Semiconductor device including fuses for relieving defective areas
    91.
    发明授权
    Semiconductor device including fuses for relieving defective areas 失效
    包括用于缓解缺陷区域的熔断器的半导体装置

    公开(公告)号:US06731005B2

    公开(公告)日:2004-05-04

    申请号:US10093786

    申请日:2002-03-06

    IPC分类号: H01L2348

    摘要: A semiconductor device is disclosed, which comprises a semiconductor substrate with which a circuit element is provided, an insulating layer which is provided on the semiconductor substrate and has a concave portion, a first conductive line layer which is provided at the concave portion in the insulating layer and has a first thickness, and a second conductive line layer which is provided at the concave portion in the insulating layer so as to be formed apart in a horizontal direction from the first conductive line layer and has a second thickness which is smaller than the first thickness.

    摘要翻译: 公开了一种半导体器件,其包括设置有电路元件的半导体衬底,设置在半导体衬底上并具有凹部的绝缘层,设置在绝缘层的凹部的第一导电线层 并且具有第一厚度,以及第二导电线层,其设置在所述绝缘层的所述凹部处,以在所述第一导电线层的水平方向上分开形成,并且具有小于所述第二导电层的第二厚度 第一厚度。

    Semiconductor device having external connection terminals formed in two-dimensional area
    93.
    发明授权
    Semiconductor device having external connection terminals formed in two-dimensional area 失效
    具有形成为二维区域的外部连接端子的半导体装置

    公开(公告)号:US06278128B1

    公开(公告)日:2001-08-21

    申请号:US09363033

    申请日:1999-07-29

    IPC分类号: H01L2358

    摘要: A first bonding pad is formed on the surface of a semiconductor chip on which a semiconductor circuit is formed. A first insulating substrate is formed on the semiconductor chip, and a wiring layer is formed on the first insulating substrate. A second insulating substrate is formed on the first insulating substrate and wiring layer. A first region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. The first region and first bonding pad are connected by a wire. A second region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. In the second region, a bump is formed. Further, a third region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. The third region has at least an area necessary for the terminal of a measurement device to contact the third region in operation measurement.

    摘要翻译: 在其上形成有半导体电路的半导体芯片的表面上形成第一焊盘。 在半导体芯片上形成第一绝缘基板,在第一绝缘基板上形成布线层。 在第一绝缘基板和布线层上形成第二绝缘基板。 通过在第二绝缘基板中形成开口以露出布线层的表面的一部分来形成第一区域。 第一区域和第一焊盘通过导线连接。 通过在第二绝缘基板中形成开口以露出布线层的表面的一部分来形成第二区域。 在第二区域中形成凸块。 此外,通过在第二绝缘基板中形成开口以暴露布线层的表面的一部分来形成第三区域。 在操作测量中,第三区域至少具有测量装置的端子与第三区域接触所需的区域。

    Dielectric ceramic composition for microwave
    94.
    发明授权
    Dielectric ceramic composition for microwave 有权
    用于微波的介电陶瓷组合物

    公开(公告)号:US06274526B1

    公开(公告)日:2001-08-14

    申请号:US09716237

    申请日:2000-11-21

    IPC分类号: C04B35468

    CPC分类号: C04B35/4686

    摘要: A dielectric ceramic composition for microwave which comprises a basic composition represented by compositional formula: 2aBaO—bLn2O3—cBi2O3—2dTiO2, wherein Ln2O3 represents (eNd2O3+fSm2O3+gEu2O3); a+b+c+d=l; and e+f+g=1, in which 0.0913

    摘要翻译: 一种用于微波的介电陶瓷组合物,其包含由组成式:2aBaO-bLn2O3-cBi2O3-2dTiO2表示的碱性组合物,其中Ln2O3表示(eNd2O3 + fSm2O3 + gEu2O3); a + b + c + d = 1; 和e + f + g = 1,其中0.0913

    Single chamber for CVD and sputtering film manufacturing
    95.
    发明授权
    Single chamber for CVD and sputtering film manufacturing 失效
    用于CVD和溅射膜制造的单室

    公开(公告)号:US5755938A

    公开(公告)日:1998-05-26

    申请号:US556188

    申请日:1995-11-09

    摘要: An apparatus which allows a first film to be formed on a substrate by chemical vapor deposition (CVD) and a second film to be formed on the substrate by sputtering, wherein the processes are performed sequentially in the same deposition chamber without exposing the substrate to an oxidative atmosphere. The deposition chamber includes a first electrode and a second electrode located under the first electrode. A transfer mechanism loads a dummy target onto the first electrode and the substrate onto the second electrode prior to a CVD process. The dummy target is resistant to sputtering and thus does not contaminate the film deposited on the substrate during CVD. After CVD and prior to sputtering, the transfer mechanism unloads the dummy target and replaces it with a sputtering target for film formation by sputtering. Both the dummy target and sputtering target can be loaded and unloaded from a single pressurized storage chamber. Thus, film formation by both sputtering and CVD can be accomplished by using a single deposition chamber without removing the substrate between processes.

