Profile engineered, electrically active thin film devices
    50.
    发明授权
    Profile engineered, electrically active thin film devices 有权
    型材设计,电活性薄膜器件

    公开(公告)号:US08426905B2

    公开(公告)日:2013-04-23

    申请号:US12243880

    申请日:2008-10-01

    IPC分类号: H01L29/788

    摘要: The present invention relates to electrically active devices (e.g., capacitors, transistors, diodes, floating gate memory cells, etc.) having dielectric, conductor, and/or semiconductor layers with smooth and/or dome-shaped profiles and methods of forming such devices by depositing or printing (e.g., inkjet printing) an ink composition that includes a semiconductor, metal, or dielectric precursor. The smooth and/or dome-shaped cross-sectional profile allows for smooth topological transitions without sharp steps, preventing feature discontinuities during deposition and allowing for more complete step coverage of subsequently deposited structures. The inventive profile allows for both the uniform growth of oxide layers by thermal oxidation, and substantially uniform etching rates of the structures. Such oxide layers may have a uniform thickness and provide substantially complete coverage of the underlying electrically active feature. Uniform etching allows for an efficient method of reducing a critical dimension of an electrically active structure by simple isotropic etch.

    摘要翻译: 本发明涉及具有平滑和/或圆顶形轮廓的电介质,导体和/或半导体层的电活性器件(例如,电容器,晶体管,二极管,浮动栅极存储单元等)和形成这种器件的方法 通过沉积或印刷(例如喷墨印刷)包括半导体,金属或电介质前体的油墨组合物。 平滑和/或圆顶形的横截面轮廓允许平滑的拓扑转变而没有尖锐的步骤,防止沉积期间的特征不连续性,并允许随后沉积的结构的更完整的阶梯覆盖。 本发明的轮廓允许通过热氧化均匀生长氧化物层,以及基本均匀的结构蚀刻速率。 这样的氧化物层可以具有均匀的厚度并且提供基本的电活性特征的基本上完整的覆盖。 均匀蚀刻允许通过简单的各向同性蚀刻来降低电活性结构的临界尺寸的有效方法。