Semiconductor device and method for mitigating electrostatic discharge (ESD)
    1.
    发明授权
    Semiconductor device and method for mitigating electrostatic discharge (ESD) 有权
    用于减轻静电放电(ESD)的半导体器件和方法

    公开(公告)号:US07606046B2

    公开(公告)日:2009-10-20

    申请号:US10956118

    申请日:2004-10-04

    Abstract: A semiconductor device including a PCB including conductive patterns formed on at least one surface of the PCB, external connection terminals including at least one ground terminal and coupled to the conductive patterns, at least one semiconductor chip mounted on a surface of the PCB, and an ESD protection pattern being coupled to at least one of the least one ground terminal, the at least one ground terminal not being coupled to the conductive patterns. A semiconductor memory device, including a PCB, a memory chip mounted on a first surface of the PCB, external connection terminals formed on a second surface of the PCB, and a first ESD protection pattern being coupled to at least one ground terminal. A method of mitigating ESD in a semiconductor device, including mounting a chip on a PCB, forming conductive patterns on the PCB, and forming at least one ESD protection pattern on the PCB, the ESD protection pattern being connected to a ground terminal and not being coupled to the conductive patterns.

    Abstract translation: 一种半导体器件,包括PCB,其包括形成在PCB的至少一个表面上的导电图案,外部连接端子包括至少一个接地端子并且耦合到导电图案,安装在PCB的表面上的至少一个半导体芯片,以及 ESD保护图案耦合到至少一个接地端子中的至少一个,所述至少一个接地端子不耦合到导电图案。 一种半导体存储器件,包括PCB,安装在PCB的第一表面上的存储器芯片,形成在PCB的第二表面上的外部连接端子以及耦合到至少一个接地端子的第一ESD保护图案。 一种减轻半导体器件中的ESD的方法,包括在PCB上安装芯片,在PCB上形成导电图案,并在PCB上形成至少一个ESD保护图案,ESD保护图案连接到接地端子,而不是 耦合到导电图案。

    Semiconductor device and method for mitigating electrostatic discharge (ESD)
    3.
    发明申请
    Semiconductor device and method for mitigating electrostatic discharge (ESD) 有权
    用于减轻静电放电(ESD)的半导体器件和方法

    公开(公告)号:US20050184313A1

    公开(公告)日:2005-08-25

    申请号:US10956118

    申请日:2004-10-04

    Abstract: A semiconductor device including a PCB including conductive patterns formed on at least one surface of the PCB, external connection terminals including at least one ground terminal and coupled to the conductive patterns, at least one semiconductor chip mounted on a surface of the PCB, and an ESD protection pattern being coupled to at least one of the least one ground terminal, the at least one ground terminal not being coupled to the conductive patterns. A semiconductor memory device, including a PCB, a memory chip mounted on a first surface of the PCB, external connection terminals formed on a second surface of the PCB, and a first ESD protection pattern being coupled to at least one ground terminal. A method of mitigating ESD in a semiconductor device, including mounting a chip on a PCB, forming conductive patterns on the PCB, and forming at least one ESD protection pattern on the PCB, the ESD protection pattern being connected to a ground terminal and not being coupled to the conductive patterns.

    Abstract translation: 一种半导体器件,包括PCB,其包括形成在PCB的至少一个表面上的导电图案,外部连接端子包括至少一个接地端子并且耦合到导电图案,安装在PCB的表面上的至少一个半导体芯片,以及 ESD保护图案耦合到至少一个接地端子中的至少一个,所述至少一个接地端子不耦合到导电图案。 一种半导体存储器件,包括PCB,安装在PCB的第一表面上的存储器芯片,形成在PCB的第二表面上的外部连接端子以及耦合到至少一个接地端子的第一ESD保护图案。 一种减轻半导体器件中的ESD的方法,包括在PCB上安装芯片,在PCB上形成导电图案,并在PCB上形成至少一个ESD保护图案,ESD保护图案连接到接地端子,而不是 耦合到导电图案。

    Test carrier for unpackaged semiconducter chip
    7.
    发明授权
    Test carrier for unpackaged semiconducter chip 失效
    无包装半导体芯片的测试载体

    公开(公告)号:US06262581B1

    公开(公告)日:2001-07-17

    申请号:US09229734

    申请日:1999-01-13

    Applicant: Chan Min Han

    Inventor: Chan Min Han

    CPC classification number: G01R31/2884 G01R1/0408

    Abstract: A carrier for use in testing an unpackaged semiconductor chip includes a body having a cavity for receiving the chip, inner contact elements and conductors for contacting connection pads on the chip and electrically connecting them to connection elements on an outside surface of the carrier, and rotatable clamps for holding the chip in the cavity. The carriers are configured to enable them to engage and mate with conventionally packaged chip test sockets, thereby enabling their use with conventional automated chip handling and testing equipment, and hence, the production of known good devices on a mass production basis.

    Abstract translation: 用于测试未封装的半导体芯片的载体包括具有用于接收芯片的腔体,内部接触元件和用于接触芯片上的连接焊盘并将其电连接到载体外表面上的连接元件的导体, 用于将芯片保持在空腔中的夹具。 载体被配置成使得它们能够与传统封装的芯片测试插座接合和配合,从而使它们能够与传统的自动化芯片处理和测试设备一起使用,并因此在批量生产的基础上生产已知的良好设备。

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