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公开(公告)号:US12266682B2
公开(公告)日:2025-04-01
申请号:US17025209
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Mohammad Enamul Kabir , Zhiguo Qian , Gerald S. Pasdast , Kimin Jun , Shawna M. Liff , Johanna M. Swan , Aleksandar Aleksov , Feras Eid
IPC: H01L23/49 , H01L23/492 , H01L49/02
Abstract: Disclosed herein are capacitors and resistors at direct bonding interfaces in microelectronic assemblies, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component, wherein a direct bonding interface of the second microelectronic component is direct bonded to a direct bonding interface of the first microelectronic component, the microelectronic assembly includes a sensor, the sensor includes a first sensor plate and a second sensor plate, the first sensor plate is at the direct bonding interface of the first microelectronic component, and the second sensor plate is at the direct bonding interface of the second microelectronic component.
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公开(公告)号:US20240355768A1
公开(公告)日:2024-10-24
申请号:US18761443
申请日:2024-07-02
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Krishna Bharath , Kevin P. O'Brien , Kimin Jun , Han Wui Then , Mohammad Enamul Kabir , Gerald S. Pasdast , Feras Eid , Aleksandar Aleksov , Johanna M. Swan , Shawna M. Liff
IPC: H01L23/00 , H01L25/065
CPC classification number: H01L24/08 , H01L24/05 , H01L24/29 , H01L24/32 , H01L25/0657 , H01L28/10 , H01L2224/05147 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/0801 , H01L2224/08145 , H01L2224/0903 , H01L2224/09055 , H01L2224/09505 , H01L2224/29186 , H01L2224/32145
Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component coupled to the first microelectronic component by a direct bonding region, wherein the direct bonding region includes at least part of an inductor.
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公开(公告)号:US12117960B2
公开(公告)日:2024-10-15
申请号:US17029288
申请日:2020-09-23
Applicant: Intel Corporation
Inventor: Narasimha Lanka , Lakshmipriya Seshan , Gerald S. Pasdast , Zuoguo Wu
CPC classification number: G06F13/4291 , G06F13/4068 , G06F13/423
Abstract: Systems, methods, and apparatuses associated with an approximate majority based data bus inversion technique are disclosed. A method comprises obtaining, at a first device connected by a plurality of lanes to a second device, original data comprising first bits and second bits, where the first bits are to be transmitted in a new clock cycle via first lanes of the plurality of lanes, and the second bits are to be transmitted in the new clock cycle via second lanes of the plurality of lanes. The method further includes determining whether a first criterion associated with the first bits is met, determining whether a second criterion associated with the second bits is met, and transmitting an inverted version of the original data via the plurality of lanes based, at least in part, on determining that the first criterion and the second criterion are met.
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公开(公告)号:US20220399324A1
公开(公告)日:2022-12-15
申请号:US17344348
申请日:2021-06-10
Applicant: Intel Corporation
Inventor: Han Wui Then , Adel A. Elsherbini , Kimin Jun , Johanna M. Swan , Shawna M. Liff , Sathya Narasimman Tiagaraj , Gerald S. Pasdast , Aleksandar Aleksov , Feras Eid
IPC: H01L25/00 , H01L25/065 , H01L23/00
Abstract: A die assembly comprising: a first component layer having conductive through-connections in an insulator, a second component layer comprising a die, and an active device layer (ADL) at an interface between the first component layer and the second component layer. The ADL comprises active elements electrically coupled to the first component layer and the second component layer. The die assembly further comprises a bonding layer electrically coupling the ADL to the second component layer. In some embodiments, the die assembly further comprises another ADL at another interface between the first component layer and a package support opposite to the interface. The first component layer may comprise another die having through-substrate vias (TSVs). The die and the another die may be fabricated using different process nodes.
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公开(公告)号:US20220399277A1
公开(公告)日:2022-12-15
申请号:US17345969
申请日:2021-06-11
Applicant: INTEL CORPORATION
Inventor: Adel A. Elsherbini , Scott E. Siers , Sathya Narasimman Tiagaraj , Gerald S. Pasdast , Zhiguo Qian , Kalyan C. Kolluru , Vivek Kumar Rajan , Shawna M. Liff , Johanna M. Swan
IPC: H01L23/538 , H01L25/065 , H01L23/00 , H01L21/48 , H01L25/00
Abstract: An Integrated Circuit (IC), comprising a first conductive trace on a first die, a second conductive trace on a second die, and a conductive pathway electrically coupling the first conductive trace with the second conductive trace. The second die is coupled to the first die with interconnects. The conductive pathway comprises a portion of the interconnects located proximate to a periphery of a region in the first die through which the first conductive trace is not routable. In some embodiments, the conductive pathway reroutes electrical connections away from the region. The region comprises a high congestion zone having high routing density in some embodiments. In other embodiments, the region comprises a “keep-out” zone.
