摘要:
A semiconductor device is disclosed, which comprises a semiconductor substrate with which a circuit element is provided, an insulating layer which is provided on the semiconductor substrate and has a concave portion, a first conductive line layer which is provided at the concave portion in the insulating layer and has a first thickness, and a second conductive line layer which is provided at the concave portion in the insulating layer so as to be formed apart in a horizontal direction from the first conductive line layer and has a second thickness which is smaller than the first thickness.
摘要:
The invention provides a plasma equipment which is advantageous in that the suscepter impedance is small, the dependence on the frequency is low, the power consumption efficiency is high, the film forming speed is faster as compared with conventional plasma equipment, and the film quality is high. Metal plates AC short between a chamber wall and a shield of an electrode of the same DC potential as the chamber.
摘要:
A first bonding pad is formed on the surface of a semiconductor chip on which a semiconductor circuit is formed. A first insulating substrate is formed on the semiconductor chip, and a wiring layer is formed on the first insulating substrate. A second insulating substrate is formed on the first insulating substrate and wiring layer. A first region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. The first region and first bonding pad are connected by a wire. A second region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. In the second region, a bump is formed. Further, a third region is formed by forming an opening in the second insulating substrate to expose part of the surface of the wiring layer. The third region has at least an area necessary for the terminal of a measurement device to contact the third region in operation measurement.
摘要:
A dielectric ceramic composition for microwave which comprises a basic composition represented by compositional formula: 2aBaO—bLn2O3—cBi2O3—2dTiO2, wherein Ln2O3 represents (eNd2O3+fSm2O3+gEu2O3); a+b+c+d=l; and e+f+g=1, in which 0.0913
摘要翻译:一种用于微波的介电陶瓷组合物,其包含由组成式:2aBaO-bLn2O3-cBi2O3-2dTiO2表示的碱性组合物,其中Ln2O3表示(eNd2O3 + fSm2O3 + gEu2O3); a + b + c + d = 1; 和e + f + g = 1,其中0.0913
摘要:
An apparatus which allows a first film to be formed on a substrate by chemical vapor deposition (CVD) and a second film to be formed on the substrate by sputtering, wherein the processes are performed sequentially in the same deposition chamber without exposing the substrate to an oxidative atmosphere. The deposition chamber includes a first electrode and a second electrode located under the first electrode. A transfer mechanism loads a dummy target onto the first electrode and the substrate onto the second electrode prior to a CVD process. The dummy target is resistant to sputtering and thus does not contaminate the film deposited on the substrate during CVD. After CVD and prior to sputtering, the transfer mechanism unloads the dummy target and replaces it with a sputtering target for film formation by sputtering. Both the dummy target and sputtering target can be loaded and unloaded from a single pressurized storage chamber. Thus, film formation by both sputtering and CVD can be accomplished by using a single deposition chamber without removing the substrate between processes.
摘要:
There is provided a surface potential measuring apparatus cable of accurately measuring the potential of a substrate regardless of the material of the substrate, and a plasma equipment capable of accurately measuring and controlling ion energy. The substrate surface potential measuring apparatus measures the surface potential of a substrate in a plasma processing apparatus and includes a terminal electrically connected to a suscepter electrode for holding the substrate, a first condenser disposed between the terminal and the ground and a potential measuring device for measuring the potential of the terminal. The surface potential of the substrate is found from the potential of the suscepter electrode measured by the potential measuring means.
摘要:
The present invention provides a toner which substantially excludes off set and blocking of the toner particles, and a process for preparing the toner. The toner is prepared by dispersion-polymerizing a vinyl monomer in the presence of a dispersion polymerization stabilizer, a polymerization initiator and silicone-containing organic resin microparticles in a dispersion medium which dissolves said vinyl monomer, dispersion polymerization stabilizer and polymerization initiator and which does not dissolve said silicone-containing organic resin microparticles and resulting toner particles.
摘要:
The focus detection apparatus includes an image pickup part (101-107) including first and second pixels photoelectrically converting first and second images formed by light fluxes passing through different pupil area of an image-forming optical system to produce first and second image signals, a first signal processor (121) performing a first process to smooth the first and second image signals by using mutually different filters, a second signal processor (121) performing a second process to sharpen the first and second image signals by using mutually different filters. A calculating part (121) calculates a defocus amount by using the first and second image signals subjected to the first process when a contrast value is higher than a predetermined value, and calculates the defocus amount by using the first and second image signals subjected to the second process when the contrast value is lower than the predetermined value.
摘要:
The capacitance of a charge-accumulating layer of an imaging pixel is made different from that of a charge-accumulating layer of a focusing pixel, thereby reducing the difference in saturation capacitance due to the difference between the light-reception efficiencies of the imaging pixel and the focusing pixel. The ratio between the capacitance of the charge-accumulating layer of the imaging pixel and that of the charge-accumulating layer of the focusing pixel is determined in consideration of a variation in ratio between the light-reception efficiencies of the imaging pixel and the focusing pixel with a change in at least one of the exit pupil distance and the aperture value.
摘要:
An image pickup apparatus which can perform an AF of a high speed and a high focusing precision by simultaneously realizing a phase difference AF and a contrast AF, decides arrange where a contrast evaluation can be performed on the basis of a correspondence relation between each pixel of an image pickup element which is restricted by pupil division means provided for restricting light of an optical image of an object which enters each pixel of the image pickup element to light from a specific exit pupil area of a photographing lens and the specific exit pupil area of the photographing lens, and decides a focus evaluation value of the object in accordance with the decided range from a contrast focus position or a correlation focus position.