Nitride light emitting diode and fabrication method thereof
    1.
    发明授权
    Nitride light emitting diode and fabrication method thereof 有权
    氮化物发光二极管及其制造方法

    公开(公告)号:US09312438B2

    公开(公告)日:2016-04-12

    申请号:US14719269

    申请日:2015-05-21

    Abstract: An epitaxial structure of light emitting diode with a current modulation layer, and more specifically, a high-resistivity material is injected to change the current conduction path, and implementation of the main structure is to grow a high-resistivity material (e.g., InxAlyGa1-x-yN) over the N-type conductive layer or the P-type conductive layer till part of current conduction path is exposed through high-temperature H2 in-situ etching in the reacting furnace and to grow the N-type or the P-type conductive layer for coverage. This design for forming a current modulation layer without second epitaxial growth provides the injected current with a better spreading path in the N-type conductive layer and the P-type conductive layer, which more effectively and uniformly injects the current to the active layer and improves luminous efficiency.

    Abstract translation: 注入具有电流调制层的发光二极管的外延结构,更具体而言,注入高电阻率材料以改变电流传导路径,并且主要结构的实现是生长高电阻率材料(例如,In x Al y Ga 1- x-yN)在N型导电层或P型导电层之间,直到电流传导路径的一部分通过反应炉内的高温H2原位蚀刻暴露,并且生长N型或P-型导电层, 型导电层覆盖。 这种用于形成没有第二外延生长的电流调制层的设计在N型导电层和P型导电层中提供了更好的扩散路径的注入电流,其更有效地均匀地将电流注入到有源层并改善 发光效率。

    Light emitting diode and manufacturing method therefor
    2.
    发明授权
    Light emitting diode and manufacturing method therefor 有权
    发光二极管及其制造方法

    公开(公告)号:US09397253B2

    公开(公告)日:2016-07-19

    申请号:US14369930

    申请日:2013-01-07

    Abstract: Disclosed are a light emitting diode having an n-doped ohm contact buffer layer and a manufacturing method therefor. In the present invention, a highly n-doped ohm contact buffer layer with an electronic concentration up to 1×1018 cm3 is formed on the n side of a light emitting epitaxy layer; when a growth substrate is removed, the n-type ohm contact buffer layer on the surface is exposed, which is a no-nitride polarity-face n-type GaN base material with a lower energy gap; an n-type ohm contact electrode is prepared on the n-type ohm contact buffer layer and follows the Ti/Al ohm contact electrode, which can overcome the problem of the existing vertical gallium nitride-based vertical light emitting diode that the voltage of the thin film GaN base light emitting device is unreliable because the ohm contact electrode on the nitride-face GaN base semiconductor layer is easy to crack due to temperature.

    Abstract translation: 公开了具有n掺杂欧姆接触缓冲层的发光二极管及其制造方法。 在本发明中,在发光外延层的n侧形成电子浓度高达1×1018cm 3的高n掺杂欧姆接触缓冲层; 当去除生长衬底时,暴露表面上的n型欧姆接触缓冲层,其是具有较低能隙的无氮化物极性n型GaN基材料; 在n型欧姆接触缓冲层上制备n型欧姆接触电极,并遵循Ti / Al欧姆接触电极,可以克服现有的垂直氮化镓基垂直发光二极管的问题, 由于氮化物面GaN基半导体层上的欧姆接触电极由于温度容易破裂,所以薄膜GaN基发光器件是不可靠的。

    Light Emitting Diode and Manufacturing Method Therefor
    3.
    发明申请
    Light Emitting Diode and Manufacturing Method Therefor 有权
    发光二极管及其制造方法

    公开(公告)号:US20150048379A1

    公开(公告)日:2015-02-19

    申请号:US14369930

    申请日:2013-01-07

    Abstract: Disclosed are a light emitting diode having an n-doped ohm contact buffer layer and a manufacturing method therefor. In the present invention, a highly n-doped ohm contact buffer layer with an electronic concentration up to 1×1018 cm3 is formed on the n side of a light emitting epitaxy layer; when a growth substrate is removed, the n-type ohm contact buffer layer on the surface is exposed, which is a no-nitride polarity-face n-type GaN base material with a lower energy gap; an n-type ohm contact electrode is prepared on the n-type ohm contact buffer layer and follows the Ti/Al ohm contact electrode, which can overcome the problem of the existing vertical gallium nitride-based vertical light emitting diode that the voltage of the thin film GaN base light emitting device is unreliable because the ohm contact electrode on the nitride-face GaN base semiconductor layer is easy to crack due to temperature.

    Abstract translation: 公开了具有n掺杂欧姆接触缓冲层的发光二极管及其制造方法。 在本发明中,在发光外延层的n侧形成电子浓度高达1×1018cm 3的高n掺杂欧姆接触缓冲层; 当去除生长衬底时,暴露表面上的n型欧姆接触缓冲层,其是具有较低能隙的无氮化物极性n型GaN基材料; 在n型欧姆接触缓冲层上制备n型欧姆接触电极,并遵循Ti / Al欧姆接触电极,可以克服现有的垂直氮化镓基垂直发光二极管的问题, 由于氮化物面GaN基半导体层上的欧姆接触电极由于温度容易破裂,所以薄膜GaN基发光器件是不可靠的。

    LED with current spreading layer and fabrication method

    公开(公告)号:US09705033B2

    公开(公告)日:2017-07-11

    申请号:US14531973

    申请日:2014-11-03

    Abstract: A lighting emitting diode including: an n side layer and a p side layer formed by nitride semiconductors respectively; an active layer comprising a nitride semiconductor is between the n side layer and the p side layer; wherein, the n-side layer is successively laminated by an extrinsically-doped buffer layer and a compound multi-current spreading layer; the compound multi-current spreading layer is successively-laminated by a first current spreading layer, a second current spreading layer and a third current spreading layer; the first current spreading layer and the third current spreading layer are alternatively-laminated layers comprising a u-type nitride semiconductor layer and an n-type nitride semiconductor layer; the second current spreading layer is a distributed insulation layer formed on the n-type nitride semiconductor layer; and the first current spreading layer is adjacent to the extrinsically-doped buffer layer; and the third current spreading layer is adjacent to the active layer.

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