摘要:
An internal logic block is arranged in a chip body, and I/O cells and pads are arranged in a peripheral portion of the chip body. Three I/O cells are arranged for each pad.
摘要:
In a semiconductor device, the topmost wiring layer of the package board is formed from an insulation material in which the elongation at break is 20% or higher and Young's modulus is 1 GPa or less when the temperature is 10 to 30° C. This insulation material contains a reactive elastomer that reacts with epoxy resin or an epoxy resin curing agent; an epoxy resin; an epoxy resin curing agent; and a crosslinked styrene-butadiene rubber having a double bond and a hydroxyl group, a carboxylic group, or another polar group. It is therefore possible to provide a semiconductor device that has a wiring board in which the connection reliability in relation to temperature cycles is high and the adhesiveness between the insulation layer and the electroless copper plating layer is also high.
摘要:
A slat conveyor has a plurality of slat bodies supported between a pair of left and right driving endless turning bodies by concentric horizontal support shafts and has a pair of front and rear guide rollers supported to a guide rail laid on each of upper and lower horizontal path sections. A U-turn guiding mechanism at both ends includes the guide rollers, a slat body posture controlling rotating body, and a drive mechanism for the rotating body. The rotating body has the same turning radius as that of the horizontal support shaft on a U-turn path section, and includes an engaging portion for positioning and turning the guide rollers. The drive mechanism drives the rotating body such that the engaging portion is turned in the same direction and at the same speed as the turning speed of the horizontal support shaft on the U-turn path section.
摘要:
Provided is a fixing jig including: a base configured to be mounted to a load axis of a fatigue testing device and including an accommodating recess portion for accommodating a portion to be held of a test piece; a pressing member disposed so as to be supported in the accommodating recess portion and configured to come into surface contact with an end surface of the test piece; and an insert nut configured to be threadedly engaged with a male screw portion of the portion to be held of the test piece. The fixing jig further includes a fastening flange including a hole portion for loosely inserting the test piece therethrough and a flange portion configured to come into contact with the insert nut, for holding the test piece in the accommodating recess portion via the insert nut so that the end surface of the test piece is pressed against the pressing member supported by the base.
摘要:
A control circuit (20) of a mass flow control device (1) retains the relation (Cd=f(ReTH)) between the Reynolds number and the actual discharge coefficient of a sonic nozzle (13) in the area where the Reynolds number is small. In such an area, the sonic nozzle can be used as a variable mass flow element for controlling mass flow rate. If a pressure Pu and a temperature Tu of an upstream fluid of the sonic nozzle 13 are detected, the theoretical mass flow rate QmTH and the theoretical Reynolds number ReTH can be calculated; since the actual discharge coefficient Cd can be calculated by the above relationship Cd=f(ReTH) based on the calculated Reynolds number, the actual mass flow rate Qm can be calculated based on the relation of Qm=Cd.multidot.QmTH. In the control circuit 20, in order to obtain the predetermined mass flow rate Qm, the upstream fluid pressure Pu and temperature Tu of the sonic nozzle are obtained based on the above relationship, and a variable valve (12) is driven so that the mass flow rate may have this value. Since the properties of the sonic nozzle can be made full use of, it is possible to control trace amounts of mass flow rate with extremely high accuracy.
摘要:
In a semiconductor device (1), a package board (2) is provided in which a plurality of wiring layers are layered, a plurality of mounting pads (5) arranged in a matrix are provided to the uppermost wiring layer of the package board (2), and solder bumps (7) are connected to the mounting pads (5). A semiconductor chip (9) is mounted on the package board (2) via the solder bumps (7). The uppermost wiring layer of the package board (2) is formed from a resin material in which the Young's modulus is 1 GPa or lower when the temperature is 10 to 30° C., and the elongation at break is 50% or higher.
摘要:
In a semiconductor device, the topmost wiring layer of the package board is formed from an insulation material in which the elongation at break is 20% or higher and Young's modulus is 1 GPa or less when the temperature is 10 to 30° C. This insulation material contains a reactive elastomer that reacts with epoxy resin or an epoxy resin curing agent; an epoxy resin; an epoxy resin curing agent; and a crosslinked styrene-butadiene rubber having a double bond and a hydroxyl group, a carboxylic group, or another polar group. It is therefore possible to provide a semiconductor device that has a wiring board in which the connection reliability in relation to temperature cycles is high and the adhesiveness between the insulation layer and the electroless copper plating layer is also high.
摘要:
In a semiconductor device (1), a package board (2) is provided in which a plurality of wiring layers are layered, a plurality of mounting pads (5) arranged in a matrix are provided to the uppermost wiring layer of the package board (2), and solder bumps (7) are connected to the mounting pads (5). A semiconductor chip (9) is mounted on the package board (2) via the solder bumps (7). The uppermost wiring layer of the package board (2) is formed from a resin material in which the Young's modulus is 1 GPa or lower when the temperature is 10 to 30° C., and the elongation at break is 50% or higher.
摘要:
A slat conveyor has a plurality of slat bodies supported between a pair of left and right driving endless turning bodies by concentric horizontal support shafts and has a pair of front and rear guide rollers supported to a guide rail laid on each of upper and lower horizontal path sections. A U-turn guiding mechanism at both ends includes the guide rollers, a slat body posture controlling rotating body, and a drive mechanism for the rotating body. The rotating body has the same turning radius as that of the horizontal support shaft on a U-turn path section, and includes an engaging portion for positioning and turning the guide rollers. The drive mechanism drives the rotating body such that the engaging portion is turned in the same direction and at the same speed as the turning speed of the horizontal support shaft on the U-turn path section.