摘要:
Synthesis gas for FT synthesis is produced using a producing apparatus including an active carbon adsorbing vessel for adsorbing impurities in a natural gas, a hydro-desulfurizer for hydrogenating and desulfurizing sulfur content in the natural gas under a condition of a partial pressure of hydrogen of 100 to 200 kPa, a second hydrogen supplying line for supplying hydrogen to the natural gas between the hydro-desulfurizer and a reactor, the reactor for obtaining synthesis gas by reacting the natural gas, carbon dioxide and steam in the presence of a catalyst for reforming, and a heat recovering boiler for cooling the synthesis gas at a cooling rate of 2000 to 4000° C./second.
摘要:
Synthesis gas for FT synthesis is produced using a producing apparatus including an active carbon adsorbing vessel for adsorbing impurities in a natural gas, a hydro-desulfurizer for hydrogenating and desulfurizing sulfur content in the natural gas under a condition of a partial pressure of hydrogen of 100 to 200 kPa, a second hydrogen supplying line for supplying hydrogen to the natural gas between the hydro-desulfurizer and a reactor, the reactor for obtaining synthesis gas by reacting the natural gas, carbon dioxide and steam in the presence of a catalyst for reforming, and a heat recovering boiler for cooling the synthesis gas at a cooling rate of 2000 to 4000° C./second.
摘要:
Process for the production of semiconductor devices by using silicon-on-insulator (SOI) techniques. The Si layers of the SOI structure include an interfacial layer of Si and a buffer layer of Si formed thereon, whereby the formation of stacking faults in the Si layers can be effectively prevented. Pretreatment of the underlying insulating material with a molybdate solution and interposition of an additional layer of slowly grown single-crystalline Si between the buffer layer of Si and the overlying active Si layer are also effective to inhibit the stacking faults. Semiconductor devices with high quality can be produced with good yield.
摘要:
A thin film of a high temperature superconductive oxide of rare earth metal-alkali earth metal-copper-oxygen system or group VA metal-alkali earth metal-copper-oxygen system, which has an excellent crystallinity, particularly a single crystalline structure, is formed on a substrate by a CVD method, in which halides of the metals and an oxygen source gas are separately flowed over a substrate and caused to react with each other over the substrate, to deposit a desired superconducting oxide film.
摘要:
According to an exemplary embodiment, a bubble column-type slurry bed Fischer-Tropsch synthesis reaction process can be provided, in which synthesis gas supplied continuously from the bottom of a reactor contacts suspended catalyst particles to form liquid hydrocarbons, gaseous hydrocarbons and water. Additionally, a slurry of suspended liquid products and catalyst particles can move from the reactor to the lower portion of a separation vessel to separate the catalyst particles and gaseous products. Further, a process can be provided in which the liquid products formed are sent to the separation vessel a process in which liquid products can be derived. Additionally, a process can be provided in which a slurry in which catalyst particles are concentrated is derived from the bottom of the separation vessel and circulated to the bottom of the reactor, are driven by the driving force of synthesis gas without using an external drive power source.
摘要:
A method of evaluating the characteristics of superconductors, comprising: irradiating light to a superconductor held at a predetermined temperature; detecting light transmitted through the superconductor and composing a spectrum of the transmitted light; and using the obtained spectrum, calculating a ratio of the number of electrons contributing to a normal conduction to the number of electrons contributing to a superconduction in the superconductor, the ratio being effective at said predetermined temperature. A process and an apparatus for forming superconductor films by using the method are also disclosed.
摘要:
A single crystal of Al.sub.2 O.sub.3 is epitaxially grown on an Si-single crystal of a semiconductor device by a vapor growth method. This vapor growth method employs starting materials of HCl, Al and CO.sub.2. Further, this method advantageouslyemploys a carrier gas to carry the gaseous product of the reaction of HCl with Al. An apparatus for the production of the above-mentioned semiconductor device comprises a chamber means for the reaction of the gaseous product and the single crystal, a reaction chamber for the reaction of Al and HCl, and an introducing tube for introducing CO.sub.2 in the proximity of the Si-single crystal.