摘要:
A method for fabricating an integrated circuit with at least one p-FinFET device and at least one n-FinFET device. The method includes bonding a first silicon layer having a first crystalline orientation to a second silicon layer having a second crystalline orientation that is different from the first crystalline orientation. A first plurality of fins and a second plurality of fins are created. A spacer is formed around each fin in the first plurality of fins and second plurality of fins. A set of regions of the second layer between each fin in the first plurality of fins and the second plurality of fins are recessed to form a base with exposed sidewalls under each fin in the first plurality of fins and the second plurality of fins. The base under each fin and a set of exposed regions between each fin is oxidized.
摘要:
A method for forming an integrated circuit, the method includes forming a first nanowire suspended above an insulator substrate, the first nanowire attached to a first silicon on insulator (SOI) pad region and a second SOI pad region that are disposed on the insulator substrate, a second nanowire disposed on the insulator substrate attached to a third SOI pad region and a fourth SOI pad region that are disposed on the insulator substrate, and a SOI slab region that is disposed on the insulator substrate, and forming a first gate surrounding a portion of the first nanowire, a second gate on a portion of the second nanowire, and a third gate on a portion of the SOI slab region.
摘要:
A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.
摘要:
A semiconductor structure includes a first dielectric material including at least one first conductive region contained therein. The structure also includes at least one graphene containing semiconductor device located atop the first dielectric material. The at least one graphene containing semiconductor device includes a graphene layer that overlies and is in direct with the first conductive region. The structure further includes a second dielectric material covering the at least one graphene containing semiconductor device and portions of the first dielectric material. The second dielectric material includes at least one second conductive region contained therein, and the at least one second conductive region is in contact with a conductive element of the at least one graphene containing semiconductor device.
摘要:
A FET structure with a nanowire forming the FET channel, and doped source and drain regions formed by radial epitaxy from the nanowire body is disclosed. A top gated and a bottom gated nanowire FET structures are discussed. The source and drain fabrication can use either selective or non-selective epitaxy.
摘要:
A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.
摘要:
A FET structure with a nanowire forming the FET channel, and doped source and drain regions formed by radial epitaxy from the nanowire body is disclosed. A top gated and a bottom gated nanowire FET structures are discussed. The source and drain fabrication can use either selective or non-selective epitaxy.
摘要:
A method (that produces a structure) patterns at least two wires of semiconductor material such that a first wire of the wires has a larger perimeter than a second wire of the wires. The method performs an oxidation process simultaneously on the wires to form a first gate oxide on the first wire and a second gate oxide on the second wire. The first gate oxide is thicker than the second gate oxide. The method also forms gate conductors over the first gate oxide and the second gate oxide, forms sidewall spacers on the gate conductors, and dopes portions of the first wire and the second wire not covered by the sidewall spacers and the gate conductors to form source and drain regions within the first wire and the second wire.
摘要:
A method for forming a nanowire field effect transistor (FET) device includes forming a nanowire over a semiconductor substrate, forming a gate structure around a portion of the nanowire, forming a capping layer on the gate structure; forming a first spacer adjacent to sidewalls of the gate and around portions of nanowire extending from the gate, forming a hardmask layer on the capping layer and the first spacer, removing exposed portions of the nanowire, epitaxially growing a doped semiconductor material on exposed cross sections of the nanowire to form a source region and a drain region, forming a silicide material in the epitaxially grown doped semiconductor material, and forming a conductive material on the source and drain regions.
摘要:
A vertical FET structure with nanowire forming the FET channels is disclosed. The nanowires are formed over a conductive silicide layer. The nanowires are gated by a surrounding gate. Top and bottom insulator plugs function as gate spacers and reduce the gate-source and gate-drain capacitance.