GROUP III NITRIDE-BASED MONOLITHIC MICROWAVE INTEGRATED CIRCUITS HAVING MULTI-LAYER METAL-INSULATOR-METAL CAPACITORS

    公开(公告)号:US20230291367A1

    公开(公告)日:2023-09-14

    申请号:US17688952

    申请日:2022-03-08

    申请人: Wolfspeed, Inc.

    IPC分类号: H03F3/195 H03F1/56 H01L23/66

    摘要: Semiconductor devices are provided that include a Group III nitride-based semiconductor layer structure. A first metal layer is formed on an upper surface of the semiconductor layer structure, a first dielectric layer is formed on an upper surface of the first metal layer, and a second metal layer is formed on an upper surface of the first dielectric layer. The first metal layer, the first dielectric layer and the second metal layer form a first capacitor. A second dielectric layer is formed on an upper surface of the second metal layer, a third dielectric layer is formed on an upper surface of the second dielectric layer, and a third metal layer is formed on upper surfaces of the second and third dielectric layers. The second metal layer, the second dielectric layer and the third metal layer form a second capacitor that is stacked on the first capacitor.

    FIELD EFFECT TRANSISTOR WITH STACKED UNIT SUBCELL STRUCTURE

    公开(公告)号:US20220328634A1

    公开(公告)日:2022-10-13

    申请号:US17848984

    申请日:2022-06-24

    申请人: Wolfspeed, Inc.

    摘要: A transistor device includes a first unit subcell including having a first active region width extending in a first direction, and a second unit subcell having a second active region width extending in the first direction and arranged adjacent the first unit subcell in the first direction. The first unit subcell and the second unit subcell share a common drain contact and have separate gate contacts that are aligned in the first direction. Each unit subcell includes a field plate that is connected to a source contact outside the active region and that does not cross over the gate contact.