Fused buss for plating features on a semiconductor die
    4.
    发明授权
    Fused buss for plating features on a semiconductor die 有权
    熔融母线用于半导体管芯上的电镀特征

    公开(公告)号:US08368172B1

    公开(公告)日:2013-02-05

    申请号:US13189060

    申请日:2011-07-22

    IPC分类号: H01L23/525

    摘要: A semiconductor structure includes a semiconductor substrate; a semiconductor device formed in and over the substrate; a plurality of interconnect layers over the semiconductor device; an interconnect pad over a top surface of the plurality of interconnect layers, wherein the interconnect pad is coupled to the semiconductor device through the plurality of interconnect layers; a contiguous seal ring surrounding the semiconductor device and extending vertically from the substrate to the top surface of the plurality of interconnect layers; and a fuse coupled between the interconnect pad and the seal ring, wherein the fuse is in a non-conductive state.

    摘要翻译: 半导体结构包括半导体衬底; 在衬底中形成的半导体器件; 半导体器件上的多个互连层; 在所述多个互连层的顶表面上的互连焊盘,其中所述互连焊盘通过所述多个互连层耦合到所述半导体器件; 围绕所述半导体器件并从所述衬底垂直延伸到所述多个互连层的顶表面的连续密封环; 以及联接在所述互连焊盘和所述密封环之间的熔丝,其中所述熔丝处于非导电状态。

    Semiconductor device with a protected active die region and method therefor
    7.
    发明授权
    Semiconductor device with a protected active die region and method therefor 有权
    具有受保护的有源管芯区域的半导体器件及其方法

    公开(公告)号:US07579219B2

    公开(公告)日:2009-08-25

    申请号:US11373087

    申请日:2006-03-10

    IPC分类号: H01L21/50 H01L21/48 H01L21/44

    摘要: A semiconductor device includes a semiconductor die having a plurality of contact pad sites, a plurality of contact pads, an encapsulant barrier, and an encapsulant. A plurality of contact pads is in electrical contact with a predetermined corresponding different one of the contact pad sites. An encapsulant barrier is positioned at an outer perimeter of the semiconductor die. The encapsulant barrier has a height that is as high as or greater than a highest of the plurality of contact pads. The encapsulant barrier is in physical contact with a same surface of the semiconductor die as the contact pad sites. An encapsulant surrounds the semiconductor die and one side of the encapsulant barrier. The encapsulant is blocked from making physical contact with any of the plurality of contact pads by the encapsulant barrier when the device is encapsulated while being supported by a temporary base support layer.

    摘要翻译: 半导体器件包括具有多个接触焊点位置的多个半导体管芯,多个接触焊盘,密封剂阻挡层和密封剂。 多个接触垫与预定的对应的不同的一个接触垫部位电接触。 密封剂阻挡物定位在半导体管芯的外周。 密封剂阻挡层具有高于或大于多个接触垫中最高的高度。 密封剂阻挡物与半导体管芯的与接触焊盘位置相同的表面物理接触。 密封剂围绕半导体管芯和密封剂屏障的一侧。 当装置被临时的基底支撑层支撑时,密封剂被封闭物与封闭剂阻挡物中的任何一个接触垫物理接触。