Growth method of a nitride III-V compound semiconductor, manufacturing method of a semiconductor device, and semiconductor device
    21.
    发明授权
    Growth method of a nitride III-V compound semiconductor, manufacturing method of a semiconductor device, and semiconductor device 有权
    氮化物III-V族化合物半导体的生长方法,半导体装置的制造方法以及半导体装置

    公开(公告)号:US06682991B1

    公开(公告)日:2004-01-27

    申请号:US09448584

    申请日:1999-11-24

    IPC分类号: H01L2120

    摘要: When making a growth mask on a substrate and using the growth mask to selectively grow nitride III-V compound semiconductors on the substrate, a multi-layered film including a nitride forming at least its top surface is used as the growth mask. The growth mask may be combination of an oxide film and a nitride film thereon, combination of a metal film and a nitride film thereon, combination of an oxide film, a film thereon made up of a nitride and an oxide, and a nitride film thereon, or combination of a first metal film, a second metal film thereon different from the first metal film and a nitride film thereon, for example. The oxide film may be a Si02, for example, the nitride film may be a TiN film or a SiN film, the film made up of a nitride and an oxide may be a SiNO film, and the metal film may be a Ti film or a Pt film, for example.

    摘要翻译: 当在衬底上制造生长掩模并且使用生长掩模在衬底上选择性地生长氮化物III-V化合物半导体时,使用包括至少形成其顶表面的氮化物的多层膜作为生长掩模。 生长掩模可以是其上的氧化物膜和氮化物膜的组合,其上的金属膜和氮化物膜的组合,氧化物膜,由氮化物和氧化物组成的膜以及氮化物膜上的氮化物膜的组合 ,或第一金属膜,与第一金属膜不同的第二金属膜和其上的氮化物膜的组合。 氧化膜可以是SiO 2,例如,氮化膜可以是TiN膜或SiN膜,由氮化物和氧化物构成的膜可以是SiNO膜,并且金属膜可以是Ti膜或 例如Pt膜。

    Nitride semiconductor light emitting device
    22.
    发明授权
    Nitride semiconductor light emitting device 失效
    氮化物半导体发光器件

    公开(公告)号:US6081001A

    公开(公告)日:2000-06-27

    申请号:US815205

    申请日:1997-03-12

    CPC分类号: H01L33/32

    摘要: A luminous intensity of a semiconductor light emitting device having a multi-layer structure formed of nitride group III-V compound semiconductors is improved by having a thickness d of a light emitting layer (active layer) of the semiconductor light emitting device having a multi-layer structure formed of nitride group III-V compound semiconductors ranging from 0.3 nm to 1.5 nm.

    摘要翻译: 具有由氮化物III-V族化合物半导体形成的多层结构的半导体发光器件的发光强度通过使半导体发光器件的发光层(有源层)的厚度d具有多层结构, 由0.3nm至1.5nm的氮化物III-V族化合物半导体形成的层结构。

    Laser diode
    26.
    发明申请
    Laser diode 失效
    激光二极管

    公开(公告)号:US20050254538A1

    公开(公告)日:2005-11-17

    申请号:US11123168

    申请日:2005-05-06

    摘要: A laser diode capable of effectively inhibiting effects of return light is provided. A laser diode includes a substrate, and a laminated structure including a first conductive semiconductor layer, an active layer having a light emitting region, and a second conductive semiconductor layer having a projecting part on the surface thereof, on the substrate, wherein a return light inhibition part is provided on a main-emitting-side end face, and effects of return light in the vicinity of lateral boundaries of the light emitting region are inhibited by the return light inhibition part.

    摘要翻译: 提供了能够有效地抑制返回光的效果的激光二极管。 激光二极管包括基板,以及包括第一导电半导体层,具有发光区域的有源层和在其表面上具有突出部分的第二导电半导体层的层压结构,其中返回光 抑制部分设置在主发光侧端面上,并且返回光抑制部分抑制了发光区域的侧边界附近的返回光的影响。

    Semiconductor light emitting device
    29.
    发明授权
    Semiconductor light emitting device 有权
    半导体发光器件

    公开(公告)号:US06362016B1

    公开(公告)日:2002-03-26

    申请号:US09557770

    申请日:2000-04-25

    IPC分类号: H01L2100

    CPC分类号: H01L33/32

    摘要: A luminous intensity of a semiconductor light emitting device having a multi-layer structure formed of nitride group III-V compound semiconductors is improved by having a thickness d of a light emitting layer (active layer) of the semiconductor light emitting device having a multi-layer structure of nitride group III-V compound semiconductors ranging from 0.3 nm to 1.5 nm.

    摘要翻译: 具有由氮化物III-V族化合物半导体形成的多层结构的半导体发光器件的发光强度通过使半导体发光器件的发光层(有源层)的厚度d具有多层结构, 氮化物III-V族化合物半导体的层结构为0.3nm至1.5nm。