摘要:
A pattern forming method has the steps of: forming a pattern by discharging droplets of a conductive material forming solution onto an insulating substrate; forming a conductive layer pattern on the pattern by discharging droplets of a solution which becomes a growth core; and forming a metal pattern by immersing the conductive layer pattern in a plating liquid. The pattern forming method may further have the step of forming a protective layer on a surface of the metal pattern by discharging droplets of an insulating material forming solution except at regions which are to become electrodes of the metal pattern.
摘要:
In a process for producing a substrate for use in a semiconductor element: a porous anodic alumina film having a great number of minute pores is formed on a surface of a base substrate; the surface of the base substrate is etched by using the porous anodic alumina film as a mask so as to form a great number of pits on the surface of the base substrate; the porous anodic alumina film is removed; and a GaN layer is formed on the surface of the base substrate by crystal growth.
摘要:
In a semiconductor laser device having a substrate and an active region, the active region includes an active layer between tensile strain optical waveguide layers. The active layer includes at least one compressive strain quantum well sublayer. When the active layer includes more than one compressive strain quantum well sublayer, the active layer further includes at least one barrier sublayer being formed between the more than one quantum well sublayer and having an identical amount of tensile strain to that of the optical waveguide layers. The absolute value of a sum of a product of the strain and the total thickness of the at least one quantum well sublayer and a product of the strain and the total thickness of the optical waveguide layers and the at least one barrier sublayer (if any) is equal to or smaller than 0.05 nm.
摘要:
In a process for producing a semiconductor laser device, an n-type cladding layer, an n-type or i-type Inx2Ga1−x2As1−y2Py2 first lower optical waveguide layer, an i-type Inx5Ga1−x5P intermediate layer, an i-type Inx2Ga1−x2As1−y2Py2 second lower optical waveguide layer, an Inx1Ga1−x1As1−y1Py1 compressive strain active layer, a p-type or i-type Inx2Ga1−x2As1−y2Py2 first upper optical waveguide layer, and an Inx5Ga1−x5P cap layer are formed on an n-type GaAs substrate. Then, near-edge portions of the cap layer are etched off with a hydrochloric acid etchant, and near-edge portions of the active region above the intermediate layer are etched off with a sulfuric acid etchant so as to produce spaces in vicinities of end facets. Next, the spaces are filled with a p-type Inx2Ga1−x2As1−y2Py2 second upper optical waveguide layer formed over the cap layer, and a p-type upper cladding layer is formed on the second upper optical waveguide layer.
摘要:
A semiconductor laser device contains a pair of electrodes; a conductive substrate connected to one of the pair of electrodes; a lower cladding layer formed on the conductive substrate; a lower optical waveguide layer formed on the lower cladding layer; a quantum well active layer formed on the lower optical waveguide layer; an upper optical waveguide layer formed on the quantum well active layer; an upper cladding layer formed on the upper optical waveguide layer; and a contact layer formed on the upper cladding layer. The other of the pair of electrodes is formed on the contact layer, and the conductive substrate is made of InGa material. The lower cladding layer is made of one of InGaN and InGaAlN material and has a composition which causes a strain not less than −0.01 and not greater than 0.01 between the lower cladding layer and the conductive substrate.
摘要:
In a semiconductor laser device: an n-type lower cladding layer; a lower optical waveguide layer; a compressive strain quantum well active layer made of Inx3Ga1-x3As1-y3Py3, where 0
摘要:
A semiconductor laser device comprises a GaAs substrate, a first cladding layer having either one of p-type electrical conductivity and n-type electrical conductivity, a first optical waveguide layer, an In.sub.x2 Ga.sub.1-x2 As.sub.1-y2 P.sub.y2 first barrier layer, an In.sub.x3 Ga.sub.1-x3 As.sub.1-y3 P.sub.y3 quantum well active layer, an In.sub.x2 Ga.sub.1-x2 As.sub.1-y2 P.sub.y2 second barrier layer, a second optical waveguide layer, and a second cladding layer having the other electrical conductivity, the layers being overlaid in this order on the substrate. Each cladding layer and each optical waveguide layer have compositions, which are lattice matched with the substrate. Each of the first and second barrier layers has a tensile strain with respect to the substrate and is set such that a total layer thickness of the barrier layers may be 10 nm to 30 nm, and a product of a strain quantity of the tensile strain and the total layer thickness may be 0.05 nm to 0.2 nm. The active layer has a composition, which is lattice matched with the substrate, or a composition, which has a tensile strain of at most 0.003 with respect to the substrate.
摘要:
A short wavelength laser includes a light source having a fundamental generating portion which emits fundamental wave and a wavelength convertor which converts the fundamental wave to its second harmonic. A light amplifier amplifies the second harmonic.
摘要:
A semiconductor laser comprises an active layer, optical waveguide layers formed on opposite sides of the active layer, and cladding layers. The active layer is constituted of an InGaAsP type of compound semiconductor. Each of the optical waveguide layers is constituted of an InGaAsP type of quarternary compound semiconductor, in which the content of As in the Group-V elements is at least 2%, or an InGaAlAsP type of five-element compound semiconductor, in which the content of As in the Group-V elements falls within the range of 2% to 10%. Each of the cladding layers is constituted of an InGaAsP type of quarternary compound semiconductor, in which the content of As in the Group-V elements falls within the range of 2% to 10%, or an InGaAlAsP type of five-element compound semiconductor, in which the content of As in the Group-V elements falls within the range of 2% to 10%.
摘要:
An integrated phase-locked semiconductor laser wherein a plurality of waveguide paths extend in parallel to each other. A current blocking layer is formed on one of opposite major surfaces of a semiconductor substrate and is divided into a plurality of regions by a plurality of stripe-like channels. Each of the channels has a depth which reaches at least the above-mentioned major surface of the substrate. A first cladding layer covers the surface of the current blocking layer and those regions of the substrate which are exposed to the channels. A waveguide layer is deposited on the first cladding layer and has a surface opposite to the first cladding layer which is substantially flat. An active layer, a reflecting layer, a second cladding layer and a cap layer are deposited one upon another on the waveguide layer layer. The waveguide layer has an effective refractive index which sequentially decreases in the order of first regions individually associated with the plurality of channels, second regions individually associated with interchannel regions each intervening between nearby channels, and third regions located at opposite sides of the plurality of channels relatively to each other.