测量样品的表面 样品。 上述显微镜还具有探针倾斜机构，光学显微镜等，用于在探头倾斜时检测探头的位置;以及控制部，用于将探针设置在第一倾斜姿势和第二倾斜姿势中， 通过测量部分在每个倾斜姿势下的样本，至少通过光学显微镜等检测第二倾斜姿势的探测器的位置，并且使第二倾斜姿势的测量位置与第一倾斜处的测量位置匹配 测量姿势。

公开(公告)号：US07333191B2

公开(公告)日：2008-02-19

申请号：US10893364

申请日：2004-07-19

申请人： Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa

发明人： Ken Murayama ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa

IPC分类号： G01B1/00

CPC分类号： G01Q20/02 ,  G01Q30/06 ,  G01Q70/04

摘要： A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

摘要翻译： 扫描探针显微镜具有悬臂，探针面向样品和测量部分，用于测量探头和样品之间发生的物理量，当探针扫描样品的表面时，保持物理量常数以测量样品的表面 样品。 上述显微镜还具有探针倾斜机构，光学显微镜等，用于在探头倾斜时检测探头的位置;以及控制部，用于将探针设置在第一倾斜姿势和第二倾斜姿势中， 通过测量部分在每个倾斜姿势下的样本，至少通过光学显微镜等检测第二倾斜姿势的探测器的位置，并且使第二倾斜姿势的测量位置与第一倾斜处的测量位置匹配 测量姿势。

公开(公告)号：US07388199B2

公开(公告)日：2008-06-17

申请号：US10570198

申请日：2004-09-03

申请人： Takafumi Morimoto ,  Tooru Shinaki ,  Yoshiyuki Nag'No ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Ken Murayama ,  Mitsuo Hayashibara ,  Kishio Hidaka ,  Tadashi Fujieda

发明人： Takafumi Morimoto ,  Tooru Shinaki ,  Yoshiyuki Nag'No ,  Yukio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Ken Murayama ,  Mitsuo Hayashibara ,  Kishio Hidaka ,  Tadashi Fujieda

IPC分类号： G21K7/00

CPC分类号： G01Q70/12

摘要： A probe is made by attaching a carbon nanotube 12 to a mounting base end 13, which eliminates the effects of a carbon contamination film, to increase the bonding strength, increase the conductivity of the probe, and strengthen the bonding performance thereof by coating the entire circumference of the nanotube and the base with a coating film, rather than coating just one side. The work of mounting the carbon nanotube and mounting base end are performed under observation by a microscope. Further, the carbon contamination film 14 formed by an electron microscope is stripped off at a stage before bonding by the coating film.

摘要翻译： 通过将碳纳米管12附着到安装基端13上，从而消除碳污染膜的影响，提高接合强度，提高探针的导电性，并通过涂覆全部 纳米管的周长和基底与涂膜，而不是仅涂覆一面。 在显微镜观察下进行安装碳纳米管和安装基端的工作。 此外，通过电子显微镜形成的碳污染膜14在通过涂膜粘合之前的阶段被剥离。

公开(公告)号：US20060284084A1

公开(公告)日：2006-12-21

申请号：US10570198

申请日：2004-09-03

申请人： Takafumi Morimoto ,  Tooru Seinaki ,  Yoshiyuki Nag-No ,  Yukio Kenbou ,  Yuuichi Xunitomo ,  Takenori Hiroki ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Ken Murayama ,  Mitsuo Hayashirara ,  Kishio Hidaka ,  Tadashi Fujieda

发明人： Takafumi Morimoto ,  Tooru Seinaki ,  Yoshiyuki Nag-No ,  Yukio Kenbou ,  Yuuichi Xunitomo ,  Takenori Hiroki ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Ken Murayama ,  Mitsuo Hayashirara ,  Kishio Hidaka ,  Tadashi Fujieda

IPC分类号： G21K7/00

CPC分类号： G01Q70/12

摘要： A method of producing a probe by attaching a carbon nanotube etc. to a mounting base end and bonding it there using a carbon film etc., which method of producing a probe eliminates the effects of a carbon contamination film to increase the bonding strength, increases the conductivity of the probe, and strengthens the bonding performance by coating the entire circumference rather than coating one side, the probe, and a scanning probe microscope are provided. The method of producing a probe is a method of producing a probe comprised of a carbon nanotube 12, a mounting base ends 13 holding this carbon nanotube, and a coating film 17 bonding the carbon nanotube to a mounting base, comprising performing the mounting work of the carbon nanotube and mounting base end under observation by a microscope and stripping off the carbon contamination film 14 formed by an electron microscope at a stage before bonding by the coating film.

