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91 条记录 (耗时 0.028 秒)

    Contactor for electronic parts and a contact method
    41.
    发明申请
    Contactor for electronic parts and a contact method 有权
    电子零件接触器和接触方式

    公开(公告)号：US20060186905A1

    公开(公告)日：2006-08-24

    申请号：US11339836

    申请日：2006-01-26

    申请人： Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    发明人： Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    IPC分类号： G01R31/02

    CPC分类号： G01R1/0466 ,  G01R1/0483

    摘要： A contactor for electronic parts can provide an appropriate and uniform contact with respect to a plurality of electrode terminals in an electronic part such as an IC. Each of a plurality of contact members has a first contact portion on one end thereof and a second contact portion on the other end thereof, the first contract portion having a recessed portion that receives one of the electrode terminals of the electronic part. A base accommodates and supports the plurality of the contact members. The first contact portion is movable in a horizontal direction.

    摘要翻译： 用于电子部件的接触器可以提供相对于诸如IC的电子部件中的多个电极端子的适当且均匀的接触。 多个接触构件中的每一个在其一端具有第一接触部分和另一端的第二接触部分，第一接合部分具有容纳电子部件的电极端子之一的凹部。 基座容纳并支撑多个接触构件。 第一接触部分可沿水平方向移动。

    Electrical connecting method
    43.
    发明申请
    Electrical connecting method 有权
    电气连接方式

    公开(公告)号：US20050253614A1

    公开(公告)日：2005-11-17

    申请号：US10937401

    申请日：2004-09-10

    申请人： Shigeyuki Maruyama ,  Toru Nishino

    发明人： Shigeyuki Maruyama ,  Toru Nishino

    IPC分类号： G01R31/26 ,  G01R1/073 ,  G01R31/02 ,  G01R31/28 ,  H01R33/76

    CPC分类号： G01R31/2875 ,  G01R1/0735

    摘要： An electrical connecting method has the step of bringing a contact member connected to an electric circuit into contact with a terminal of an electronic part. A desired processing is performed by feeding current to the terminal via the contact member. The contact member is then separated from the terminal. When the contact member is brought into contact with the terminal, energy is applied to the contact member or the terminal in order to locally soften a portion of the terminal contacting the contact member. Thereafter, the desired processing is performed, in the state that the contacting portion of the terminal with the contact member is softened so as to reduce the contact resistance and so as to increase the subsequent separatability of the contact member from the terminal.

    摘要翻译： 电连接方法具有使与电路连接的接触构件与电子部件的端子接触的步骤。 通过经由接触构件向端子馈送电流来执行所需的处理。 然后将接触构件与端子分离。 当接触构件与端子接触时，能量被施加到接触构件或端子，以便局部软化接触接触构件的端子的一部分。 此后，在端子与接触构件的接触部分被软化以便降低接触电阻并且增加接触构件与端子的随后的分离性的状态下进行所需的处理。

    Test board and a test method using the same providing improved electrical connection
    45.
    发明授权
    Test board and a test method using the same providing improved electrical connection 失效
    测试板和使用该测试方法的测试方法提供改进的电气连接

    公开(公告)号：US6046598A

    公开(公告)日：2000-04-04

    申请号：US852159

    申请日：1997-05-06

    申请人： Naomi Miyaji ,  Susumu Moriya ,  Shigeyuki Maruyama ,  Makoto Haseyama ,  Futoshi Fukaya

    发明人： Naomi Miyaji ,  Susumu Moriya ,  Shigeyuki Maruyama ,  Makoto Haseyama ,  Futoshi Fukaya

    IPC分类号： G01R1/04 ,  H05K3/32 ,  G01R1/06 ,  G01R31/26

    CPC分类号： H05K3/326 ,  G01R1/0408

    摘要： A test board includes an insulating part provided to face a semiconductor device when the semiconductor device is mounted on the test board, a sloped connection hole formed in the insulating part for accepting a projection electrode when the semiconductor device is mounted on the test board, and a conductive part formed in the insulating part so as to be in contact with and electrically connected to the projection electrode. When the semiconductor device is mounted on the test board, the semiconductor device or the projection electrode is supported by the insulating part.