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公开(公告)号:US11336559B2
公开(公告)日:2022-05-17
申请号:US16106926
申请日:2018-08-21
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Tejpal Singh , Shawna M. Liff , Gerald S. Pasdast , Johanna M. Swan
IPC: H04L45/122 , H04L45/12 , H04L9/40 , G06F12/0842 , H04L49/109
Abstract: Embodiments herein may relate to a processor package with a substrate and a multi-chip processor coupled with the substrate. The multi-chip processor may include a dual-sided interconnect structure coupled with a first chip, a second chip, and a third chip. The first chip may be communicatively coupled with the second chip by an on-chip communication route. Likewise, the second chip may be communicatively coupled with the first chip by an on-chip communication route. Additionally, the first chip may be communicatively coupled with the third chip by a fast-lane communication route. Other embodiments may be described and/or claimed.
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公开(公告)号:US20220093546A1
公开(公告)日:2022-03-24
申请号:US17025181
申请日:2020-09-18
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Krishna Bharath , Kevin P. O'Brien , Kimin Jun , Han Wui Then , Mohammad Enamul Kabir , Gerald S. Pasdast , Feras Eid , Aleksandar Aleksov , Johanna M. Swan , Shawna M. Liff
IPC: H01L23/00 , H01L49/02 , H01L25/065
Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component coupled to the first microelectronic component by a direct bonding region, wherein the direct bonding region includes at least part of an inductor.
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28.
公开(公告)号:US20200098725A1
公开(公告)日:2020-03-26
申请号:US16143339
申请日:2018-09-26
Applicant: Intel Corporation
Inventor: Shawna M. Liff , Adel A. Elsherbini , Johanna M. Swan , Gerald S. Pasdast , Babak Sabi
IPC: H01L25/065 , H01L25/00 , H01L23/00
Abstract: Embodiments herein relate to a semiconductor package or a semiconductor package structure that includes an interposer with opposing first and second sides. A memory and a processing unit may be coupled with the second side of the interposer, and the first side of the interposer may be to couple with the substrate. The processing unit and memory may be communicatively coupled with one another and the substrate by the interposer. Other embodiments may be described or claimed.
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公开(公告)号:US10461805B2
公开(公告)日:2019-10-29
申请号:US15761408
申请日:2015-09-26
Applicant: Intel Corporation
Inventor: Venkatraman Iyer , Lip Khoon Teh , Mahesh Wagh , Zuoguo Wu , Azydee Hamid , Gerald S. Pasdast
Abstract: One or more link training signals are received, including instances of a link training pattern, on a plurality of lanes of a physical link that includes at least one valid lane and a plurality of data lanes. The plurality of lanes are trained together using the link training signals to synchronize sampling of the valid lane with sampling of the plurality of data lanes. An active link state is entered and a valid signal received on the valid lane during the active link state. The valid signal includes a signal held at a value for a defined first duration and indicates that data is to be received on the plurality of data lanes in a second defined duration subsequent to the first duration. The data is to be received, during the active link state, on the plurality of data lanes during the second defined duration.
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公开(公告)号:US20170294906A1
公开(公告)日:2017-10-12
申请号:US15632836
申请日:2017-06-26
Applicant: Intel Corporation
Inventor: Mahesh Wagh , Zuoguo J. Wu , Venkatraman Iyer , Gerald S. Pasdast , Todd A. Hinck , David M. Lee , Narasimha R. Lanka
CPC classification number: H03K5/26 , G01R31/041 , G06F1/3296 , G06F13/4291 , H03K5/131 , H03L9/00
Abstract: In an example, a system and method for centering in a high-performance interconnect (HPI) are disclosed. When an interconnect is powered up from a dormant state, it may be necessary to “center” the clock signal to ensure that data are read at the correct time. A multi-phase method may be used, in which a first phase comprises a reference voltage sweep to identify an optimal reference voltage. A second phase comprises a phase sweep to identify an optimal phase. A third sweep comprises a two-dimensional “eye” phase, in which a plurality of values within a two-dimensional eye derived from the first two sweeps are tested. In each case, the optimal value is the value that results in the fewest bit error across multiple lanes. In one example, the second and third phases are performed in software, and may include testing a “victim” lane, with adjacent “aggressor” lanes having a complementary bit pattern.
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