Abstract:
A method of forming a gate dielectric layer includes forming a first dielectric layer over a semiconductor substrate using a first plasma, performing a first in-situ plasma nitridation of the first dielectric layer to form a first nitrided dielectric layer, forming a second dielectric layer over the first dielectric layer using a second plasma, performing a second in-situ plasma nitridation of the second dielectric layer to form a second nitrided dielectric layer; and annealing the first nitrided dielectric layer and the second nitrided dielectric layer, wherein the gate dielectric layer comprises the first nitrided dielectric layer and the second nitrided dielectric layer. In other embodiments, the steps of forming a dielectric layer using a plasma and performing an in-situ plasma nitridation are repeated so that more than two nitrided dielectric layers are formed and used as the gate dielectric layer.
Abstract:
A system and method for an efficient semantic similarity search of images with a classification structure are provided. The system and method provide for building a semantic classification-search tree for the plurality of images, the classification tree including at least two categories of images, each category of images representing a subset of the plurality of images, receiving a query image, classifying the query image to select one of the at least two categories of images, and restricting the search for the image of interest using the query image to the selected one of the at least two categories of images.
Abstract:
A method of forming a semiconductor device includes providing a substrate for the semiconductor device. A base oxide layer is formed overlying the substrate by applying a rapid thermal oxidation (RTO) of the substrate in the presence of oxygen. A nitrogen-rich region is formed within and at a surface of the base oxide layer. The nitrogen-rich region overlies an oxide region in the base oxide layer. Afterwards, the semiconductor device is annealed in a dilute oxygen and hydrogen-free ambient of below 1 Torr partial pressure of the oxygen. The annealing heals bond damage in both the oxide region and the nitrogen-rich region in the base oxide layer. After annealing the semiconductor device in the dilute oxygen ambient, in-situ steam generation (ISSG) is used to grow and density the oxide region in the base oxide layer at an interface between the substrate and base oxide layer.
Abstract:
A transistor structure of an electronic device can include a gate dielectric layer and a gate electrode. The gate electrode can have a surface portion between the gate dielectric layer and the rest of the gate electrode. The surface portion can be formed such that another portion of the gate electrode primarily sets the effective work function in the finished transistor structure.
Abstract:
The invention provides a new tumor tag, RL5 protein, the polynucleotide encoding RL5 protein, and the method of producing RL5 protein by recombinant technology. The invention also discloses the use of RL5 protein and the polynucleotides encoding RL5 protein, e.g., in diagnosing and treating tumor, as well as the pharmaceutical composition containing RL5 protein or the antibody against it.
Abstract:
The invention provides a new kind of tumor marker RL9/RL10 protein, the polynucleotide encoding the polypeptide, and the method of producing RL9/RL10 protein by recombinant technology. The invention also discloses the use of RL9/RL10 protein and the polynucleotides encoding RL9/RL10 protein, e.g., in diagnosing and treating tumor, as well as the pharmaceutical composition containing RL9/RL10 protein or the antibody against it.
Abstract:
A method is performed in a print identification system to segment a non-segmented slap print image into its finger components. The method includes: receiving, for a hand, a non-segmented slap print image and a corresponding plurality of roll print images each corresponding to a different finger number; comparing the roll print images to the non-segmented slap print image to determine a number of mated minutiae areas on the non-segmented slap print image; detecting a number of print components from the non-segmented slap print image using the plurality of mated minutiae areas; and selecting a number of final print components from the detected print components and assigning finger numbers to the final print components, using the plurality of mated minutiae areas.
Abstract:
A method of making a semiconductor device includes a substrate having a semiconductor layer having a first portion for non-volatile memory and a second portion exclusive of the first portion. A first dielectric layer is formed over the semiconductor layer. A first plurality of nanoclusters is formed over the first portion and a second plurality of nanoclusters is formed over the second portion. A layer of nitrided oxide is formed around each nanocluster of the first plurality and the second plurality of nanoclusters. Remote plasma nitridation is performed on the layers of nitrided oxide of the first plurality of nanoclusters. The nanoclusters are removed from the second portion. A second dielectric layer is formed over the semiconductor layer. A conductive layer is formed over the second dielectric layer.
Abstract:
The present invention is directed to novel polypeptides, nucleic acids and related molecules which have an effect on or are related to the cell cycle. Also provided herein are vectors and host cells comprising those nucleic acid sequences, chimeric polypeptide molecules comprising the polypeptides of the present invention fused to heterologous polypeptide sequences, antibodies which bind to the polypeptides of the present invention and to methods for producing the polypeptides of the present invention. Further provided by the present invention are methods for identifying novel compositions which mediate cell cycle bioactivity, and the use of such compositions in diagnosis and treatment of disease.
Abstract:
A method for making a semiconductor device is provided which comprises (a) providing a semiconductor structure equipped with a gate (209) and a channel region, said channel region being associated with the gate; (b) depositing a first sub-layer (231) of a first stressor material over the semiconductor structure, said first stressor material containing silicon-nitrogen bonds and imparting tensile stress to the semiconductor structure; (c) curing the first stressor material through exposure to a radiation source; (d) depositing a second sub-layer (233) of a second stressor material over the first sub-layer, said second stressor material containing silicon-nitrogen bonds and imparting tensile stress to the semiconductor structure; and (e) curing the second sub-layer of stressor material through exposure to a radiation source.