摘要:
A device for displaying images positions a luminescent material between a light source and a liquid crystal display (LCD). The light source, which comprises one or more nonpolar or semipolar III-nitride based light emitting diodes (LEDs), emits a primary light having a specified polarization direction and comprising one or more first wavelengths. This primary light emitted by the light source is a linearly polarized light that eliminates any need for a polarizer. The luminescent material, which comprises one or more phosphors, is optically pumped by the primary light and emits a secondary light having the polarization direction of the primary light, wherein the secondary light is comprised one or more second wavelengths that are different from the first wavelength. This secondary light emitted by the luminescent material is a colored light that eliminates any need for a color filter. The LCD receives the secondary light and displays one or more images in response thereto.
摘要:
A method for improving the growth morphology of (Ga,Al,In,B)N thin films on nonpolar or semipolar (Ga,Al,In,B)N substrates, wherein a (Ga,Al,In,B)N thin film is grown directly on a nonpolar or semipolar (Ga,Al,In,B)N substrate or template and a portion of the carrier gas used during growth is comprised of an inert gas. Nonpolar or semipolar nitride LEDs and diode lasers may be grown on the smooth (Ga,Al,In,B)N thin films grown by the present invention.
摘要:
A laser diode and method for fabricating same, wherein the laser diode generally comprises an InGaN compliance layer on a GaN n-type contact layer and an AlGaN/GaN n-type strained super lattice (SLS) on the compliance layer. An n-type GaN separate confinement heterostructure (SCH) is on said n-type SLS and an InGaN multiple quantum well (MQW) active region is on the n-type SCH. A GaN p-type SCH on the MQW active region, an AlGaN/GaN p-type SLS is on the p-type SCH, and a p-type GaN contact layer is on the p-type SLS. The compliance layer has an In percentage that reduces strain between the n-type contact layer and the n-type SLS compared to a laser diode without the compliance layer. Accordingly, the n-type SLS can be grown with an increased Al percentage to increase the index of refraction. This along with other features allows for reduced threshold current and voltage operation.
摘要翻译:一种激光二极管及其制造方法,其中激光二极管通常包括在GaN n型接触层上的InGaN柔性层和在柔性层上的AlGaN / GaN n型应变超晶格(SLS)。 n型GaN分离限制异质结构(SCH)在所述n型SLS上,并且InGaN多量子阱(MQW)有源区在n型SCH上。 在MQW有源区上的GaN p型SCH,AlGaN / GaN p型SLS在p型SCH上,p型GaN接触层在p型SLS上。 顺应层具有与不具有柔顺层的激光二极管相比,n型接触层和n型SLS之间的应变的In百分比。 因此,n型SLS可以以增加的Al百分数生长以增加折射率。 这与其他功能一起允许降低阈值电流和电压操作。
摘要:
A method of fabricating an (Al,Ga,In)N laser diode, comprising depositing one or more III-N layers upon a growth substrate at a first temperature, depositing an indium containing laser core at a second temperature upon layers deposited at a first temperature, and performing all subsequent fabrication steps under conditions that inhibit degradation of the laser core, wherein the conditions are a substantially lower temperature than the second temperature.
摘要:
The present invention provides a method for growing group III-nitride crystals wherein the group III-nitride crystal growth occurs on an etched seed crystal. The etched seed is fabricated prior to growth using a temperature profile which produces a high solubility of the group III-nitride material in a seed crystals zone as compared to a source materials zone. The measured X-ray diffraction of the obtained crystals have significantly narrower Full Width at Half Maximum values as compared to crystals grown without etch back of the seed crystal surfaces prior to growth.
摘要:
A high-power and high-efficiency light emitting device with emission wavelength (λpeak) ranging from 280 nm to 360 nm is fabricated. The new device structure uses non-polar or semi-polar AlInN and AlInGaN alloys grown on a non-polar or semi-polar bulk GaN substrate.
摘要:
A method for enhancing growth of device-quality planar semipolar nitride semiconductor thin films via metalorganic chemical vapor deposition (MOCVD) by using an (Al,In,Ga)N nucleation layer containing at least some indium. Specifically, the method comprises loading a substrate into a reactor, heating the substrate under a flow of nitrogen and/or hydrogen and/or ammonia, depositing an InxGa1-xN nucleation layer on the heated substrate, depositing a semipolar nitride semiconductor thin film on the InxGa1-xN nucleation layer, and cooling the substrate under a nitrogen overpressure.
摘要翻译:通过使用含有至少一些铟的(Al,In,Ga)N成核层,通过金属有机化学气相沉积(MOCVD)增强器件质量的平面半极性半导体薄膜的生长的方法。 具体地,该方法包括将衬底装载到反应器中,在氮气和/或氢气和/或氨气流下加热衬底,在加热衬底上沉积In x Ga 1-x N成核层,在半导体衬底上沉积半极性氮化物半导体薄膜 In x Ga 1-x N成核层,并在氮气过压下冷却该衬底。
摘要:
A technique for growing high quality bulk hexagonal single crystals using a solvo-thermal method, and a technique for achieving the high quality and high growth rate at the same time. The crystal quality strongly depends on the growth planes, wherein a nonpolar or semipolar seed surface such as {10-10}, {10-11}, {10-1-1}, {10-12}, {10-1-2}, {11-20}, {11-22}, {11-2-2} gives a higher crystal quality as compared to a c-plane seed surface such as (0001) and (000-1). Also, the growth rate strongly depends on the growth planes, wherein a semipolar seed surface such as {10-12}, {10-1-2}, {11-22}, {11-2-2} gives a higher growth rate. High crystal quality and high growth rate are achievable at the same time by choosing the suitable growth plane. The crystal quality also depends on the seed surface roughness, wherein high crystal quality is achievable when the nonpolar or semipolar seed surface RMS roughness is below 100 nm; on the other hand, the crystal grown from the Ga-face or N-face results in poor crystal quality, even though grown from an atomically smooth surface.
摘要:
The time required for starting up drives in a storage device mounted with both hard disk drives and solid state drives is shortened. A storage controller of the storage device identifies the type (HDD/SSD) of the mounted drives before starting up the drives. The storage controller thereafter performs staggered spinup to the HDDs in several batches. After the startup of HDDs is complete, the storage controller collectively starts up the SSDs. The storage controller determines the drive startup processing based on a pre-set drive startup policy such as reduction of the peak current reduction or shortening of the startup time, and the drive type identification result.
摘要:
To detect an address error in flash memory using a different data management unit from that in a hard disk drive. In cache memory, data read/written from/to a flash memory chip is managed in units of first data lengths. A page, which is the data management unit in a flash memory chip, includes a data section of a second data length from/to which a storage controller can read/write data; and a redundant section. When writing data, the storage controller creates a protection code enabling identification of a write destination page address, divides the data in the cache memory, which is managed in units of first data lengths, into pieces so that the size of each set composed of a piece of the divided write data and its protection code will be of a second data length, and writes the respective sets in a flash memory chip in units of second data lengths.