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249 条记录 (耗时 0.024 秒)

    Method and apparatus for scrubbing accumulated data errors from a memory system
    52.
    发明授权
    Method and apparatus for scrubbing accumulated data errors from a memory system 有权
    用于从存储器系统中擦除累积的数据错误的方法和装置

    公开(公告)号：US09170879B2

    公开(公告)日：2015-10-27

    申请号：US12456923

    申请日：2009-06-24

    申请人： Hsu Kai Yang

    发明人： Hsu Kai Yang

    IPC分类号： G06F11/10 ,  G11C16/34 ,  G11C29/46

    CPC分类号： G06F11/106 ,  G06F11/1096 ,  G11C16/3418 ,  G11C16/349 ,  G11C29/46

    摘要： A data scrubbing apparatus corrects disturb data errors occurring in an array of memory cells such as SMT MRAM cells. The data scrubbing apparatus receives an error indication that an error has occurred during a read operation of a grouping of memory cells within the array of memory cells. The data scrubbing apparatus may generate an address describing the location of the memory cells to be scrubbed. The data scrubbing apparatus then commands the array of memory cells to write back the corrected data. Based on a scrub threshold value, the data scrubbing apparatus writes the corrected data back after a specific number of errors. The data scrubbing apparatus may further suspend writing back during a writing of data. The data scrubbing apparatus provides a busy indicator externally during a write back of corrected data.

    摘要翻译： 数据擦除装置校正在诸如SMT MRAM单元的存储单元阵列中发生的干扰数据错误。 数据擦除装置接收在存储器单元阵列内的一组存储器单元的读取操作期间发生错误的错误指示。 数据擦除装置可以生成描述要擦除的存储器单元的位置的地址。 然后，数据擦除装置命令存储器单元阵列回写校正的数据。 基于擦除阈值，数据擦除装置在经过特定数量的错误之后写入校正后的数据。 数据擦除装置可以在写入数据期间进一步中止写回。 在校正数据的回写期间，数据擦除装置在外部提供忙指示符。

    Method for testing heat pipes
    54.
    发明授权
    Method for testing heat pipes 有权
    热管测试方法

    公开(公告)号：US08641271B2

    公开(公告)日：2014-02-04

    申请号：US12772540

    申请日：2010-05-03

    申请人： Feng-Ku Wang ,  Yi-Lun Cheng ,  Chih-Kai Yang

    发明人： Feng-Ku Wang ,  Yi-Lun Cheng ,  Chih-Kai Yang

    IPC分类号： G01K1/16

    CPC分类号： G01M99/002 ,  G01K17/00

    摘要： A method for testing heat pipes includes the following steps. A plurality of bar-shaped heat pipes having the same size is provided, and the heat pipes are deformed. The deformed heat pipes are placed in a temperature regulator, such that a temperature of the heat pipes is periodically changed between a first temperature and a second temperature. The heat pipes are then taken out of the temperature regulator. One end of each heat pipe is maintained at a third temperature by a thermostatic device, and a heat pipe temperature difference of two opposite ends of the heat pipe is measured. The heat pipes having the heat pipe temperature difference greater than a standard temperature difference in the heat pipes are marked.

    摘要翻译： 热管测试方法包括以下步骤。 提供了多个具有相同尺寸的棒状热管，并且热管变形。 变形的热管被放置在温度调节器中，使得热管的温度在第一温度和第二温度之间周期性地变化。 然后将热管从温度调节器中取出。 每个热管的一端通过恒温装置保持在第三温度，并且测量热管的两个相对端的热管温度差。 具有热管温度差大于热管中的标准温差的热管被标记。

    Hard mask removal for semiconductor devices
    55.
    发明授权
    Hard mask removal for semiconductor devices 有权
    半导体器件的硬掩模去除