摘要翻译： 通过使用碳膜等将碳纳米管等附接到安装基端并在其上进行接合来制造探针的方法，制造探针的方法消除了碳污染膜的作用，增加了接合强度，增加了 提供探针的导电性，并且通过涂覆整个周边而不是涂覆一侧，探针和扫描探针显微镜来增强粘合性能。 制造探针的方法是制造由碳纳米管12，保持该碳纳米管的安装基端13和将碳纳米管粘合到安装基底的涂膜17的探针的制造方法，其特征在于， 碳纳米管和安装基端通过显微镜观察，并在通过涂膜粘合之前的阶段剥离由电子显微镜形成的碳污染膜14。

公开(公告)号：US20070180889A1

公开(公告)日：2007-08-09

申请号：US10565509

申请日：2004-03-22

申请人： Ken Murayama ,  Yokio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Takashi Furutani

发明人： Ken Murayama ,  Yokio Kenbou ,  Yuuichi Kunitomo ,  Takenori Hiroki ,  Yoshiyuki Nagano ,  Takafumi Morimoto ,  Tooru Kurenuma ,  Hiroaki Yanagimoto ,  Hiroshi Kuroda ,  Shigeru Miwa ,  Takashi Furutani

IPC分类号： G12B21/00 ,  G01N13/10

CPC分类号： G01Q10/06 ,  G01Q30/06 ,  G01Q70/02

摘要： A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe (20), and a measurement unit for measuring a physical quantity between the probe and sample. The scanning probe microscope is provided with a cantilever mount (22), a cantilever cassette (30), an XY stage (14) and Z stage (15) for moving the cantilever cassette, and an optical microscope (18). In a first step, a cantilever is selected from the cantilever cassette and is mounted on the cantilever mount. In a second step, an optical microscope is moved and the mounted cantilever is set in a prescribed position in the field of view after the cantilever is mounted in the scanning probe microscope. In the second step, a step is provided for moving the optical microscope side or the cantilever side and performing positional adjustment.

摘要翻译： 一种用于测量具有具有探针（20）的悬臂（21）的样品表面的扫描探针显微镜的探针替换方法和用于测量探针和样品之间的物理量的测量单元。 扫描探针显微镜具有用于移动悬臂盒的悬臂安装座（22），悬臂盒（30），XY台（14）和Z台（15）以及光学显微镜（18）。 在第一步中，从悬臂盒中选择悬臂，并安装在悬臂安装座上。 在第二步骤中，移动光学显微镜，并且在将悬臂安装在扫描探针显微镜中之后，将安装的悬臂设置在视野中的规定位置。 在第二步骤中，提供移动光学显微镜侧或悬臂侧并执行位置调整的步骤。

公开(公告)号：US6112593A

公开(公告)日：2000-09-05

申请号：US188372

申请日：1998-11-10

申请人： Shigenori Aoki ,  Tohru Miyata ,  Seigo Kikuchi ,  Shigeru Miwa ,  Hajime Mizunoya ,  Takenori Hiroki

发明人： Shigenori Aoki ,  Tohru Miyata ,  Seigo Kikuchi ,  Shigeru Miwa ,  Hajime Mizunoya ,  Takenori Hiroki

IPC分类号： G01N29/04 ,  G01N29/06 ,  G01N29/22 ,  G01H17/00

CPC分类号： G01N29/22 ,  G01N29/0609

摘要： A non-destructive inspection device has an inspection unit body and a support casing which is used as a set-up type device by combining the inspection unit body and the support casing in ordinary inspection, and is used as a portable type device by separating them for special inspection situations involving narrow places or high places. The support casing can be freely combined to or separated from the inspection unit body. When combining the two components, the non-destructive inspection device can carry out the inspection based on a stable set-up mode in the same way as conventional devices. When separated, the inspection unit body is used as a portable device.

摘要翻译： 非破坏性检查装置具有检查单元主体和支撑壳体，其通过在普通检查中组合检查单元主体和支撑壳体而用作安装型装置，并且通过分离它们用作便携式装置 适用于狭窄场所或场所的特殊情况。 支撑壳体可以自由地组合到检查单元主体或从检查单元主体分离。 当组合两个部件时，非破坏性检查装置可以以与常规装置相同的方式基于稳定的设置模式进行检查。 当分离时，检查单元主体用作便携式设备。

公开(公告)号：US08959918B2

公开(公告)日：2015-02-24

申请号：US13642621

申请日：2011-07-20

申请人： Shinji Nishikawa ,  Takenori Hiroki ,  Kouji Ishikawa ,  Manabu Edamura ,  Hidetoshi Satake ,  Takatoshi Ooki

