Simplified Protection Layer for Abrasion Resistant Glass Coatings and Methods for Forming the Same
    14.
    发明申请
    Simplified Protection Layer for Abrasion Resistant Glass Coatings and Methods for Forming the Same 有权
    用于耐磨玻璃涂层的简化保护层及其形成方法

    公开(公告)号:US20150158762A1

    公开(公告)日:2015-06-11

    申请号:US14097463

    申请日:2013-12-05

    Abstract: Embodiments provided herein describe abrasion resistant glass coatings and methods for forming abrasion resistant glass coatings. A glass body is provided. An abrasion resistant layer is formed above the glass body. The abrasion resistant layer includes an amorphous carbon. A pull-up layer is formed above the abrasion resistant layer. A protective layer is formed above the pull-up layer. The protective layer may include a titanium-based nitride. The pull-up lay may include tungsten oxide, zirconium oxide, manganese oxide, molybdenum oxide, titanium oxide, or a combination thereof.

    Abstract translation: 本文提供的实施方案描述了耐磨玻璃涂层和用于形成耐磨玻璃涂层的方法。 提供玻璃体。 在玻璃体的上方形成耐磨层。 耐磨层包括无定形碳。 在耐磨层上形成上拉层。 在上拉层上形成保护层。 保护层可以包括钛基氮化物。 上拉层可以包括氧化钨,氧化锆,氧化锰,氧化钼,氧化钛或其组合。

    METHODS OF PROCESSING SUBSTRATES HAVING METAL MATERIALS
    18.
    发明申请
    METHODS OF PROCESSING SUBSTRATES HAVING METAL MATERIALS 有权
    处理金属材料基板的方法

    公开(公告)号:US20110306215A1

    公开(公告)日:2011-12-15

    申请号:US13014813

    申请日:2011-01-27

    Abstract: Methods of processing substrates having metal layers are provided herein. In some embodiments, a method of processing a substrate comprising a metal layer having a patterned mask layer disposed above the metal layer, the method may include etching the metal layer through the patterned mask layer; and removing the patterned mask layer using a first plasma formed from a first process gas comprising oxygen (O2) and a carbohydrate. In some embodiments, a two step method with an additional second process gas comprising chlorine (Cl2) or a sulfur (S) containing gas, may provide an efficient way to remove patterned mask residue.

    Abstract translation: 本文提供了处理具有金属层的基板的方法。 在一些实施例中,一种处理包括具有设置在金属层上方的图案化掩模层的金属层的衬底的方法,所述方法可以包括通过图案化掩模层蚀刻金属层; 以及使用由包含氧(O 2)和碳水化合物的第一工艺气体形成的第一等离子体去除图案化掩模层。 在一些实施方案中,具有包含氯(Cl 2)或含硫(S))气体的另外的第二工艺气体的两步法可以提供去除图案化掩模残余物的有效方式。

    METHODS FOR EXTENDING CHAMBER COMPONENT LIFE TIME
    19.
    发明申请
    METHODS FOR EXTENDING CHAMBER COMPONENT LIFE TIME 审中-公开
    用于扩展室内组件寿命的方法

    公开(公告)号:US20090163033A1

    公开(公告)日:2009-06-25

    申请号:US11963432

    申请日:2007-12-21

    CPC classification number: H01J37/32522 H01J37/32091

    Abstract: Methods for extending service life of chamber components for semiconductor processing are provided. In one embodiment, the method includes maintaining a substrate support assembly disposed in a processing chamber at a first temperature, performing a first plasma process on a first substrate in the processing chamber while the substrate support is maintained at the first temperature, and raising the temperature of the substrate support assembly to a second temperature after completion of the first plasma process.

    Abstract translation: 提供延长半导体加工用腔室部件使用寿命的方法。 在一个实施例中,该方法包括将设置在处理室中的基板支撑组件保持在第一温度,在处理室中的第一基板上执行第一等离子体处理,同时将基板支撑件保持在第一温度,并且升高温度 的基板支撑组件在第一等离子体处理完成之后达到第二温度。

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