    公开(公告)号：US08372719B2

    公开(公告)日：2013-02-12

    申请号：US12724157

    申请日：2010-03-15

    申请人： Sheng-Hsiung Wang ,  Fu-Kai Yang ,  Yuan-Ching Peng ,  Chi-Cheng Hung

    发明人： Sheng-Hsiung Wang ,  Fu-Kai Yang ,  Yuan-Ching Peng ,  Chi-Cheng Hung

    IPC分类号： H01L21/461 ,  H01L21/027

    CPC分类号： H01L21/31144 ,  H01L21/28017 ,  H01L21/31116 ,  H01L29/66795

    摘要： A method of removing a hard mask during fabrication of semiconductor devices is provided. A protective layer, such as a bottom anti-reflective coating (BARC) layer or other dielectric layer, is formed over structures formed on a substrate, wherein spacers are formed alongside the structures. In an embodiment, the structures are gate electrodes having a hard mask formed thereon and the spacers are spacers formed alongside the gate electrodes. A photoresist layer is formed over the protective layer, and the photoresist layer may be patterned to remove a portion of the photoresist layer over portions of the protective layer. Thereafter, an etch-back process is performed, such that the protective layer adjacent to the spacers remains to substantially protect the spacers. The hard mask is then removed while the protective layer protects the spacers.

    摘要翻译： 提供了在制造半导体器件期间去除硬掩模的方法。 在衬底上形成的结构上形成诸如底部抗反射涂层（BARC）层或其它电介质层的保护层，其中间隔物沿着结构形成。 在一个实施例中，结构是具有形成在其上的硬掩模的栅电极，并且间隔物是与栅电极一起形成的间隔物。 在保护层上形成光致抗蚀剂层，并且可以对光致抗蚀剂层进行图案化以在保护层的部分上去除光致抗蚀剂层的一部分。 此后，执行回蚀处理，使得与间隔物相邻的保护层保持基本上保护间隔物。 然后去除硬掩模，同时保护层保护间隔物。

    Methods and systems for evaluating checker quality of a verification environment
    57.
    发明授权
    Methods and systems for evaluating checker quality of a verification environment 有权
    用于评估验证环境的检验质量的方法和系统

    公开(公告)号：US08359559B2

    公开(公告)日：2013-01-22

    申请号：US12977376

    申请日：2010-12-23

    申请人： Kai Yang ,  Michael Lyons ,  Kuo-Ching Lin ,  Wei-Ting Tu ,  Chih-Wen Chang ,  Tein-Chun Wei

    发明人： Kai Yang ,  Michael Lyons ,  Kuo-Ching Lin ,  Wei-Ting Tu ,  Chih-Wen Chang ,  Tein-Chun Wei

    IPC分类号： G06F17/50 ,  G06F9/455

    CPC分类号： G06F17/5022 ,  G06F17/504 ,  G06F2217/10

    摘要： Methods and systems for evaluating checker quality of a verification environment are provided. In some embodiments, an overall sensitivity for the verification environment and an individual sensitivity for a respective checker are calculated. The overall sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to a checker system including at least one checker, can be detected by the verification environment. The individual sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to at least one specific probe among a plurality of probes of a design, can be detected by the checker corresponding to the specific probe. The overall checker sensitivity numbers can show the robustness of the check system. The individual checker sensitivity can guide the user which individual checker or checkers to improve.

    摘要翻译： 提供了用于评估验证环境的检查器质量的方法和系统。 在一些实施例中，计算验证环境的总体灵敏度和相应检查器的个体灵敏度。 总体灵敏度是通过验证环境可以检测到传播到包括至少一个检验器的检查系统的多个有问题的设计行为的概率。 个体敏感度是通过与特定探针对应的检查器可以检测到在设计的多个探针中传播到至少一个特定探针的多个有问题的设计行为的概率。 整体检查灵敏度数字可以显示检查系统的稳健性。 单独的检查灵敏度可以指导用户哪个单独的检查器或检查器改进。

    MULTI-FORMAT VIDEO DECODER WITH FILTER VECTOR PROCESSING AND METHODS FOR USE THEREWITH
    58.
    发明申请
    MULTI-FORMAT VIDEO DECODER WITH FILTER VECTOR PROCESSING AND METHODS FOR USE THEREWITH 有权
    具有滤波器矢量处理的多格式视频解码器及其使用方法

