Method for making connections to a microelectronic device having bump leads
    62.
    发明授权
    Method for making connections to a microelectronic device having bump leads 有权
    连接到具有凸点引线的微电子器件的方法

    公开(公告)号:US06286205B1

    公开(公告)日:2001-09-11

    申请号:US09209226

    申请日:1998-12-10

    IPC分类号: H05K330

    摘要: A method for making connections to a microelectronic device having bump leads thereon. A substrate is provided having a front surface and a plurality of electrically conductive posts extending upwardly from the front surface. The posts are disposed in groups, wherein the posts of each group define a gap therebetween. Contacts are provided extending generally horizontally outwardly from each post remote from the front surface of the substrate. The microelectronic device is assembled to the substrate and posts so that the bump leads penetrate into the gaps and engage the contacts which wipe against the bump leads as they are inserted.

    摘要翻译: 一种用于连接到其上具有凸块引线的微电子器件的方法。 提供了具有前表面和从前表面向上延伸的多个导电柱的衬底。 柱被分组地布置,其中每组的柱在它们之间限定了间隙。 提供从远离基板的前表面的每个支柱大致水平向外延伸的触点。 微电子器件被组装到衬底上并且固定,使得凸起引线插入到间隙中并且接合触头,这些接触件在它们被插入时擦拭凸起引线。

    Method of assembling a semiconductor chip package
    67.
    发明授权
    Method of assembling a semiconductor chip package 有权
    组装半导体芯片封装的方法

    公开(公告)号:US06821815B2

    公开(公告)日:2004-11-23

    申请号:US10353737

    申请日:2003-01-29

    IPC分类号: H01L2144

    摘要: A method of encapsulating a microelectronic assembly comprises providing a microelectronic assembly having an element defining exterior surfaces and an array of terminals exposed at the exterior surfaces. The element defines an aperture through the exterior surfaces. A layer of a curable barrier material is screen printed onto a supporting element. The supporting element is assembled with the microelectronic assembly so that the layer of curable barrier material contacts the exterior surfaces and covers said one or more apertures. An encapsulant is applied to the microelectronic assembly.

    摘要翻译: 封装微电子组件的方法包括提供具有限定外表面的元件和暴露在外表面处的端子阵列的微电子组件。 该元件通过外表面限定孔。 将一层可固化的阻挡材料丝网印刷到支撑元件上。 支撑元件与微电子组件组装,使得可固化阻挡材料层与外表面接触并覆盖所述一个或多个孔。 将密封剂施加到微电子组件。

    Method of assembling a semiconductor chip package
    68.
    发明授权
    Method of assembling a semiconductor chip package 有权
    组装半导体芯片封装的方法

    公开(公告)号:US06518662B1

    公开(公告)日:2003-02-11

    申请号:US09713527

    申请日:2000-11-15

    IPC分类号: H01L2334

    摘要: A method of encapsulating a microelectronic assembly comprises providing a microelectronic assembly having an element defining exterior surfaces and an array of terminals exposed at the exterior surfaces. The element defines an aperture through the exterior surfaces. A layer of a curable barrier material is screen printed onto a supporting element. The supporting element is assembled with the microelectronic assembly so that the layer of curable barrier material contacts the exterior surfaces and covers said one or more apertures. An encapsulant is applied to the microelectronic assembly.

    摘要翻译: 封装微电子组件的方法包括提供具有限定外表面的元件和暴露在外表面处的端子阵列的微电子组件。 该元件通过外表面限定孔。 将一层可固化的阻挡材料丝网印刷到支撑元件上。 支撑元件与微电子组件组装,使得可固化阻挡材料层与外表面接触并覆盖所述一个或多个孔。 将密封剂施加到微电子组件。

    Method of fabricating a microelectronic assembly using sheets with gaps to define lead regions
    69.
    发明授权
    Method of fabricating a microelectronic assembly using sheets with gaps to define lead regions 有权
    使用具有间隙的片来制造微电子组件的方法来限定引线区域

    公开(公告)号:US06228686B1

    公开(公告)日:2001-05-08

    申请号:US09140589

    申请日:1998-08-26

    IPC分类号: H01L2144

    摘要: A sheet such as a polymeric dielectric has elongated lead regions partially separated from the main region of the sheet by gaps in the sheet, and has conductors extending along the lead regions. The lead regions are connected to contacts on a microelectronic element, and the microelectronic element is moved away from the main region of the sheet, thereby bending the lead regions downwardly to form leads projecting from the main region of the sheet.

    摘要翻译: 诸如聚合物电介质的片材具有通过片材中的间隙与片材的主要区域部分地分离的细长引线区域,并且具有沿引线区域延伸的导体。 引线区域连接到微电子元件上的触点,并且微电子元件移动离开片材的主要区域,从而将引线区域向下弯曲以形成从片材的主要区域突出的引线。

    Methods and structures for electronic probing arrays

    公开(公告)号:US06586955B2

    公开(公告)日:2003-07-01

    申请号:US09793791

    申请日:2001-02-27

    IPC分类号: G01R3102

    摘要: A probe card for testing electronic elements includes a layer of dielectric material provided with a plurality of cavities supported on a substrate. A mass of fusible conductive material having a melting temperature below about 150° C. is disposed in each of said cavities, the dielectric material electrically insulating the masses of fusible conductive material from one another. A probe tip of conductive material having a melting temperature greater than about 150° C. is provided at one common end of each of the masses of fusible conductive material. The probe contacts are separated from an adjacent probe contact by at least one channel formed with the layer of dielectric material.