Abstract:
An overvoltage protection component may be in a SOI layer, a portion of the SOI layer forming the core of an optical waveguide. This component may be made of semiconductor regions of different doping types and/or levels, at least one of these regions corresponding to at least a portion of the waveguide core.
Abstract:
A method is provided for producing a semiconductor layer having at least two different thicknesses from a stack of the semiconductor on insulator type including at least one substrate on which an insulating layer and a first semiconductor layer are successively disposed, the method including etching the first layer so that said layer is continuous and includes at least one first region having a thickness less than that of at least one second region; oxidizing the first layer to form an electrically insulating oxide film on a surface thereof so that, in the first region, the oxide film extends as far as the insulating layer; partly removing the oxide film to bare the first layer outside the first region; forming a second semiconductor layer on the stack, to form, with the first layer, a third continuous semiconductor layer having a different thickness than that of the first and second regions.
Abstract:
A coplanar waveguide electronic device is formed on a substrate. The waveguide includes a signal ribbon and a ground plane. The signal ribbon is formed of two or more signal lines of a same level of metallization that are electrically connected together. The ground plane is formed of an electrically conducting material which includes rows of holes.
Abstract:
A Method for manufacturing a transistor comprising: a) amorphization and doping, by means of one or more localised implantation(s), of given regions of source and drain blocks based on crystalline semi-conductor material lying on an insulating layer of a semi-conductor on insulator substrate, the implantation(s) being carried out so as to conserve at the surface of said blocks zones of crystalline semi-conductor material on the regions of amorphous semi-conductor material, b) recrystallization of at least one portion of said given regions.
Abstract:
The invention relates to a method for manufacturing a transistor comprising the preparation of a stack of layers of the semiconductor on insulator type comprising at least one substrate on which an insulating layer and an initial semiconductor layer are successively disposed. The method includes the formation of at least one oxide pad extending from a top face of the insulating layer, the formation of an additional layer made from semiconductor material covering the oxide pad and intended to form a channel for the transistor, the formation of a gate stack above the oxide pad, and the formation of a source and drain on either side of the gate stack.
Abstract:
A power management circuit including, between a first terminal intended to be connected to an electric power generation source and a second terminal intended to be connected to a load to be powered, a linear regulator and a circuit capable of activating the linear regulator when the power supplied by said source is greater than a first threshold.
Abstract:
The substrate is provided with a first semiconducting area partially covered by a first masking pattern to define a protected surface and an open surface. A continuous layer of silicon-germanium is deposited in non-selective manner on the first semiconducting area and on the first gate pattern. The continuous silicon-germanium layer forms an interface with the first semiconducting area. A diffusion/condensation annealing is performed to make the germanium atoms diffuse from the silicon-germanium layer to the open surface of the first semiconducting area. The masking pattern is a gate stack of the transistor or is used to define the shape of the gate stack in an electrically insulating layer so as to form a self-aligned gate stack with the source and drain areas.
Abstract:
According to one mode of implementation, a method includes an estimation including on the one hand a correlation processing involving at least one part of the sampled signal, at least one part of at least one first signal gleaned from a derived signal representative of a temporal derivative of the sampled signal and at least one part of N partial filtered signals respectively representative of N weighted differences between N pairs of bracketing versions flanking the sampled signal, N being greater than or equal to 1. On the other hand, the estimation includes a matrix processing on the results of this correlation processing. Correction processing of the M−1 trains involves respectively M−1 second signals gleaned from the derived signal and the suite of M−1 shift coefficients.
Abstract:
An integrated circuit includes first and second electronic components, a buried UTBOX insulating layer, first and second ground planes plumb with the first and second electronic components, first and second wells, first and second biasing electrodes making contact with the first and second wells and with the first and second ground planes, a third electrode making contact with the first well, a first trench isolation separating the first and third electrodes and extending through the buried insulating layer as far as into the first well, and a second trench isolation that isolates the first electrode from the first component, and that does not extend as far as the interface between the first ground plane and the first well.
Abstract:
A circuit includes a first n-bit communications block and a second m-bit communications block. A controller is configured to control mode of operation for the first and second communications blocks. In a first mode, the first and second communications blocks function as a single communications block for n+m bit communications. In a second mode, the first and second communications blocks operate as substantially independent communications block for n bit communications and m bit communications.