    公开(公告)号：US20120230427A1

    公开(公告)日：2012-09-13

    申请号：US13076568

    申请日：2011-03-31

    申请人： Edward Hong ,  Dong Liu ,  Hongri Wang ,  Kai Yang

    发明人： Edward Hong ,  Dong Liu ,  Hongri Wang ,  Kai Yang

    IPC分类号： H04N7/26

    CPC分类号： H04N19/103 ,  H04N19/136 ,  H04N19/436 ,  H04N19/44 ,  H04N19/61 ,  H04N19/91

    摘要： A video decoder includes an entropy decoding device that generates entropy decoded (EDC) data from an encoded video signal. A multi-format video decoding device includes a plurality of vector processor units that generate a decoded video signal from the EDC data. The plurality of vector processing units includes at least one filter vector processor that operates in conjunction with a plurality of programmable filter parameters.

    摘要翻译： 视频解码器包括从编码视频信号产生熵解码（EDC）数据的熵解码装置。 多格式视频解码装置包括从EDC数据生成解码视频信号的多个矢量处理器单元。 多个矢量处理单元包括至少一个与多个可编程滤波器参数相结合的滤波器矢量处理器。

    SERVER CABINET
    59.
    发明申请
    SERVER CABINET 有权
    服务器柜

    公开(公告)号：US20120127655A1

    公开(公告)日：2012-05-24

    申请号：US13110384

    申请日：2011-05-18

    申请人： KAI-YANG TUNG ,  Chien-An Chen

    发明人： KAI-YANG TUNG ,  Chien-An Chen

    IPC分类号： H05K7/20

    CPC分类号： H05K7/20772 ,  H05K7/20781

    摘要： A server cabinet is provided, which not only utilizes a first cooling fluid to flow through a heat exchanger of the cabinet to lower the temperature of entrances of fan modules without wasting additional energy, but also utilizes a cooling fluid pipe set to send a second cooling fluid to heat exchange apparatuses in a server to lower the temperature of heating elements inside the cabinet. The server cabinet could lower the heat dissipating loading of the heat exchanger of the cabinet and achieve the efficiency of saving energy.

    摘要翻译： 提供了一种服务器机柜，不仅利用第一冷却流体流过机柜的热交换器，以降低风扇模块入口的温度，而不浪费额外的能量，而且还利用冷却流体管道来发送第二冷却 流体到服务器中的热交换装置以降低机柜内的加热元件的温度。 服务器机柜可以降低机柜换热器的散热负荷，达到节能的目的。

    SERVER CABINET STRUCTURE
    60.
    发明申请
    SERVER CABINET STRUCTURE 审中-公开
    服务器柜结构

    公开(公告)号：US20120112611A1

    公开(公告)日：2012-05-10

    申请号：US13158628

    申请日：2011-06-13

    申请人： Chien-An Chen ,  Kai-Yang Tung ,  Ming-Hung Shih ,  Chun-Ying Yang ,  Chung-Sheng Ni

    发明人： Chien-An Chen ,  Kai-Yang Tung ,  Ming-Hung Shih ,  Chun-Ying Yang ,  Chung-Sheng Ni

    IPC分类号： H05K5/02

    CPC分类号： H05K7/1489

    摘要： A server cabinet structure includes a rack, at least one tray and at least one fixing component. The rack has two opposite frame bars and at least two guide rails correspondingly disposed on the frame bars. The tray is disposed on the two guide rails, and is capable of sliding into the rack. The guide rails are accommodated in recessed portions of the tray exactly. The tray presses against the frame bars through a stop plate. One combining hole of the stop plate is corresponding to an assembly hole of the frame bar. The fixing component passes through the combining hole and the assembly hole, and is inserted into the frame bar, so as to limit and keep the tray inside the rack.

    摘要翻译： 服务器机柜结构包括机架，至少一个托盘和至少一个固定部件。 机架具有两个相对的框架杆和至少两个相应地设置在框架杆上的导轨。 托盘设置在两个导轨上，能够滑入机架。 导轨被精确地容纳在托盘的凹陷部分中。 托盘通过止动板压靠框架杆。 止动板的一个组合孔对应于框架杆的组装孔。 定影部件通过组合孔和组装孔，并插入框架杆中，以限制并保持托盘在机架内。