摘要:
PROBLEM TO BE SOLVED: To provide a semiconductor device enabling occurrence of peeling of an electrode to be hardly caused regardless of wire bonding junction performed on the electrode electrically connected with the external part of an element. SOLUTION: An organic substance electrode 2 is formed on a ZnO-based semiconductor 1, a wire bonding electrode 3 is formed on the organic substance electrode 2, and a pedestal constituted of an insulating film 4 is disposed in a region which is situated under the wire bonding electrode 3 and defines a part of a region on the ZnO-based semiconductor 1 to prevent peeling of the wire bonding electrode 3. COPYRIGHT: (C)2010,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To provide a cap which has a projection for resistance welding and is resistance-welded to a stem to become a can package, and in which a fused part is prevented from scattering or spreading into an element mounting space of the can package during the resistance welding at inexpensively. SOLUTION: The cap 4 has the cylindrical body portion B of a cap shell 4b which has a condenser lens 4a and where the condenser lens 4a is fixed, and the flange portion F of the cap shell 4b provided to the end of the body portion B on the opposite side from the condenser lens 4a and welded to the stem. The flange portion F has the annular projection F1 for resistance welding to the stem, and an annular groove F2, recessed to the opposite side to the projection direction of the projection F1, on the inner peripheral side of the projection F1, the projection F1 and annular groove F2 being formed concentrically by pressing. COPYRIGHT: (C)2010,JPO&INPIT
摘要:
The temperature of a bipolar semiconductor element using a wide-gap semiconductor is raised using heating means, such as a heater, to obtain a power semiconductor device being large in controllable current and low in loss. The temperature is set at a temperature higher than the temperature at which the decrement of the steady loss of the wide-gap bipolar semiconductor element corresponding to the decrement of the built-in voltage lowering depending on the temperature rising of the wide-gap bipolar semiconductor element is larger than the increment of the steady loss corresponding to the increment of the ON resistance increasing depending on the temperature rising.
摘要:
PROBLEM TO BE SOLVED: To provide a semiconductor device in which a plurality of control boards differing in area, or the plurality of control boards and a resin case cover can be aligned together at a time, and which has a compact shape. SOLUTION: The semiconductor device 1 has semiconductor elements 30 and 31 mounted on an insulating board 20 and housed in a resin case 40, and a pin 60 is stood at any place in the resin case 40. Further, a printed board 70 is disposed inside or outside the resin case 40. Then the printed boards 70 and a cover 40b of the resin case 40 are positioned with the common pin 60. Consequently, the printed boards 70 and the cover 40b of the resin case 40 can be aligned together at a time. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To provide a power semiconductor device having a large controllable current and low loss. SOLUTION: The semiconductor device comprises a wide-gap bipolar semiconductor device 13 which uses a wide-gap semiconductor and has built-in voltage in the forward characteristics, semiconductor packages 10, 14 which house the wide-gap bipolar semiconductor device 13 and have electric connecting means 7, 8, 9, 11 for connecting the wide-gap bipolar semiconductor device 13 to an external device, and a heating means 15 for heating the wide-gap bipolar semiconductor device 13 within the semiconductor packages 10, 14 to a temperature range of from 50°C to 750°C. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
A light emitting device comprises a light emitting element, a metal package having a recess part for housing the light emitting element and a base part which has one or more through holes, and one or more lead electrode pins which penetrate the through holes and are separated from the through holes by an insulating member respectively. The bottom faces of the lead electrode pins project out from the bottom face of the base part and are positioned on a same plane including an outer bottom face of the recess part. With this configuration, the light emitting device has a good heat radiating characteristic and high mechanical strength.
摘要:
An electronic device such as a semiconductor pressure sensor is provided which has a buffer disposed within a resinous casing. Terminals extend through the casing and connect electrically with an electronic element mounted on the casing through wires. The buffer is made of a material having a coefficient of thermal expansion smaller than that of the body of the casing, thereby decreasing undesirable movement of the terminals leading to fatigue of the wires which arises from a change in temperature of the casing. This minimizes a drop in mechanical strength of the wires caused by thermal cycling to which the casing is subjected.
摘要:
PROBLEM TO BE SOLVED: To provide an element structure which is superior in the reliability of junction between an Au-Sn system solder layer and a joint alloy layer that make it difficult to generate peeling. SOLUTION: A second electrode 16 formed on a second main surface of a compound semiconductor layer 100 of a light-emitting element 1 is provided with a bond alloy layer 31 for reducing the bond resistance with the compound semiconductor layer 100, and a semiconductor layer 34 for connecting the joint metal layer to a conductive support body 52. The solder layer 34 is formed of an Sn system solder layer 34s, arranged at the joint alloy layer 31 side, and constituted of Sn system metal whose fusing point is lower than that of the joint alloy layer 31 with Sn as the main components and an Au-Sn system solder layer 34m, arranged so as to be brought into contact with the Sn system solder layer 34s on the side opposite to the bond alloy layer 31. Au of 30 mass% or higher and 90 mass% or lower and Sn of 10 mass% or higher and 70 mass% or lower are contained, the total content of Au and Sn is 80 mass% or higher, and the fusing point is higher than that of the Sn system solder layer 34s. COPYRIGHT: (C)2006,JPO&NCIPI