Method of forming a packaged semiconductor device
    3.
    发明授权
    Method of forming a packaged semiconductor device 有权
    形成封装半导体器件的方法

    公开(公告)号:US08216918B2

    公开(公告)日:2012-07-10

    申请号:US12842562

    申请日:2010-07-23

    IPC分类号: H01L21/00 H01L21/322

    摘要: A method is used to form a packaged semiconductor device. A semiconductor device, which has an active surface, is placed in an opening of a circuit board. The circuit board has a first major surface and a second major surface having the opening, first vias that extend between the first major surface and the second major surface, first contact pads terminating the vias at the first major surface, and second contact pads terminating the vias at the second major surface. A dielectric layer is applied over the semiconductor device and the second major surface of the circuit board. An interconnect layer is formed over the dielectric layer. The interconnect layer has second vias electrically connected to the second contact pads, third vias that are electrically connected to the active surface of the semiconductor device, an exposed surface, and third contact pads at the exposed surface.

    摘要翻译: 使用一种方法来形成封装的半导体器件。 具有活性表面的半导体器件被放置在电路板的开口中。 电路板具有第一主表面和具有开口的第二主表面,在第一主表面和第二主表面之间延伸的第一通孔,第一接触垫在第一主表面处终止通孔,第二接触垫终止 第二个主要表面的通孔。 电介质层被施加在半导体器件和电路板的第二主表面上。 在电介质层上形成互连层。 互连层具有电连接到第二接触焊盘的第二通孔,电连接到半导体器件的有源表面的第三通孔,暴露表面和暴露表面处的第三接触焊盘。

    METHOD OF FORMING A PACKAGED SEMICONDUCTOR DEVICE
    4.
    发明申请
    METHOD OF FORMING A PACKAGED SEMICONDUCTOR DEVICE 有权
    形成包装半导体器件的方法

    公开(公告)号:US20120021565A1

    公开(公告)日:2012-01-26

    申请号:US12842562

    申请日:2010-07-23

    IPC分类号: H01L21/58

    摘要: A method is used to form a packaged semiconductor device. A semiconductor device, which has an active surface, is placed in an opening of a circuit board. The circuit board has a first major surface and a second major surface having the opening, first vias that extend between the first major surface and the second major surface, first contact pads terminating the vias at the first major surface, and second contact pads terminating the vias at the second major surface. A dielectric layer is applied over the semiconductor device and the second major surface of the circuit board. An interconnect layer is formed over the dielectric layer. The interconnect layer has second vias electrically connected to the second contact pads, third vias that are electrically connected to the active surface of the semiconductor device, an exposed surface, and third contact pads at the exposed surface.

    摘要翻译: 使用一种方法来形成封装的半导体器件。 具有活性表面的半导体器件被放置在电路板的开口中。 电路板具有第一主表面和具有开口的第二主表面,在第一主表面和第二主表面之间延伸的第一通孔,第一接触垫在第一主表面处终止通孔,第二接触垫终止 第二个主要表面的通孔。 电介质层被施加在半导体器件和电路板的第二主表面上。 在电介质层上形成互连层。 互连层具有电连接到第二接触焊盘的第二通孔,电连接到半导体器件的有源表面的第三通孔,暴露表面和暴露表面处的第三接触焊盘。

    METHOD OF PACKAGING AN INTEGRATED CIRCUIT DIE
    9.
    发明申请
    METHOD OF PACKAGING AN INTEGRATED CIRCUIT DIE 有权
    封装集成电路的方法

    公开(公告)号:US20090061564A1

    公开(公告)日:2009-03-05

    申请号:US11846671

    申请日:2007-08-29

    IPC分类号: H01L23/48 H01L21/00

    摘要: A structure (40) for holding an integrated circuit die (38) during packaging includes a support substrate (42), a release film (44) attached to the substrate (42), and a swelling agent (60). A method (34) of packaging the die (38) includes placing the die (38) on the substrate (42) with its active surface (52) and bond pads (54) in contact with the film (44). The agent (60) is applied over an adhesive coating (50) of the film (44). The agent (60) causes the adhesive (50) to swell into contact with the bond pads (54) and/or to form fillets (64) of adhesive (50) about the die (38). The die (38) is encapsulated in a molding material (72) and released from the substrate (42) as a panel (74) of dies (38). Swelling of the adhesive (50) about the bond pads (54) prevents the molding material (72) from bleeding onto the bond pads (54).

    摘要翻译: 用于在封装期间保持集成电路管芯(38)的结构(40)包括支撑基板(42),附着在基板(42)上的脱模膜(44)和膨胀剂(60)。 封装模具(38)的方法(34)包括将模具(38)放置在基板(42)上,其活性表面(52)和与薄膜(44)接触的粘结垫(54)。 将试剂(60)施加在薄膜(44)的粘合剂涂层(50)上。 试剂(60)使得粘合剂(50)与粘合垫(54)膨胀和/或形成围绕模具(38)的粘合剂(50)的圆角(64)。 模具(38)被封装在模制材料(72)中并且作为模具(38)的面板(74)从基板(42)释放。 粘合剂(50)围绕接合焊盘(54)的膨胀防止模制材料(72)渗透到接合焊盘(54)上。

    High dielectric polymer composites and methods of preparation thereof
    10.
    发明授权
    High dielectric polymer composites and methods of preparation thereof 有权
    高介电聚合物复合材料及其制备方法

    公开(公告)号:US06864306B2

    公开(公告)日:2005-03-08

    申请号:US10135744

    申请日:2002-04-30

    摘要: Polymer composites and methods of making the polymer composites are presented. A representative polymer composite includes a polymer resin and a conductive material, wherein the polymer composite is characterized by a dielectric constant greater the 200. A representative method of making the polymer composite can be broadly summarized by the following steps: providing a polymer resin and a conductive material; mixing the polymer resin and the conductive material; and forming the polymer composite, wherein the polymer composite is characterized by a dielectric constant greater than 200.

    摘要翻译: 提出了聚合物复合材料和制备聚合物复合材料的方法。 代表性的聚合物复合材料包括聚合物树脂和导电材料,其中聚合物复合材料的特征在于介电常数大于200.制备聚合物复合材料的代表性方法可以通过以下步骤大致概括:提供聚合物树脂和 导电材料; 混合聚合物树脂和导电材料; 以及形成所述聚合物复合材料,其中所述聚合物复合材料的特征在于介电常数大于200。