发明人： Shinji Nishikawa ,  Takenori Hiroki ,  Kouji Ishikawa ,  Manabu Edamura ,  Hidetoshi Satake ,  Takatoshi Ooki

IPC分类号： F02B73/00 ,  E02F9/20 ,  E02F9/12 ,  E02F3/96 ,  E02F9/22 ,  E02F9/26

CPC分类号： E02F9/2004 ,  E02F3/965 ,  E02F9/123 ,  E02F9/205 ,  E02F9/2058 ,  E02F9/2075 ,  E02F9/2095 ,  E02F9/22 ,  E02F9/2296 ,  E02F9/26

摘要： A hybrid construction machine has an electric motor for driving the swing structure, and the electric motor is prevented from becoming incapable of generating torque due to a low energy state or an overcharged state of an electricity storage device. A swing-mode selector switch 77 which is manually operated switches between a hydraulic/electric combined swing mode for driving the swing structure by driving both the electric motor and a hydraulic motor and a hydraulic solo swing mode for driving the swing structure by driving only the hydraulic motor. For a normal operation, the swing mode is initially set in the hydraulic/electric combined swing mode. For a specific operation, the operator switches the swing-mode selector switch from a hydraulic/electric combined swing position to a hydraulic solo swing position.

摘要翻译： 混合式施工机械具有用于驱动摆动结构的电动机，并且防止电动机由于蓄电装置的低能量状态或过充电状态而不能产生转矩。 手动操作的摆动模式选择开关77在通过驱动电动机和液压马达驱动摆动结构的液压/电动组合摆动模式之间切换，以及通过仅驱动旋转结构驱动摆动结构的液压独奏摆动模式 液压马达。 对于正常操作，最初在液压/电动组合摆动模式中设定摆动模式。 对于具体操作，操作者将摆动模式选择器开关从液压/电动组合摆动位置切换到液压独奏摆动位置。

公开(公告)号：US20130311052A1

公开(公告)日：2013-11-21

申请号：US13981659

申请日：2012-03-13

申请人： Manabu Sugiura ,  Toshihiko Watanabe ,  Takenori Hiroki ,  Manabu Edamura ,  Takako Satake ,  Kouji Ishikawa

发明人： Manabu Edamura ,  Kouji Ishikawa ,  Manabu Sugiura ,  Takenori Hiroki ,  Toshihiko Watanabe ,  Hidetoshi Satake

IPC分类号： E02F9/20

CPC分类号： E02F9/2025 ,  B60L1/003 ,  B60L1/20 ,  B60L3/0046 ,  B60L3/0061 ,  B60L3/0069 ,  B60L11/005 ,  B60L11/123 ,  B60L15/2009 ,  B60L2200/40 ,  B60L2210/40 ,  B60L2220/14 ,  B60L2240/36 ,  B60L2240/421 ,  B60L2240/423 ,  B60L2240/425 ,  B60L2240/441 ,  B60L2240/443 ,  B60L2240/545 ,  B60L2240/547 ,  B60L2240/549 ,  B60L2250/10 ,  B60L2250/24 ,  E02F9/123 ,  E02F9/2091 ,  E02F9/2095 ,  E02F9/2228 ,  E02F9/2235 ,  E02F9/2282 ,  E02F9/2285 ,  E02F9/2296 ,  E02F9/267 ,  Y02T10/6217 ,  Y02T10/645 ,  Y02T10/7005 ,  Y02T10/7022 ,  Y02T10/7077 ,  Y02T10/7241 ,  Y02T10/7275

摘要： Disclosed is a hybrid construction machine that includes a control device and an auxiliary control device. The control device switches between a hydraulic/electric complex swing mode in which both the electric motor and the hydraulic motor are driven to drive the swing structure by using the sum of the torque of the electric motor and the torque of the hydraulic motor; and a hydraulic-only swing mode in which only the hydraulic motor is driven to drive the swing structure by using only the torque of the hydraulic motor. The auxiliary control device includes a monitoring controller that is connected to the control device and to the electric motor to monitor the temperature or electrical leakage in the electric motor as a substitute controller for the power control unit or the electrical storage device when the power control unit or the electrical storage device is removed due to a fault.

摘要翻译： 公开了一种混合式施工机械，其包括控制装置和辅助控制装置。 控制装置在通过使用电动机的转矩和液压马达的转矩的总和来驱动电动机和液压马达两者来驱动摆动结构的液压/电动复合摇摆模式之间切换; 仅液压马达被驱动以仅使用液压马达的转矩来驱动摆动结构的仅液压摆动模式。 辅助控制装置包括监视控制器，其连接到控制装置和电动机，以监视作为电力控制单元或蓄电装置的替代控制器的电动机中的温度或漏电，当电力控制单元 或由于故障而将电存储装置移除。