    摘要翻译: 一种允许通过化学气相沉积(CVD)在衬底上形成第一膜和通过溅射形成在衬底上的第二膜的装置,其中在相同的沉积室中顺序地进行处理,而不将衬底暴露于 氧化气氛。 沉积室包括位于第一电极下方的第一电极和第二电极。 转移机构在CVD工艺之前将虚拟靶加载到第二电极上的第一电极和衬底上。 虚拟靶对溅射是耐受的,因此在CVD期间不会污染沉积在衬底上的膜。 在CVD之后并且在溅射之前,转移机构卸载虚拟靶并用用溅射的成膜溅射靶代替它。 虚拟靶和溅射靶都可以从单个加压储存室装载和卸载。 因此,通过溅射和CVD的成膜可以通过使用单个沉积室而不在工艺之间移除基板来实现。

    Focus detection apparatus and image pickup apparatus
    98.
    发明授权
    Focus detection apparatus and image pickup apparatus 有权
    焦点检测装置和图像拾取装置

    公开(公告)号:US08872962B2

    公开(公告)日:2014-10-28

    申请号:US13809982

    申请日:2011-07-29

    申请人: Koichi Fukuda

    发明人: Koichi Fukuda

    摘要: The focus detection apparatus includes an image pickup part (101-107) including first and second pixels photoelectrically converting first and second images formed by light fluxes passing through different pupil area of an image-forming optical system to produce first and second image signals, a first signal processor (121) performing a first process to smooth the first and second image signals by using mutually different filters, a second signal processor (121) performing a second process to sharpen the first and second image signals by using mutually different filters. A calculating part (121) calculates a defocus amount by using the first and second image signals subjected to the first process when a contrast value is higher than a predetermined value, and calculates the defocus amount by using the first and second image signals subjected to the second process when the contrast value is lower than the predetermined value.

    摘要翻译: 焦点检测装置包括图像拾取部分(101-107),其包括光电转换通过图像形成光学系统的不同瞳孔区域的光束形成的第一和第二图像的第一和第二像素,以产生第一和第二图像信号, 第一信号处理器(121)执行通过使用相互不同的滤波器平滑第一和第二图像信号的第一处理器,第二信号处理器(121)执行通过使用相互不同的滤波器来锐化第一和第二图像信号的第二处理。 计算部件(121)当对比度值高于预定值时通过使用经受第一处理的第一和第二图像信号来计算散焦量,并且通过使用经受第一和第二图像信号的第一和第二图像信号来计算散焦量 当对比度值低于预定值时的第二处理。

    Image sensor and image-capturing apparatus with imaging pixel and focusing pixel having light shield layers including openings
    99.
    发明授权
    Image sensor and image-capturing apparatus with imaging pixel and focusing pixel having light shield layers including openings 有权
    图像传感器和具有成像像素的图像捕获设备和具有包括开口的遮光层的聚焦像素

    公开(公告)号:US08872950B2

    公开(公告)日:2014-10-28

    申请号:US13424865

    申请日:2012-03-20

    申请人: Koichi Fukuda

    发明人: Koichi Fukuda

    摘要: The capacitance of a charge-accumulating layer of an imaging pixel is made different from that of a charge-accumulating layer of a focusing pixel, thereby reducing the difference in saturation capacitance due to the difference between the light-reception efficiencies of the imaging pixel and the focusing pixel. The ratio between the capacitance of the charge-accumulating layer of the imaging pixel and that of the charge-accumulating layer of the focusing pixel is determined in consideration of a variation in ratio between the light-reception efficiencies of the imaging pixel and the focusing pixel with a change in at least one of the exit pupil distance and the aperture value.

    摘要翻译: 使得成像像素的电荷累积层的电容与聚焦像素的电荷累积层的电容不同,从而减小由于成像像素的光接收效率和摄像像素之间的差异导致的饱和电容差 聚焦像素。 考虑到成像像素的光接收效率与聚焦像素的比例的变化,确定成像像素的电荷累积层的电容与聚焦像素的电荷累积层的电容之间的比率 出射光瞳距离和光圈值中的至少一个的变化。

    IMAGE PICKUP APPARATUS, CONTROL METHOD THEREOF, AND PROGRAM
    100.
    发明申请
    IMAGE PICKUP APPARATUS, CONTROL METHOD THEREOF, AND PROGRAM 有权
    图像拾取装置,其控制方法和程序

    公开(公告)号:US20140146221A1

    公开(公告)日:2014-05-29

    申请号:US14131229

    申请日:2012-07-24

    IPC分类号: H04N5/232

    摘要: An image pickup apparatus which can perform an AF of a high speed and a high focusing precision by simultaneously realizing a phase difference AF and a contrast AF, decides arrange where a contrast evaluation can be performed on the basis of a correspondence relation between each pixel of an image pickup element which is restricted by pupil division means provided for restricting light of an optical image of an object which enters each pixel of the image pickup element to light from a specific exit pupil area of a photographing lens and the specific exit pupil area of the photographing lens, and decides a focus evaluation value of the object in accordance with the decided range from a contrast focus position or a correlation focus position.

    摘要翻译: 可以通过同时实现相位差AF和对比度AF来执行高速度和高聚焦精度的AF的图像拾取装置,基于每个像素之间的对应关系来确定可以执行对比度评估的位置 由光瞳分割装置限制的图像拾取元件,其被设置用于限制进入图像拾取元件的每个像素的物体的光学图像,以便从拍摄镜头的特定出射瞳孔区域到特定出射瞳孔区域 拍摄镜头,并且根据来自对比度聚焦位置或相关焦点位置的所确定的范围来确定对象的焦点评估值。