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1.INTERLAYER INSULATION FILM AND WIRING STRUCTURE, AND THEIR MANUFACTURING METHOD 审中-公开
标题翻译: 薄膜用于生产层和布线结构和工艺之间的隔离公开(公告)号:EP2184771A4
公开(公告)日:2010-10-20
申请号:EP08792453
申请日:2008-08-14
发明人: OHMI TADAHIRO , MATSUOKA TAKAAKI , INOKUCHI ATSUTOSHI , WATANUKI KOHEI , KOIKE TADASHI , ADACHI TATSUHIKO
IPC分类号: H01L21/312 , H01L21/768 , H01L23/522
CPC分类号: H01L23/5329 , H01L21/0212 , H01L21/02126 , H01L21/022 , H01L21/02274 , H01L21/02304 , H01L21/02362 , H01L21/3121 , H01L21/316 , H01L21/76807 , H01L21/76819 , H01L21/76829 , H01L21/76832 , H01L21/76835 , H01L21/7684 , H01L21/76897 , H01L23/53238 , H01L23/53295 , H01L2924/0002 , H01L2924/00
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2.SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 审中-公开
标题翻译: 半导体部件及其制造方法的半导体元件,公开(公告)号:EP2096678A4
公开(公告)日:2010-06-30
申请号:EP07850921
申请日:2007-12-19
发明人: OHMI TADAHIRO , SUGITANI KOICHI , KOIKE TADASHI , BAMBA AKINORI , KOBAYASHI AKIHIRO , WATANUKI KOHEI
IPC分类号: H01L29/786 , H01L21/336
CPC分类号: H01L29/4908 , H01L27/1292 , H01L29/78639
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3.GALLIUM NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE 审中-公开
标题翻译: 半导体器件的氮化镓及其制造方法的半导体器件公开(公告)号:EP2669933A4
公开(公告)日:2015-05-13
申请号:EP12739117
申请日:2012-01-23
IPC分类号: H01L21/20 , H01L21/302 , H01L21/306 , H01L29/66 , H01L29/778
CPC分类号: H01L21/30604 , H01L21/02057 , H01L21/0237 , H01L21/02458 , H01L21/02507 , H01L21/02521 , H01L21/0254 , H01L21/02664 , H01L21/302 , H01L21/30621 , H01L29/2003 , H01L29/4236 , H01L29/51 , H01L29/66462 , H01L29/66522 , H01L29/7783 , H01L29/7827
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公开(公告)号:EP2197023A4
公开(公告)日:2013-05-22
申请号:EP08835197
申请日:2008-10-06
发明人: OHMI TADAHIRO , TERAMOTO AKINOBU , SUWA TOMOYUKI , KURODA RIHITO , KUDO HIDEO , HAYAMI YOSHINORI
IPC分类号: H01L21/02 , H01L21/324 , H01L29/04 , H01L29/78
CPC分类号: H01L29/045 , H01L21/02381 , H01L21/02433 , H01L29/78
摘要: On a surface of a semiconductor substrate, a plurality of terraces formed stepwise by an atomic step are formed in the substantially same direction. Using the semiconductor substrate, a MOS transistor is formed so that no step exists in a carrier traveling direction (source-drain direction).
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公开(公告)号:EP2040302A4
公开(公告)日:2011-05-18
申请号:EP07767367
申请日:2007-06-21
发明人: OHMI TADAHIRO , TERAMOTO AKINOBU , CHENG WEITAO
IPC分类号: H01L29/786
CPC分类号: H01L29/78654 , H01L29/78603 , H01L29/78648
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公开(公告)号:EP2284882A4
公开(公告)日:2012-06-27
申请号:EP09758223
申请日:2009-05-22
CPC分类号: H05K1/0218 , H01L23/66 , H01L2223/6616 , H01L2223/6627 , H01L2223/6688 , H01L2924/0002 , H01L2924/19032 , H01L2924/3011 , H05K1/025 , H05K1/0265 , H05K3/4652 , H05K2201/0191 , H05K2201/0352 , H05K2201/0715 , H05K2201/096 , H05K2201/09618 , H05K2201/09727 , H05K2201/09972 , H01L2924/00
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7.COMPOSITE MAGNETIC BODY, ITS MANUFACTURING METHOD, CIRCUIT SUBSTRATE USING THE SAME, AND ELECTRONIC DEVICE USING THE SAME 审中-公开
标题翻译: 复合磁性体,方法制作,电路衬底和电子设备公开(公告)号:EP2117018A4
公开(公告)日:2011-09-14
申请号:EP08703665
申请日:2008-01-22
CPC分类号: H01F41/0246 , H01F1/26 , H01F1/37 , H05K1/0233
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公开(公告)号:EP2059103A4
公开(公告)日:2010-08-04
申请号:EP07806064
申请日:2007-08-24
发明人: OHMI TADAHIRO
IPC分类号: H05K3/46 , H01L21/312 , H01L21/768 , H01L23/12 , H01L23/522
CPC分类号: H01L23/5222 , H01L21/02115 , H01L21/0212 , H01L21/02167 , H01L21/022 , H01L21/02211 , H01L21/02274 , H01L21/02329 , H01L21/0234 , H01L21/3148 , H01L21/31633 , H01L21/3185 , H01L21/76802 , H01L21/7682 , H01L21/76826 , H01L21/76829 , H01L21/76831 , H01L21/76832 , H01L21/76883 , H01L23/3677 , H01L23/5283 , H01L23/53228 , H01L23/53238 , H01L23/5329 , H01L2924/0002 , H05K1/0203 , H05K1/024 , H05K3/467 , H05K3/4688 , H01L2924/00
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9.CONTACT FORMING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE 审中-公开
标题翻译: CONTACT形成方法,半导体制造工艺组件和半导体元件公开(公告)号:EP2293323A4
公开(公告)日:2012-11-28
申请号:EP09746471
申请日:2009-04-17
IPC分类号: H01L21/28 , H01L21/285 , H01L21/336 , H01L29/417 , H01L29/78
CPC分类号: H01L21/28518 , H01L21/26513 , H01L21/28052 , H01L21/324 , H01L21/823814 , H01L21/823864 , H01L29/665 , H01L29/6656 , H01L29/66575
摘要: A semiconductor device manufacturing method includes the steps of ion-implanting a p-type or an n-type impurity into a Si layer portion to become a p-type or an n-type contact region of a semiconductor device, forming a metal film for a contact on a surface of the contact region without performing heat treatment for activating implanted ions after the ion-implanting step, and forming a silicide of a metal of the metal film by causing the metal to react with the Si layer portion by heating. It is desired to simultaneously perform the step of forming the silicide and the step of activating the implanted ions by heat treatment after the metal film is formed.
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公开(公告)号:EP2043159A4
公开(公告)日:2011-05-18
申请号:EP07790721
申请日:2007-07-12
发明人: OHMI TADAHIRO , TERAMOTO AKINOBU , KURODA RIHITO
IPC分类号: H01L29/786 , H01L21/28 , H01L21/8238 , H01L27/08 , H01L27/092 , H01L29/417
CPC分类号: H01L27/1203 , H01L21/28202 , H01L29/518 , H01L29/78654 , H01L29/78696
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