    摘要翻译： 测试板包括当半导体器件安装在测试板上时面向半导体器件的绝缘部分，当半导体器件安装在测试板上时用于接受投影电极的绝缘部分中形成的倾斜连接孔，以及 导电部分形成在绝缘部分中以与突起电极接触并电连接。 当半导体器件安装在测试板上时，半导体器件或突起电极由绝缘部分支撑。

    Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test
    48.
    发明授权
    Anisotropic conductive sheet, production process, contact structure, electronic device and inspection apparatus for operation test 失效
    各向异性导电片，生产工艺，接触结构，电子仪器和检测仪器进行运行试验

    公开(公告)号：US07267559B2

    公开(公告)日：2007-09-11

    申请号：US10141778

    申请日：2002-05-10

    申请人： Takafumi Hashitani ,  Shigeyuki Maruyama

    发明人： Takafumi Hashitani ,  Shigeyuki Maruyama

    IPC分类号： H01R4/58

    CPC分类号： G01R1/06755 ,  G01R1/07314 ,  G01R1/07378 ,  G01R3/00

    摘要： An anisotropic conductive sheet comprising an insulating base material and a plurality of conductive passages embedded at predetermined positions in the insulating base material, penetrating the insulating base material in the thickness direction. The conductive passage comprises a matrix consisting of non-silicone material or silicone material having rubber elasticity, the matrix material being filled into through-holes formed at a predetermined position in the base material and then hardened, and a conductive filler dispersed in the matrix at an amount capable of exhibiting conductivity at all times. A surface layer of conductive material is capable of functioning as a contact and ensuring an electrical connection by piercing a surface layer of an opponent when the surface layer is used as a contact, such as a layer of fine conductive particles is further provided on at least one of the end faces of the conductive passage. An anisotropic conductive sheet of the present invention can be advantageously used in an electronic device or inspection apparatus, used for an operation test, as a contactor.

    摘要翻译： 一种各向异性导电片，其包括绝缘基材和嵌入绝缘基材中的预定位置的多个导电通道，其在厚度方向上穿透绝缘基材。 导电通道包括由非硅酮材料或具有橡胶弹性的硅酮材料构成的基体，将基质材料填充到形成在基材中的预定位置上的通孔中，然后硬化，并将分散在基体中的导电填料 能够始终显示导电性的量。 导电材料的表面层能够起到接触的作用，并且当表面层用作接触时，通过刺穿对方的表面层来确保电连接，例如至少进一步提供细导电颗粒层 导电通路的端面之一。 本发明的各向异性导电片可以有利地用于用作操作试验的电子装置或检查装置中作为接触器。

    Device testing contactor, method of producing the same, and device testing carrier
    49.
    发明授权
    Device testing contactor, method of producing the same, and device testing carrier 有权
    设备测试接触器，其制造方法和设备测试载体

    公开(公告)号：US07196530B2

    公开(公告)日：2007-03-27

    申请号：US10670377

    申请日：2003-09-26

    申请人： Makoto Haseyama ,  Shigeyuki Maruyama

    发明人： Makoto Haseyama ,  Shigeyuki Maruyama

    IPC分类号： G01R31/02 ,  H01R9/00

    CPC分类号： G01R1/0433 ,  Y10T29/49147 ,  Y10T29/49149 ,  Y10T29/49208 ,  Y10T29/4922

    摘要： A contactor used for testing a semiconductor device is provided. The semiconductor device testing contactor is electrically connected to electrodes of a semiconductor device to be tested. Such a contactor includes a wiring board and a first reinforcing member for reinforcing the wiring board. The contactor has a flexible base film and device connecting pads to be electrically connected to the electrodes of the semiconductor device. The first reinforcing member is disposed on the surface opposite to the semiconductor device connecting surface of the wiring board. The wiring board and the first reinforcing member are collectively bonded.

    摘要翻译： 提供了用于测试半导体器件的接触器。 半导体器件测试接触器电连接到要测试的半导体器件的电极。 这种接触器包括布线板和用于加强布线板的第一加强件。 接触器具有柔性基膜和与半导体器件的电极电连接的器件连接焊盘。 第一加强构件设置在与布线板的半导体器件连接表面相对的表面上。 接线板和第一加强件共同接合。