Abstract:
An electrical interconnection element (720, 730) comprises: a conductive interconnection component (730), including a connection region; and a conductive cantilever structure (720) formed by depositing spring material (712) in an opening of a masking layer (710) on a sacrificial substrate (702), wherein the conductive cantilever structure (720) is mounted to the connection region of the interconnection component (730).
Abstract:
According to the invention, a method of mounting one or a plurality of spring contact element(s) (402) to terminal(s) (406) of an electronic component (408) is proposed, comprising the steps of: fabricating one or a plurality of spring contact elements (402) upon a sacrificial substrate (404); subsequently, while the spring contact element(s) (402) is (are) resident on the sacrificial substrate (404), mounting ones of the spring contact element(s) to terminal(s) (406) of an electronic component (408); and after the ones of the spring contact element(s) is (are) mounted to the terminal(s) of the electronic component (408), removing the sacrificial substrate (404).
Abstract:
A probe card (321) is provided for contacting an electronic component with raised contact elements. In particular, the present invention is useful for contacting a semiconductor wafer (310) with resilient contact elements (301), such as springs. A probe card (321) is designed to have terminals to mate with the contact elements on the wafer (310). In a preferred embodiment, the terminals are posts. In a preferred embodiment the terminals include a contact material suitable for repeated contacts. In one particularly preferred embodiment, a space transformer (324) is prepared with contact posts on one side and terminals on the opposing side. An interposer (325) with spring contacts (333, 334) connects a contact (335) on the opposing side of the space transformer (324) to a corresponding terminal (332) on a probe card (321), which terminal (332) is in turn connected to a terminal (331) which is connectable to a test device such as a conventional tester.
Abstract:
The invention relates to a method of fabricating an interconnection element, comprising fabricating an interconnection component (730), including a connection region; fabricating a cantilever beam structure (720) on a sacrificial substrate; mounting the cantilever beam structure (720) to the connection region of the interconnection component (736); and releasing the mounted cantilever beam structure from the sacrificial substrate by removing at least a portion of the sacrificial substrate, whereby a cantilever beam arrangement (720, 730) is formed.
Abstract:
The invention relates to a method of fabricating an interconnection element, comprising fabricating an interconnection component (730), including a connection region; fabricating a cantilever beam structure (720) on a sacrificial substrate; mounting the cantilever beam structure (720) to the connection region of the interconnection component (736); and releasing the mounted cantilever beam structure from the sacrificial substrate by removing at least a portion of the sacrificial substrate, whereby a cantilever beam arrangement (720, 730) is formed.
Abstract:
A microelectronic spring contact element comprising: an electrically conductive resilient beam (900) comprising a contact end portion (904) protruding from the beam in a first direction and a base end portion (902) protruding from the beam in a second direction; an insulating layer (920) enveloping at least a portion of the beam (900); and a conductive layer (922) enveloping at least a portion of the insulating layer (920), the conductive layer electrically connected to a predetermined voltage level, wherein the predetermined voltage level controls an impedance of the microelectronic spring contact element.
Abstract:
A method of making a temporary connection between a first electronic component and a second electronic component, and subsequently making a permanent connection between the first electronic component and a third electronic component, comprising permanently mounting a plurality of resilient contact structures to a surface of the first electronic component; urging the first electronic component against the second electronic component to effect a temporary connection between the first electronic component and the second electronic component; removing the second electronic component; and mounting the first electronic component to the third electronic component.
Abstract:
A probe card (321) is provided for contacting an electronic component with raised contact elements. In particular, the present invention is useful for contacting a semiconductor wafer (310) with resilient contact elements (301), such as springs. A probe card (321) is designed to have terminals to mate with the contact elements on the wafer (310). In a preferred embodiment, the terminals are posts. In a preferred embodiment the terminals include a contact material suitable for repeated contacts. In one particularly preferred embodiment, a space transformer (324) is prepared with contact posts on one side and terminals on the opposing side. An interposer (325) with spring contacts (333, 334) connects a contact (335) on the opposing side of the space transformer (324) to a corresponding terminal (332) on a probe card (321), which terminal (332) is in turn connected to a terminal (331) which is connectable to a test device such as a conventional tester.